What are the IEEE 1149.6 Boundary Scan tests generated on the Keysight Medalist i3070 in-circuit tester?
The following IEEE 1149.6 Boundary Scan tests are generated on the Medalist i3070 in-circuit tester:
• 1149.6 Interconnect test – Looks for shorts and most opens between 1149.6/1149.1 to 1149.6/1149.1 boundary scan nodes in the same boundary scan chain.
• 1149.6 shorted capacitor test – Looks for an occurrence of a shorted capacitor in between two 1149.6 boundary scan nodes.
• 1149.6 Buswire test – Looks for opens between bussed 1149.6/1149.1 to 1149.6/1149.1 boundary scan nodes in the same boundary scan chain that are not covered in the 1149.6 interconnect test.
• 1149.6 Powered short test – Looks for shorts on 1149.6 boundary scan nodes and non-boundary scan accessible nodes that are connected on a device, which may have the potential of shorting due to the proximity of their pins.