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Keysight Pulsed IV parametric test solution

Pulsed IV parametric testing is becoming an increasingly common requirement for the development of semiconductor process and the evaluation of semiconductor devices. In recent years, the need for very accurate Pulsed IV measurement has increased due to the development of more advanced processes utilizing exotic materials, the push for devices with lower power consumption, and many other factors.
To meet these needs Keysight offers a variety of Pulsed IV parametric test solutions that supply the widest range of pulse widths, voltage/current output, and performance available in the industry.  Each solution is well-proven and has already been used by many researchers worldwide to meet various advanced measurement needs.

Keysight Pulsed IV parametric test solution

FeaturesPulsed IVr solutions

  • B1542A : The Keysight B1542A 10 nanosecond Pulsed IV parametric test solution has a pulse width range from 10 nsec to 1msec. It is the best choice for characterizing MOSFETs utilizing high-k gate dielectrics and MOSFETs fabricated on SOI wafers
  • B1530A : The Keysight B1530A is a plug-in module for the B1500A semiconductor device analyzer that provides a 100 nanosecond Pulsed IV parametric test solution with 1 nA current measurement resolution. it is the best choice for the precise evaluation of advanced MOSFETs and nano-scale devices such as carbon nanotube (CNT) transistors.
  • B1525A : The Keysight B1525A is a plug-in module for the B1500A semiconductor device analyzer that provides a 5 microsecond Pulsed IV parametric test solution with up to 40 V and 400 mA output capability. It is the best choice for Pulsed IV parametric measurement for middle range power devices, such as GaAs and HEMT devices for RF applications.
  • SMU : The Keysight source measurement units (SMUs) for parametric/device analyzers provide wide coverage for Pulsed IV parametric test, with up to 200 V and 1 A when using the high power SMU (HPSMU). This allows you to measure the IV characteristics of high power devices (such as those used in RF applications) and avoid self-heating effects.

Selection guide to select the best solution for your requirements

The selection guide provides an overview and side-by-side comparison of all of Keysight’s Pulsed IV parametric test solutions to enable you to determine the best solution to meet your unique needs.