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PCBA Test Award-winning Milestones

Award-winning milestones

Keysight strives to continually bring you innovative technologies that will benefit your PCBA test implementations.

Here are the award-winning milestones. Thanks for your constant support and feedback to help us improve our technologies through the years:-

Award Description   
2015 EM Asia Innovation Award - Keysight M9188A Dynamic D/A Converter (Functional Test Category)  
2015 SMT China Vision Award - TS-8989 PXI Functional Test System (Functional Test Category)  
2014 EM Asia Innovation Award – i3070 Series 5 inline in-circuit test system (ICT category)  
2014 SMT China Vision Award - i3070 Series 5 inline in-circuit test system (ICT category)  
2014 SMT China Vision Award – TS-5400 PXI Functional Test System (Functional Test Category)  
2014 Best in Test Award - Keysight x1149 Boundary Scan Analyzer  
2014 ECN Award – Keysight x1149 Boundary Scan Analyzer  
x1149 Boundary Scan Analyzer - Winner of 2013 EM Asia Innovation award – Boundary Scan Category
x1149 Boundary Scan Analyzer - Winner of 2013 7th SMT China Vision Award – Inspection & Test Category
TS-5400 PXI Functional Tester – Winner of 2013 EM Asia Innovation award Functional Test Category
TS-8900 Automotive Functional Tester - Winner of 2012 ECCN Best IC Award – Smart Transportation Category
TS-8900 in-circuit tester – Winner of Circuits Assembly 2012 NPI award Agilent TS-8900 in-circuit tester – Winner of Circuits Assembly 2012 NPI award
TS-8900 in-circuit tester – Finalist in Test and Measurement World’s 2012 Best in Test – Functional Test Agilent TS-8900 in-circuit tester – Finalist in Test and Measurement World’s 2012 Best in Test – Functional Test
i1000D in-circuit tester – Finalist in Test and Measurement World’s 2012 Best in Test – Functional Test Agilent i1000D in-circuit tester – Finalist in Test and Measurement World’s 2012 Best in Test – Functional Test
M9186A PXI Isolated Single Channel Voltage/Current Source, 100V – Winner of 2011 SMT China Vision award Agilent M9186A PXI Isolated Single Channel Voltage/Current Source, 100V – Winner of 2011 SMT China Vision award
M9186A PXI Isolated Single Channel Voltage/Current Source, 100V – Winner of 2011 EM Asia Innovation award – Test Equipment Category Agilent M9186A PXI Isolated Single Channel Voltage/Current Source, 100V – Winner of 2011 EM Asia Innovation award – Test Equipment Category
Medalist i3070/3070 ICT – Winner of Test and Measurement World’s 2011 Test of Time award Agilent Medalist i3070/3070 ICT – Winner of Test and Measurement World’s 2011 Test of Time award
Utility Card Innovation on the Medalist i3070 Series 5 – Winner of 2010 4th SMT China Visions Award – Inspection & Testing – ICT category SMT China Visions Award
Utility Card Innovation on the Medalist i3070 Series 5 – 2010 Winner of 2010 EM Asia Innovation Awards - Test Systems/Equipment category Agilent Utility Card Innovation on the Medalist i3070 Series 5
Medalist i3070 Series 5 with Utility Card – Finalist in 2010 EDN 20th  Annual Innovations Awards - Test and measurement systems and boards category Agilent Medalist i3070 Series 5 with Utility Card
Medalist i3070 Series 5– Finalist in 2010 Test & Measurement World’s Best in Test awards - Board and system test category Agilent Medalist i3070 Series 5– Finalist in 2010
Cover-Extend Technology - Winner for Test and Measurement World's 2009 Best in Test award Winner for Test and Measurement World's 2009 Best in Test award
Cover-Extend Technology - Winner for Circuits Assembly NPI 2009 award Winner for Circuits Assembly NPI 2009 award
Cover-Extend Technology - Winner of EM Asia  Innovation Awards 2009 Winner of EM Asia  Innovation Awards 2009
Cover-Extend Technology - Winner of SMT Vision Award 2008 Winner of SMT Vision Award 2008
Cover-Extend Technology - Winner of 3rd SMT China Vision Award (2008-2009) Winner of 3rd SMT China Vision Award 2008-2009
Cover-Extend Technology - Winner of EDN Innovation Award 2008 Winner of EDN Innovation Award 2008
Cover-Extend technology - Winner of the 2008 APEX IPC Innovation Technology Center award Winner of the 2008 APEX IPC Innovation Technology Center award
Medalist 5DX Automated X-Ray Inspection system - Finalist for Test and Measurement World's 2009 Test of Time award  
Medalist VTEP v2.0 with Network Parameter Measurement - Winner of EM Asia Innovation Award 2008 for Test Systems/Equipment category  Winner of EM Asia Innovation Award 2008 for Test Systems/Equipment category
Medalist x6000 Automated X-Ray Inspection System - 2nd SMT China VISION Awards (Inspection & Testing) 2nd SMT China VISION Awards
Medalist x6000 Automated X-Ray Inspection System - Test & Measurement World 2008 Best in Test® Awards Honorable Mention   2008 Best in Test Awards Honorable Mention
Medalist iVTEP Technology - 2007 Test & Measurement World
Best in Test® Awards Honorable Mention  
2007 Test & Measurement World Best in Test® Awards Honorable Mention
Medalist Bead Probe Technology - 2007 EM Asia Innovation Awards  2007 EM Asia Innovation Awards
Medalist Bead Probe Technology - 2007 EE Times ACE Innovator of the Year Finalist (Dr Kenneth Parker)    
Medalist Bead Probe Technology - 2006 EDN Innovation Awards (Test & Measurement)  2006 EDN Innovation Awards
Medalist Bead Probe Technology - 2006 EDN Innovator of the Year Finalist (Dr Kenneth Parker)    
Printed Circuit Board Test and Inspection Solutions - 2003 Frost & Sullivan's Product Line Award     
5DX Series 5000 Automated X-ray Inspection - 2003 Frost & Sullivan's Product of the Year    
Automated Test Equipment - 2001 Frost & Sullivan's Market Penetration Award   2001 Frost & Sullivan's Market Penetration Award
SJ50 Automated Optical Inspection - 2001 SMT Visions Award (Best New Product Winner)  2001 SMT Visions Award
Dynamic Test Access Suite - 1998 SMT Vision Award  1998 SMT Vision Award
Polarity Check - 1995 SMT Vision Award 1995 SMT Vision Award
3070 Pay-per-use - 1994 SMT Vision Award  1994 SMT Vision Award
Testjet Technology - 1994 Test & Measurement World Best in Test® Award Winner 1994 Test & Measurement World Best in Test Award Winner