RF Back to Basics Seminar - 2016
WHAT IS THE SEMINAR ABOUT
Today's engineers working in communications, consumer electronics and aerospace-defense are faced with increasingly complex design and measurement challenges and rapidly changing technology. A strong foundation in basic measurement and simulation techniques is essential for success. This seminar will improve your understanding of basic RF measurement, design and simulation techniques.
WHO SHOULD ATTEND
Recent engineering graduates, experienced R&D engineers transitioning to RF, or technicians and engineers involved in manufacturing test and/or design and simulation will benefit from this seminar. Attendees should have a good understanding of basic electrical engineering principles.
8:00AM- 8:45 AM
Registration, Product Fair & Continental Breakfast
Network Analysis Basics
Break & Product Fair
10:45AM- 11:45 AM
Modular PXI and AXIe Instruments
11:45AM – 12:45PM
Lunch & Product Fair
12:45PM – 3:15PM
Signal Generation and Analysis
Wrap up, Product Fair and Giveaway Winner selected
Come and enter the drawing for the spectrum and network measurement handbook, a perfect reference for R&D and Test Engineers.
DATE AND LOCATION
May 3, 2016
Holiday Inn & Suites Ottawa Kanata
101 Kanata Avenue
Kanata, ON K2T1E6
May 5, 2016
Four Points by Sheraton Mississauga Meadowvale
2501 Argentia Road
Mississauga, ONL5N 4G8
RF and microwave circuit design is becoming more complex. RF/Microwave engineers need to accurately and efficiently characterize and validate components such as amplifiers, filters, cables, and antennas or circuits that consist of these components. The Network Analyzers are invaluable for these measurements. This presentation will cover the principles of measuring both active and passive devices with Network Analyzers and walk through a few RF Fundamentals such as Transmission Lines and Smith charts, leading to the concepts of reflection, transmission, S-parameters, time domain, measurement calibrations and the basic architecture of Network Analyzers
Modular PXI Instruments, Measurements, and Test Programs
This session describes the current capabilities of modular PXI instruments, measurements, and applicable test development programs available from Keysight. The module includes both lecture and demonstrations to support its points. We will cover how to maintain measurement integrity across multiple instrument form factors - from your product design through production - so that you are confident the measurements you make using benchtop and modular instruments are consistent. Additionally, we will show you how to leverage the test software programs you already have for your benchtop instruments with Keysight’s modular instrumentation, and how the PXI standard of interoperability benefits modular users such as yourself. We’ll conclude by highlighting considerations for selecting the right physical instrument form factor by comparing and contrasting the benefits of modular and benchtop instruments.
Signal Generation and Analysis
Spectrum analysis is important for a variety of applications and understanding the theory of operation is key to getting the most from your analyzer. During this session, we will examine the major components of a modern spectrum analyzer and their significance in making the best measurement possible. We will cover digital modulation concepts and discuss real-life measurements such as, EVM, ACP, phase noise, and noise figure.
We will also discuss the basics of signal generation and show how they can be taken from general purpose to advanced applications such as simulating complex signals with impairments and interference and performing signal capture and waveform correction.