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Fundamentals of Electronic Test & Measurement

  • Browse the application notes, seminars, and training classes here for measurement techniques.
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Running Rocky Mountain Basic from Board Test Basic 
Many of you have existing programs written in Rocky Mountain Basic (RM-Basic), or have found the RM-Basic program examples given in Keysight manuals, and wish to use them to do external instrumentation control using the Keysight 3070 Board Test Family.

Application Note 2001-05-17

PDF PDF 23 KB
S-Parameter Techniques for Faster, More Accurate Network Design (AN 95-1) 
This Application Note is for information only. Keysight no longer sells or supports these products.

Application Note 1967-02-01

PDF PDF 3.10 MB
Setting Up HotKeys for AXI products on the Keysight Medalist Repair Tool 
Users of the Keysight Medalist Repair Tool, also known as the Keysight Repair Tool (ART), can setup hot keys to increase the efficiency of image viewing in RT4.0 for their X-ray inspection products.

Application Note 2008-09-26

PDF PDF 629 KB
Simplified Filter Tuning Using Time Domain (AN 1287-8) 
This Application Note describes a method of tuning a filter using the time-domain response of its return loss, which makes filter tuning vastly easier.

Application Note 2000-07-01

Solder Paste Inspection - Organize the Pieces 
Published in Global SMT & Packaging, November 2003

Application Note 2003-11-01

PDF PDF 818 KB
Solder Paste Inspection for the SMT line: 3D In-line Systems Come of Age 
Published in Electronic Production & Test, May 2003.

Application Note 2003-05-01

PDF PDF 115 KB
Specifying Calibration Standards and Kits for Keysight Vector Network Analyzers (AN 1287-11) 
This paper discusses calibration standard definitions, calibration kit content, and its structure requirements for Keysight's vector network analyzers. Also provided are set up examples and how to modify an existing calibration kit definition file.

Application Note 2011-03-28

Spectrum Analysis Basics - Application Note 
This application note (also known as AN 150) explains the fundamentals of swept-tuned, superheterodyne spectrum analyzers and discusses the latest advances in spectrum analyzer capabilities.

Application Note 2016-04-15

Spectrum Analysis Basics: From 1997 Back to Basics Seminar 
This paper covers everything from a definition of spectrum to the types of instruments used to make the measurements. Topics include resolution, amplitude measurements sensitivity, dynamic range, LO stability, and the use of spectrum analyzers....

Application Note 1997-04-01

PDF PDF 3.16 MB
Swept Frequency Techniques (AN 65) 
This Application Note is for information only. Keysight no longer sells or supports these products.

Application Note 1965-08-01

PDF PDF 8.35 MB
Swept-Frequency Group Delay Measurements (AN 77-4) 
Application Note 77-4

Application Note 1968-09-01

PDF PDF 1.12 MB
System Developer Guide Using LAN in Test Systems - PC Configuration (AN 1465-11) - Application Note 
Using LAN in Test Systems: PC Configuration,the third note in the series, describes the additional capabilities required to enable communication between a PC and LAN-enabled instrumentation. This note is a companion to Application Notes 1465-9 and 1465-10.

Application Note 2004-10-19

PDF PDF 204 KB
TDR Fundamentals for Use With the 54120T Digitizing Oscilloscope and TDR (AN 62) 
This Application Note is for information only. Keysight no longer sells or supports these products.

Application Note 1964-01-01

PDF PDF 9.11 MB
TDR Techniques for Differential Systems (AN 62-2) 
This Application Note is for information only. Keysight no longer sells or supports these products.

Application Note 1990-10-01

PDF PDF 1.96 MB
Techniques & Applications for High Throughput & Stable Characterization (AN 356-1) 
This Application Note is for information only. Keysight no longer sells or supports these products.

Application Note 1988-08-01

PDF PDF 3.32 MB
Techniques for Programming the 892X Family of Instruments (PN 892X) 
This Product Note describes some key programming techniques for the Keysight 892X family of products. This Note can be used as a training tool for users that are new to programming test equipment, or it can be used by experienced programmers that need to know about unique programming required for...

Application Note 2000-09-01

PDF PDF 186 KB
Test and Inspection as Part of the Lead-free Manufacturing Process 
The paper addresses issues that will impact defect levels and defect spectrum during the transition to lead-free manufacturing. It also addresses different test and inspection systems’ readiness to test lead-free printed circuit board assemblies.

Application Note 2005-02-22

PDF PDF 421 KB
Test Coverage: What Does It Mean when a Board Test Passes? 
Originally presented at the 2002 International Test Conference -- Characterizing board test coverage as a percentage of devices or nodes having tests does not accurately portray coverage, especially in a limited access testing environment.

Application Note 2003-07-28

PDF PDF 266 KB
Test Strategy for Complex Printed Circuit Board Assemblies 
This paper proposes a new test strategy for complex boards since the trend in Printed Circuit Board Assembly (PCBA) technology is towards higher complexity.

Application Note 1999-02-22

PDF PDF 195 KB
Test-System Computer I/O Considerations (AN 1465-2) - Application Note 
The first application note in the series, Introduction to Test-System Design, covers test-system philosophy and planning and discusses how test is used in three sectors: R&D, design validation and manufacturing

Application Note 2004-12-09

PDF PDF 189 KB
Test-System Development Guide: Operational Maintenance (AN 1465-8) 

Application Note 2004-12-21

Test-System Understanding Drivers and Direct I/O (AN 1465-3) - Application Note 
This application note answers common questions about the use of drivers and direct I/O to send commands from a PC application to the test instrument.

Application Note 2004-12-21

PDF PDF 374 KB
The Importance of Test and Inspection When Implementing Lead-Free Manufacturing 
Many papers, articles, and studies have been written about process issues, reliability issues, repair issues, and the merits of different alloys. This paper addresses the impacts on test and inspection when going lead-free.

Application Note 2004-08-20

PDF PDF 260 KB
The Why, Where, What, How, and When of X-ray Test 
How do the different AXI technologies work? What are the appropriate uses of 2D vs 3D X-ray? Where in the mfg process should AXI be placed? How can AXI be used to improve the mfg process?

Application Note 2000-11-01

PDF PDF 1.30 MB
Timing Considerations in Clock Distribution Networks (AN 1210-10) - Application Note 
This Application Note discusses the different causes of skew in a clock distribution network. It shows how to use the Keysight 8133A and 54720A to measure and analyze the causes.

Application Note 1992-09-01

PDF PDF 253 KB

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