Keysight's Events for United Kingdom and Ireland
Welcome to Keysight's Upcoming Events Page for United Kingdom and Ireland
Keysight Technologies takes part as an exhibitor in numerous parlors and conferences but also organizes free technical seminars in many fields. This list will be updated regularly.
|Calibration Lunch and Learn UK||
This free Lunch & Learn seminar is for anyone responsible for ensuring the credibility of measurements that are used for performance testing of end-products.
Apart from metrologists, almost no one-engineers, technicians, purchasing professionals-receives any formal training in the science of instrument calibration. This seminar will help climb the learning curve painlessly. We'll cover the key concepts of relevant calibration standards without getting mired in the details. By the end of this event, you will know how to evaluate calibration providers, what to ask for, what to expect, and why.
18 June, 2015
Winnersh, United Kingdom
|Microwave, RF and Millimetre Wave Modelling & Circuit Design Seminar||
Join Keysight Technologies at the Microwave, RF and Millimetre Wave Modelling & Circuit Design Seminar.
Keysight Technologies will be presenting at this one day event at the University of Manchester on 17th June 2015. Hear the experiences of industry experts engaged in the key stages of RF, microwave and millimeter wave design flow; from semiconductor device measurement and model extraction, through to circuit design and packaging.
|17 June, 2015||Manchester, United Kingdom||Click here|
|The 7th Future of Wireless International Conference||
Join Keysight Technologies at the The 7th Future of Wireless International Conference
This year’s Future of Wireless International Conference will explore disruption and opportunity in the wireless industry and challenge traditional assumptions. Come and be informed and challenged by experts from inside and outside the industry, learn how your business might fare, and join in the debate yourself.
|23 & 24 June, 2015||London, United Kingdom||Click here|