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Connected Car Technology Test Solutions
Address challenges of designing, verifying and testing the latest connected car technologies

Competitive Comparison 2016-10-19

E6950A eCall Conformance Test Solution - Brochure
The Keysight E6950A eCall Conformance Test Solution helps automotive developers release conformant, high-quality in-vehicle system products

Brochure 2016-10-18

E6950A eCall Conformance Test Solution - Configuration Guide
This configuration guide helps you configure your eCall test reference solution with the E7515A UXM Wireless Test Set with PSAP software, and N5172B EXG X-Series RF Vector Signal Generator with N7609B.

Configuration Guide 2016-10-17

E8707A Radar Target Simulator - Brochure
The Keysight E8707A Radar Target Simulator allows simulation of far targets in the 76 GHz to 77 GHz range, within a short physical distance.

Brochure 2016-10-17

Infoline Asset Manager - Brochure
Keysight Infoline Asset Manager - Free. Easily track and manage your company’s hardware, software and systems.

Brochure 2016-10-13

The High-Frequency, High Speed Design Revolution: Why Your Design & Test Flow Will Soon Be Obsolete
In this keynote from EDI CON USA 2016, Todd Cutler, vice president and general manager of Keysight Design & Test Software, discusses these trends and explains how, when coupled with market pressures, they are driving a revolution in the design and measurement industry.

Demo 2016-10-11

Software plus signal generators and analyzers support IEEE 802.11p design and test
Jungik Suh, marketing program manager, Automotive & Energy Solutions, Keysight Technologies, provides input on several Keysight solutions for the connected-car arena for Evaluation Engineering's October print special report on automotive test.

Article 2016-10-05

Keysight EEsof EDA Premier Communications Design Software
Keysight EEsof EDA premier communications design software product overview brochure.

Brochure 2016-10-05

Keysight EEsof EDA Newsletter - Product and Application News
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

Newsletter 2016-10-04

Solutions for automotive test
Solutions for automotive test

Application Note 2016-09-30

Unlocking Millimeter Wave Insights
It is easy to underestimate the challenges at millimeter-wave frequencies, and this amplifies the importance of integrated tools for design, simulation, measurement, and analysis. Learn more about how Keysight is taking the mystique out of millimeter waves and unlocking new insights.

Demo 2016-09-30

Genesys S/Filter Software Synthesizes Custom RF, MW and Analog Filters for Realization
This white paper describes direct filter synthesis capabilities in Keysight Genesys S/Filter design software used to realize custom filter response.

Application Note 2016-09-23

Infoline Web Services Suite - Data Sheet
Achieve your software and hardware management goals with our online and professional services options

Data Sheet 2016-09-16

Infoline Asset Management - Flyer
2-page flyer that explains Keysight Infoline Asset Management

Brochure 2016-09-14

Design and Test Solutions for Advanced Automotive - Brochure
Keysight's range of powerful automotive design and test solutions in RF, millimeter wave, wireless and high-speed digital design and test are geared for the future of automotive electronics test.

Brochure 2016-09-06

PDF PDF 19.68 MB
PXI Vector Network Analyzer - Configuration Guide
This configuration guide describes standard configurations, options, accessories, upgrade kits and compatible peripherals for the M937xA PXIe vector network analyzers.

Configuration Guide 2016-08-31

Advanced Low-Frequency Noise Analyzer Overview
This video will provide a brief overview of Keysight E4727A Advanced Low-Frequency Noise Analyzer (ALFNA), the next-generation system for measurement of 1/f noise and random telegraph noise. It will describe ALFNA’s innovative modular design and its technical advantages. It will also touch on wide-range applications and how they are enabled by ALFNA’s industry-leading technical specifications and rich feature set.

Product Tour 2016-08-29

Educational Overview of RF Power Measurement and Applications - Application Note
RF power measurement is the basic for the study of RF & microwave theories. Understand how RF power meter and sensor works and its applications from the educational perspectives.

Application Note 2016-08-22

Innovative Test Solutions for the Connected Car - Brochure
Product brochure showcasing Keysight's innovative test solutions for the Connected Car

Brochure 2016-08-11

Cascade Microtech Releases 1/f Measurement Solution With Keysight Technologies
Cascade Microtech announces the release of a comprehensive low-frequency noise measurement solution for device modeling, characterization and reliability testing with MeasureOne solution partner Keysight Technologies.

Press Materials 2016-08-04

SmartBench Bundles for Automotive Electronics R&D Labs - Brochure
Discover the benefits of using standardized bench top instruments and configurations for your organization's automotive electronics R&D design test and measurement needs.

Brochure 2016-08-01

Low Frequency Noise Analyzer Technical Demo
A more technical dive on the new Advanced Low-Frequency Noise Analyzer with WaferPro Express, which offers the unique ability to measure and model device noise across wafers. This release features a new user interface and tight integration with Keysight's WaferPro Express software, a platform that performs automated wafer-level measurements of semiconductor devices.

Demo 2016-07-20

Keysight Seamlessly Integrates Low-Frequency Noise Measurements in Wafer Level Solution Platform
New Advanced Low-Frequency Noise Analyzer Offers Unique Ability to Measure and Model Device Noise Across Wafers.

Press Materials 2016-07-19

Introducing the 2016 Advanced Low-Frequency Noise Analyzer
The new Advanced Low-Frequency Noise Analyzer Offers Unique Ability to Measure and Model Device Noise Across Wafers. This release features a new user interface and tight integration with Keysight's WaferPro Express software, a platform that performs automated wafer-level measurements of semiconductor devices.

Demo 2016-07-18

Power Supply Control Loop Response (Bode Plot) Measurements - Application Note
Unique to Keysight’s portfolio of measurements are frequency response measurements including Control Loop Response (Bode) and can be performed using InfiniiVision X-Series oscilloscopes.

Application Note 2016-07-15

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