What’s happening with IEEE std. 1149.1 Boundary Scan?
1 時間 | ウェブセミナ（録画） | 日程/会場
The IEEE has an official working group investigating what needs to be updated in the 1149.1 Boundary Scan standard. The last revision occurred in 2001 and because of Moore’s Law, a lot of advances have been made in silicon that should be accounted for in the standard. Perhaps the most revolutionary change has been the move towards power management on-chip. How should Boundary Scan deal with devices that may have internal portions powering up or down over time?
Who should attend?
This webcast would be of interest to a wide audience of Board Design-for-Test engineers, board test strategists, board designers, board test engineers working in the eletronics design and manufacturing industry. This presentation will assume general knowledge of today’s 1149.1 standard and Boundary Scan in general, as used for board testing.
The presenter: Kenneth P. Parker
Kenneth P. Parker has over 36 years of experience in Board Test. He currently works at Agilent Technologies' Loveland Colorado site as a senior scientist in the Measurement Systems Division.
He holds a BS in Computer Engineering from the University of Illinois, and an MS and PhD in Electrical Engineering from Stanford University. In his career, he has presented numerous papers at the International Test Conference (ITC) over the years and his book 'The Boundary Scan Handbook' is now in its 3rd Edition. In addition to holding over 40 US patents in test technology, Ken has participated in the development of IEEE standards 1149.1, 1149.4, 1149.6, 1532, 1581 and the new P1149.8.1 standard.
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