Here’s the page we think you wanted. See search results instead:


Discutez avec un expert

Join Keysight at EuMW 2017

Keysight Technologies is glad to be participating at European Microwave Week 2017 as the proud Platinum Sponsor.

This year, the exhibition will be held in Nuremberg, Germany at the Nuremberg Exhibition Centre, from 10-12th October.

We are delighted to invite you to visit our booth (Hall 7A, Stand 107) at the exhibition. Here you can meet with our Keysight Experts. Please book a meeting with us here:



We would also like to invite you to join our Workshops. Registration is now available. Please follow the links provided below to learn more about EuMW Hotspots Sessions and to take your place on our programme at EuMW.


Date Session Register/ Learn more
Tuesday 10th October RF and Microwave Measurement Insights          Click here
Wednesday 11th October Materials and Devices Measurement Insights          Click here
Thursday 12th October Improving accuracy and predictability of mm-Wave Systems using EDA tools

         Click here

When registering, please choose the specific topic(s) that you wish to attend.

Session Overview:

RF and Microwave Measurement Insights:

From the company that has been a leading innovator in Spectrum and Network measurements for 70 years, please join us for a FREE RF and Microwave Fundamentals Seminar to help improve your understanding of basic RF measurements, including real applications, thus improving your efficiency and effectiveness whether you are in R&D or design & test.

You can see our latest solutions, and expand on the practical knowledge you need to have to perform your day-to-day-measurements. Application and product experts from Keysight will be on-hand to give demonstrations and technical presentations around the latest innovations, features and capabilities that enhance the fundamental measurements.


Start Time End Time Topic
09:30 10:30 Spectrum Analysis Fundamentals
10:45 11:45 Vector Signal Analysis Fundamentals
13:00 14:00 RF Power Measurement Basics
14:15 15:15 Network Analysis Fundamentals
15:30 16:30 RF Design & Simulation fundamentals


Materials and Devices Measurement Insights:

Understanding the properties of materials (both natural and man-made) is important for a variety of reasons.

Materials such as metallic materials, semiconductors, organic materials (such as polymers) and compound semiconductors have provided profound benefits over the last century. New and emerging materials such as oxide semiconductors, carbon nano tubes (CNT) and graphene promise to provide new benefits over the coming century. Keysight Technologies continues to develop and introduce test and measurement equipment to cope up with the evolving demands of researchers. This paper gives an overview of the most emerging technologies and what Keysight can offer to solve the most daunting measurement challenges.


Start Time End Time Topic
09:30 10:30 Challenges & Solutions for Material Science/Engineering Testing Application
11:00 12:00 Advanced Testing Solutions for Impedance Measurements
14:00 15:00 Devices & Material Characterization from DC to mm-wave & THz
15:15 16:15 Electrical Characterization of GaN & SiC devices with the Keysight B1505A


Improving accuracy and predictability of mm-Wave Systems using EDA tools:

Today’s technologies for high frequency applications like 5G, (automotive) radar and satellite demand highly integrated modules including phased array antennas, GaN devices and nanoscale RF-silicon technologies. While the complexity of these modules increases, it becomes more important to quantify the effects of cross-talk, thermal effects, etc. In these sessions Keysight Technologies, together with industry partners, will show a complete design flow and latest technology updates including electro-magnetic and electro-thermal simulations to help  predict the behavior of the circuits in order to achieve design goals.


Start Time End Time Topic
09:10 10:20 System Design Aspects for mm-Wave Application
10:30 12:50 Addressing mm-Wave RFIC/MMIC Design Challenges and its Integration in Multi-technology Systems
12:50 13:50 How to Improve mm-Wave Circuit Performance & Reliability using Electro-Thermal Analysis