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Aerospace & Defense

Focus where it counts

Missions evolve but one thing stays the same: the need to protect those who go in harm's way. Success depends on a changing mix of people and technology. As technology becomes more complex, assuring readiness gets tougher.

Keysight is a source of assurance that your mission will succeed. Through our expertise in measurement science and test processes, we give you more time for the bigger issues: fulfilling today's mission and managing the transition to what comes next. By helping you build greater assurance in system readiness, Keysight frees you to focus where it counts most.

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Extending the Life of Test Systems that Support Long-term Programs - Application Note 
As an original equipment manager (OEM), we offers efficient and effective alternatives that can extend the life of systems and ensure that the individual instruments are meeting their warranted spec.

Application Note 2015-06-12

Effectively Maintaining and Troubleshooting Military Communication Systems - Application Note 
This application note covers the “what” and “how” of effective testing for best performance in military communication systems. Two examples will highlight what’s possible: field test and verification of radar systems.

Application Note 2014-09-11

Analyzing Frequency Stability in the Frequency and Time Domains - Application Note 
Describes both methods with an emphasis on practical, cost-effective solutions. For those who are new to the time-domain perspective, two proven frequency-to-time conversion methods are also presented.

Application Note 2014-08-11

Using Flexible Digital Modulation Testing for Satellite Regenerative Payloads - Application Note 
This application note focuses on solutions for the issues that create risks in the integration of mixed-signal systems with a mix of software and hardware tools. Examples focus on measurements of error vector magnitude (EVM), which is a key figure of merit for modulated signals implemented in either analog or digital form.

Application Note 2014-08-01

Fundamentals of RF and Microwave Power Measurements (Part 3) (AN 1449-3) 
Power Measurement Uncertainty per International Guides AN 1449-3, literature number 5988-9215EN

Application Note 2014-08-01

6 Hints for Enhancing Measurement Integrity in RF/Microwave Test Systems - Application Note 

Application Note 2012-04-30

Characterizing phase-locked-loop signal transition behaviors of Microphonic/Phase-hit 
This paper discusses how Keysight's Signal Source Analyzer helps you to identify unwanted phase-locked-loop transition "phase-hits", and achieve easy, comprehensive and accurate phase-locked-loop characterization in both linear and nonlinear regions.

Application Note 2008-10-02

Fundamentals of RF and Microwave Power Measurements (Part 4) (AN 1449-4) 
An Overview of Keysight Instrumentation for RF/Microwave Power Measurements AN 1449-4, literature number 5988-9216EN

Application Note 2008-09-01

Specifying and Buying a Bench Power Supply - Application Note 
This application note discusses some of the fundamental considerations for specifying and buying a DC power supply.

Application Note 2008-06-11

Fundamentals of RF and Microwave Power Measurements (Part 2) (AN 1449-2) 
Power Sensors and Instrumentation AN 1449-2, literature number 5988-9214EN

Application Note 2006-07-05

PDF PDF 1010 KB
4 Steps for Making Better Power Measurements (AN 64-4D) - Application Note 
Before selecting a power meter and associated sensors, make sure that you have taken the 4 steps detailed in this note, which influence the accuracy, economy and technical match to your application.

Application Note 2006-04-26

Calibrating Signal Paths in RF/Microwave Test Systems (AN 1465-19) 

Application Note 2005-10-31

Test-System Development Guide: Operational Maintenance (AN 1465-8) 

Application Note 2004-12-21

Fundamentals of RF and Microwave Power Measurements (Part 1) (AN 1449-1) 
Introduction to Power, History, Definitions, International Standards, and Traceability AN 1449-1, literature number 5988-9213EN

Application Note 2003-04-17

PDF PDF 550 KB