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RF Back to Basics Seminar - 2015

CLICK HERE TO REGISTER 

WHAT IS THE SEMINAR ABOUT

Today's engineers working in communications, consumer electronics and aerospace-defense are faced with increasingly complex design and measurement challenges and rapidly changing technology. A strong foundation in basic measurement and simulation techniques is essential for success. This seminar will improve your understanding of basic RF measurement, design and simulation techniques.

WHO SHOULD ATTEND

Recent engineering graduates, experienced R&D engineers transitioning to RF, or technicians and engineers involved in manufacturing test and/or design and simulation will benefit from this seminar. Attendees should have a good understanding of basic electrical engineering principles.

COST

Free

AGENDA

8:00AM- 8:45 AM    
Registration, Product Fair & Continental Breakfast

8:45AM-10:30AM     
Network Analysis Basics

10:30AM-10:45AM    
Break & Product Fair

10:45AM- 11:45 AM   
Modular PXI and AXIe Instruments

11:45AM – 12:45PM
Lunch & Product Fair

12:45PM – 3:15PM
Signal Generation and Analysis

3:15- 3:30PM 
Break & Product Fair

3:30PM-5:00PM 
Fundamentals of RF Simulation

5:00 PM
Wrap up and Giveaway Winner selected 

DRAW

Come and enter the drawing for the new microwave component measurement handbook, a perfect reference for R&D and Test Engineers.

DATE AND LOCATION

Wednesday January 14, 2015
Sheraton La Jolla Hotel
3299 Holiday Court
La Jolla, CA

Wednesday January 21, 2015
Agilent Technologies Building 5
5301 Stevens Creek Blvd.
Santa Clara, CA 

PRESENTATIONS

Network Analysis
RF and microwave circuit design is becoming more complex. RF/Microwave engineers need to accurately and efficiently characterize and validate components such as amplifiers, filters, cables, and antennas or circuits that consist of these components. The Network Analyzers are invaluable for these measurements. This presentation will cover the principles of measuring both active and passive devices with Network Analyzers and walk through a few RF Fundamentals such as Transmission Lines and Smith charts, leading to the concepts of reflection, transmission, S-parameters, time domain, measurement calibrations and the basic architecture of Network Analyzers

Modular PXI Instruments, Measurements, and Test Programs
This session describes the current capabilities of modular PXI instruments, measurements, and applicable test development programs available from Keysight. The module includes both lecture and demonstrations to support its points. We will cover how to maintain measurement integrity across multiple instrument form factors - from your product design through production - so that you are confident the measurements you make using benchtop and modular instruments are consistent. Additionally, we will show you how to leverage the test software programs you already have for your benchtop instruments with Keysight’s modular instrumentation, and how the PXI standard of interoperability benefits modular users such as yourself. We’ll conclude by highlighting considerations for selecting the right physical instrument form factor by comparing and contrasting the benefits of modular and benchtop instruments.

Signal Generation and Analysis
Spectrum analysis is important for a variety of applications and understanding the theory of operation is key to getting the most from your analyzer. During this session, we will examine the major components of a modern spectrum analyzer and their significance in making the best measurement possible. We will cover digital modulation concepts and discuss real-life measurements such as, EVM, ACP, phase noise, and noise figure.

We will also discuss the basics of signal generation and show how they can be taken from general purpose to advanced applications such as simulating complex signals with impairments and interference and performing signal capture and waveform correction.

Fundamentals of RF Simulation
During this presentation the RF Basics discussions in previous sessions will be reinforced in the virtual or simulation environment. Attendees will learn how to simulate important measurements to predict linear and non-linear device behavior prior to fabrication and measurement of the device in the lab, and basic simulation setups will be shown along with the importance of measurement environment considerations, such as housings and connectors. The breadth of simulation capabilities and the understanding of what types of electrical characteristics can be obtained through the use of S-parameters and X-parameters and AC, Harmonic Balance, Transient, and Circuit Envelope simulation techniques will be reviewed. Manipulation and further analysis of the simulation results will be shown with Keysight EEsof EDA’s Data Display environment to customize and create specific graphs and tables needed for design reviews and documentation.

CLICK HERE TO REGISTER