Here’s the page we think you wanted. See search results instead:

 

Discutez avec un expert

W-CDMA Test

The expansion and upgrading of W-CDMA networks worldwide to support HSDPA and HSUPA (collectively HSPA) is a substantial investment by the network operators. Handset design and development needs to keep pace to ensure end-user customers upgrade their phones and buy and use the new network services that they support.

Keysight products help speed your time to market and to a return on your product development investment–whether you design components and subsystems, manufacture handsets or base station equipment, or manage the expansion or upgrading of a complete network. Accelerate Wireless Design and Test with Flexible, High-Performance Platforms

Explore YouTube Videos 

1-13 of 13

Sort:
W-CDMA Dynamic Power Analysis Using the 8960 - Application Note 
This document illustrates how to use the dynamic power analysis measurement in the Keysight 8960 test set to measure user equipment (UE) power sequences.

Application Note 2015-07-31

PDF PDF 379 KB
EXT Wireless Communications Test Set Non-signaling Test Overview 
This application note explains how non-signaling test methods make it possible for manufacturers to reduce both test times and test equipment costs across a range of wireless technologies

Application Note 2012-08-01

PDF PDF 290 KB
Designing and Testing 3GPP W-CDMA Base Stations (Including Femtocells) - Application Note 
W-CDMA is one of several wideband digital cellular technologies competing for the third-generation (3G) cellular market.

Application Note 2010-08-01

Fast Device Tune Measurement Solution for Calibrating W-CDMA Mobile Phones - Application Note 
Learn how Keysight’s Fast Device Tune measurement minimizes calibration test time.

Application Note 2008-07-29

GSM/W-CDMA SMS Testing with Keysight Wireless Test Managers 
This application note explains how to install two QFEs and how to implement GSM or W-CDMA SMS test with WTM.

Application Note 2008-01-11

Customizing the E656XC/N588XA Wireless Test Manager - Application Note 
This document shows how to use the WTM program to perform extra test procedures and implement some of the program’s advanced capabilities.

Application Note 2007-07-30

Fast Device Tune Measurement Solution for Calibrating W-CDMA Mobile Phones  
Discover how the Fast Device Tune measurement and the E6601A test set can significantly reduce calibration test time during wireless device manufacturing.

Application Note 2007-03-28

Embedded Automation with the E6601A Wireless Communications Test Set Application Note 
This application note demonstrates how to use the built-in capability of the E6601A test set to develop a simple program for automated testing.

Application Note 2006-09-01

Multi-mode Handset Manufacturing Challenges and Solutions - Application Note 
This application note explains the characteristics that make multi-mode user equipment difficult to test, and provides solutions to streamline UE testing while ensuring conformance to industry standards.

Application Note 2005-11-16

Performing W-CDMA Tx Dynamic Power Measurements Using the 8960 - Product Note 
This paper illustrates how to use the Tx dynamic power measurement to measure W-CDMA UE power sequences.

Application Note 2005-06-15

PDF PDF 167 KB
Mastering the New Base Stations: Design and Test of ADPA and Digital Transceivers for 3G Radios. 
This paper examines adaptive digital pre-distortion (ADPD) technology and the test challenges associated with implementing ADPD amplifiers and digital radio transceivers.

Application Note 2005-02-01

PDF PDF 851 KB
Designing and Testing 3GPP W-CDMA User Equipment - Application Note 
This Application Note focuses on the physical layer (layer 1) of the Frequency Division Duplex (FDD) mode of W-CDMA.

Application Note 2003-02-21

HPSK Spreading for 3G (AN 1335) 
The objective of this Application Note is to provide an overview of Hybrid Phase Shift Keying (HPSK) and explain how to start making modulation quality measurements on the reverse link (uplink) of 3G spread-spectrum systems.

Application Note 2000-11-01