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e-Seminars on Nanoindentation and Atomic Force Microscopy

Keysight Technologies invites you to attend our brand new scientific e-Seminars in February, March, and April. These exclusive one-hour live events provide a great opportunity to learn about some of the latest nanoindentation and atomic force microscopy (AFM) techniques and applications. There will also be Q&A sessions in which all online attendees can query the presenters directly.

Title "Oliver & Pharr: Nanoindentation History "
Topic

Nanoindentation: Past, Present, and Future by Warren C. Oliver, Ph.D. (Nanomechanics, Inc.) and George M. Pharr, Ph.D. (University of Tennessee-Knoxville)

We will jointly present a brief history of nanoindentation. A summary of a few obvious applications that drove the development of the technique will be reviewed. Finally, some of the more unusual applications that have turned up will be discussed.

This duo's landmark 1992 article in JMR ushered in the era of nanoindentation. According to Thomas Reuters Web of Knowledge, it is one of the most cited articles in all of material science (nearly 6,000 citations).

Title "Innovative Measurements of Polymers " / "Innovative Measurements of Polymers " (Presented in Chinese)
Topic

Measuring Shear Modulus of Gelatin by Instrumented Indentation by Jennifer Hay (Keysight Technologies)

Instrumented indentation is a useful tool for measuring the shear modulus of polymers. In this seminar, a new procedure is presented for testing gelatinous materials. Potential problems such as surface detection, material transfer, and constraint effect are addressed. This procedure may help illuminate the relationship between mechanical properties and function in a number of biological applications.

Topic

Compositional Imaging of Polymer Materials with Atomic Force Microscopy by Sergei Magonov, Ph.D. (Keysight Technologies)

The current state of AFM imaging of polymer materials will be reviewed. Emphasis will be on the use of nanomechanical and electric techniques for recognition of individual components in complex multicomponent systems. Novel developments in the imaging of polymers in different environments and the examination of local dielectric properties of organic materials will be presented.

Title "AFM Troubleshooting Basics " / "AFM Troubleshooting Basics " (Presented in Chinese)
Topic How to Troubleshoot an Atomic Force Microscope by Song Xu, Ph.D. (Keysight Technologies)

Most AFM-related problems do not involve hardware defects and can be diagnosed without an engineering background. We will discuss several topics here, including: tip-related problems, parameter-related problems, sample-mounting-related problems, connection problems, noise-related problems, and drift sources and solutions. Feel free to e-mail us additional AFM troubleshooting topics you would like to see addressed, or your own AFM troubleshooting solutions
Title "Oliver & Pharr: The Strange New World "
Topic

Exploring the Strange New World of Small-Scale Deformation with Nanoindentation by Warren C. Oliver, Ph.D. (Nanomechanics, Inc.) and George M. Pharr, Ph.D. (University of Tennessee-Knoxville)

We will jointly present some of the unexpected results that have been observed using nanoindentation. The characteristics of the data will be discussed along with our understanding of the physical phenomena that cause the observed data.

This duo's landmark 1992 article in JMR ushered in the era of nanoindentation. According to Thomas Reuters Web of Knowledge, it is one of the most cited articles in all of material science (nearly 6,000 citations).

Title "New Cantilevers for Basic & Advanced AFM " / "AFM Imaging Mode and Cantilever Basics " (Presented in Chinese)
Topic

Back to the Basics: How to Choose the Right Cantilever by Song Xu, Ph.D. (Keysight Technologies)

We will discuss one of the key fundamental aspects of obtaining a good-resolution AFM image of a sample, that is, how to choose the right cantilever for your application. There are more than 10 cantilever manufacturing companies around the world, each of which produces cantilevers made of different materials, with different coatings, stiffnesses, resonance frequencies, and qualities. We will discuss how to understand the parameters of a cantilever, which cantilever to choose, how to judge the quality of the tip, and how to take advantage of uniquely designed cantilevers.

Topic

Advanced AFM Probes, Probes for Special Applications & New Tip Developments by Oliver Krause, Ph.D. (NanoWorld Group)

Besides "everyday use" AFM probes, there is a large variety of brand new tips and cantilevers now available for special applications. Many of these advanced AFM probes will be presented in this seminar. An overview of tips and cantilevers for exceptional or novel AFM applications (such as nanoindentation probes, cantilevers for imaging at higher harmonics, and tips for high-speed AFM) will be given.

