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What are the IEEE 1149.1 Boundary Scan tests generated on the Keysight Medalist i3070 in-circuit tester?

The following IEEE 1149.1 Boundary Scan tests are generated on the Medalist i3070 in-circuit tester:

  • Interconnect test – Looks for shorts and most opens between boundary scan nodes in the same boundary scan chain.
  • Buswire test – Looks for opens between bussed boundary scan nodes in the same boundary scan chain that are not covered in the interconnect test.
  • Powered short test – Looks for shorts on accessible boundary scan device nodes and non-boundary scan accessible nodes that are connected on a device, which may have the potential of shorting due to the proximity of their pins.
  • Connect test – Looks for opens on boundary scan devices where input and output pins are accessible.