Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro
网上直播 -- 已存档的 | 地点和时间
Why this Webcast is important:
Agilent Technologies has recently introduced a new DC and RF automated characterization software environment to help test engineers achieve more efficient on-wafer measurements across temperature. This breakthrough solution efficiently controls DC/CV Analyzers, network analyzers, probers, switching matrixes, temperature chucks as well as the powerful 4070, 4080 and 41000 series of Agilent Parametric Testers. The new software is integrated into the IC-CAP Platform and takes advantage of its powerful measurement and programming environment to allow the definition of a custom library of efficient measurement routines such as adaptive measurement algorithms that can greatly reduce the overall measurement time. This presentation will cover the key benefits provided by this innovative solution and provide a short demonstration of its capabilities.
Who should view this Webcast:
Device Modeling Engineers
|免费||At Your PC||View the recording of the Jan 27, 2011 live broadcast|