RF Back to Basics Seminar
WHAT IS THE SEMINAR ABOUT
Today's engineers working in communications, consumer electronics and aerospace-defense are faced with increasingly complex design and measurement challenges and rapidly changing technology. A strong foundation in basic measurement and simulation techniques is essential for success. This seminar will improve your understanding of basic RF measurement, design and simulation techniques.
WHAT TO EXPECT
Enjoy a day of face to face networking with our Keysight experts and others in your field. We’ll provide the lunch, product fair the following technical sessions.
WHO SHOULD ATTEND
Recent engineering graduates, experienced R&D engineers transitioning to RF, or technicians and engineers involved in manufacturing test and/or design and simulation will benefit from this seminar. Attendees should have a good understanding of basic electrical engineering principles.
Come and enter the drawing for:
- Bob Witte’s “Spectrum and Network Measurements” handbook, a perfect reference for R&D and Test Engineers
- a free “Cable and Connector Care” eLearning course ($250 value), a NEW service offering from Keysight
8:00am-8:45am Registration, Product Fair and Continental Breakfast
8:45am-9:15am The RF/Microwave Signal Chain
9:15am-10:30am Network Analysis Basics
10:45am-12:00pm Spectral Analysis Basics
12:00pm- 1:00pm LUNCH/Product Fair
1:00pm- 2:30pm Signal Generation/Modulation Basics
2:30pm- 2:45pm BREAK
2:45pm- 3:30pm RF Simulation Basics
3:30pm- 5:00pm Modular and Automation Basics
DATE AND LOCATION
January 11, 2017
Agilent Technologies - Building 5
January 18, 2017
Sheraton La Jolla Hotel
February 8, 2017
Hilton Irvine/Orange County Airport
The RF/MW Signal Chain
This section will introduce the transmit and receive signal chains and important characteristics for design and measurement that will be discussed throughout the day.
Network Analysis Basics
This section will cover transmission line theory, S-parameters, the Smith Chart and impedance measurements/matching. Transmit/receive and directivity paths will be described along with how dynamic range and accuracy can be optimized. Calibration and error correction will also be covered.
Signal Generation and Modulation Basics
This section will first cover CW signal generation and characteristics, including phase-noise and signal synthesis using VCO’s and Phase-Locked-Loops. From there we will discuss analog and digital modulation generation and measurement techniques.
This section covers swept tuned and FFT receiver techniques and the optimization of spectral search techniques including RBW, VBW and dynamic range criteria for the most accurate measurements. Distortion and noise contributions are described as well.
This section will illustrate the ADS RF/Microwave Design Simulation Tool and demonstrate S-parameter simulation, impedance matching, tuning, optimization and device modeling. X-parameters are introduced and the integration of S-parameters into test/design is explained.
Modular Test and Automation Basics
This section describes how to develop and control modular test solutions, including details of how to migrate benchtop software to modular systems and the software standards implemented for Keysight and other vendor components. Programming of the modular test solution and optimization for speed will be discussed.