Making the Most of Keysight Throughput Multiplier on Medalist In-Circuit Test Systems
Keysight Throughput Multiplier reduces test time on the Medalist 3070, i3070 and i5000 in-circuit test systems by testing up to four boards of a single-board-type panel simultaneously. To make the most of this valuable tool, it is good to know which types of tests will not run simultaneously so that they can be avoided or modified. Here’s a summary of tests that will not run simultaneously when using Keysight Throughput Multiplier:
- Shorts testing
- Since shorts tests always run serially, be sure to minimize test time by always debuggingphantom shorts.
- Tests that require operator intervention such as potentiometers
- To maximize throughput, use an option that does not require operator intervention.
- Test which accept or return a variable
- Test that pause back to BT-Basic.
- Tests that use external instruments
- Tests that use the sequence: "initiate, fetch, report".
- This is a common occurrence for standard library op-amp tests. To maximize throughput, these tests should use the "measure" statement instead.
- Tests that make a decision based on a result.
- Digital tests with a compiled-in sync pulse.
- Digital tests that drive a DUT clock and also use an internal clock for the sequencer
- Any test compiled with the "debug" option.
- Always be sure to re-compile without the "debug" option before releasing to production.
Be aware of these test types in your test plan to maximize the effectiveness of Keysight Throughput Multiplier.