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Overcome LTE-A UE Design Test Challenges with Keysight’s New UXM

1   Hour | Webcast - recorded | Where & When


LTE-Advanced Carrier Aggregation provides new levels of data throughput that are achieved through aggregating fragmented spectrum and using complex antenna designs. This presents new challenges for LTE UE and chipset designers. This webcast discusses the top three test challenges that engineers face, the limitations in prior generation test architectures, and how the test challenges are overcome with Keysight's new E7515A UXM Wireless Test Set.


Engineers and technicians involved in the design and test of cellular chipsets and UE's incorporating LTE and other cellular technologies.


Joaquin Torrecilla, R&D Manager for Wireless R&D Test Sets

Joaquin Torrecilla is a 22-year veteran of the wireless and conformance business, with experience in both testing and design of test systems and instruments. Currently, he is R&D Manager for Wireless Test Sets at Keysight, managing the UXM program. Previously, he was the CTO at AT4 wireless, where he was involved in the design of test systems for LTE/LTE-A, UMTS, HSPA, WiMAX, GSM, (E)GPRS and Bluetooth. He also taught on Telecom Networks and Services at the University of Malaga for 15 years.

Where & When

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Free At Your PC Enroll to view the February 13, 2014 recorded broadcast 

Prices shown are list prices and are subject to change without notice.

Training & Event Materials

Overcome LTE-A UE Design Test Challenges with Agilent’s New UXM Webcast Slides 
Slides from the February 13, 2014 webcast

Seminar Materials 2014-02-13