 

Title "Exclusive New Thin Film Method " / "Exclusive New Thin Film Method " (Presented in Chinese)
Topic

Measuring Substrate-Independent Young's Modulus of Thin Films by Jennifer Hay (Keysight Technologies)

Substrate influence is a common problem when using instrumented indentation (also known as nanoindentation) to evaluate the elastic moduli of thin films. In this seminar, a new analytic model is presented for determining the elastic modulus of the film alone when the sensed response is substantially influenced by the substrate. This new model is an improvement over previous models of the same kind, because it works well for both stiff films on compliant substrates and compliant films on stiff substrates.
Gang Feng, Ph.D. (Villanova University) Dr Feng will join Jenny Hay to present application data using this new method

Title "The Excitement is Electric "
Topic Nanoscale Optoelectronic Characterization of Photovoltaic Materials Using Scanning Probe Methods by Venkat Bommisetty, Ph.D. (Nano Labs, South Dakota State University)
Topic An Introduction to Electrical Methods for AFM by Gil Min, Ph.D. (Keysight Technologies)
Title "A Double Feature for Film Buffs "
Topic

High-Resolution Characterization of Organic Ultrathin Films Using AFM by Jing-jiang Yu, Ph.D. (Keysight Technologies)

High-resolution characterization of organic ultrathin films and related materials using AFM provides a better understanding of interfacial structures and local properties. Various types of samples – including self-assembled monolayers (SAMs), polymers, and few-layer graphene (FLG) – are investigated with the Keysight 5600LS AFM system. Recent AFM examination results of high-throughput fabrication of SAM nanostructures via nonconventional lithography methods will also be shown.

Topic

Atomic Force Acoustic Microscopy – One Tool, Multiple Applications by Malgorzata Kopycinska-Mueller, Ph.D. (IZFP-Dresden) 

Atomic force acoustic microscopy (AFAM) employs resonance frequencies of an AFM cantilever contacting a sample surface to determine elastic properties. This highly sensitive, versatile tool works in imaging or spectroscopy mode, providing information on the elastic properties of a sample with nanoscale spatial resolution. It can be used to detect SAMs, ferroelectric domains, subsurface defects, and changes in film-substrate adhesion, as well as to determine the elastic properties of films with thicknesses in the nm range. Recent data acquired using a Keysight 5600LS AFM system will be presented.

Title "Nanoindenting for Novices - Session I - General Introduction "
Topic

"Testing the Tiny” - A Walk Through Nanomechanics and an Introduction to Nanoindentation by Holger Pfaff, Applications Scientist (Keysight Technologies)

Progressive miniaturization has led to a growing need to determine the physical properties of microscopic volumes of materials. Nanoindentation has become a valuable method for testing the mechanical properties of thin films, MEMS devices, and other materials at both the micro- and nanoscales. We will introduce a selection of recent research topics in the field and provide an overview of the most important approaches, methodologies, and tools used to address some of the associated challenges.

Topic

"All the Things You Can Do” - Advanced Applications Beyond Nanoindentation both by Holger Pfaff, Applications Scientist (Keysight Technologies)

Originally developed for the determination of Young’s modulus and hardness of materials, nanoindentation methodologies and tools have been extended to characterize various material properties like adhesion, fracture, creep, scratch, and wear. Some of these applications will be introduced and discussed in more detail.

 

Title "Nanoindenting for Novices - Session II - Practical Application "
Topic

"Pressing the Right Buttons” - Getting Familiar with the NanoSuite Testing Environment by Holger Pfaff, Applications Scientist (Keysight Technologies)

Keysight NanoSuite software is a powerful tool for defining and controlling mechanical tests, analyzing data, and achieving significant automation of your experiments. It can be utilized by users who range from operator to expert level. Although most of the functions are very intuitive, we will give an overview of NanoSuite features aimed at allowing you to make your testing more efficient and to get the most out of your work. We will also give an introduction to writing your own test procedures for custom-tailored applications.

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