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Control & Automation of Instruments & Systems

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Early Design Review or Boundary Scan in Enhancing Testability and Optimazation of Test Strategy 
With complexities of PCB design scaling and manufacturing processes adopting to environmentally friendly practices raise challenges in ensuring structural quality of PCBs.

Article 2017-05-08

PDF PDF 624 KB
M9393A PXIe Performance Vector Signal Analyzer - Data Sheet 
This document provides the technical specifications and characteristics for the M9393A PXIe performance vector signal analyzer.

Data Sheet 2017-04-29

Real-Time Printed Circuit Board EMC Measurement 
Co-branded Solutions Partner brochure with EMSCAN on Real-Time Printed Circuit Board EMC Measurement

Brochure 2017-04-26

PDF PDF 552 KB
Real-Time Printed Circuit Board EMC Measurement - EMSCAN 
Real-Time Printed Circuit Board Electromagnetic Compatibility Measurement from EMSCAN and Keysight

Brève de solutions 2017-04-26

 
Integrated RF Test Solution 
Co-branded Solutions Partner brochure with Marvin Test Solutions on Integrated RF Test Solution

Brochure 2017-04-25

PDF PDF 236 KB
Real-Time Near-Field Measurement of Antenna Characteristics 
Co-branded Solutions Partner brochure with EMSCAN on Real-Time Antenna Measurements

Brochure 2017-04-20

PDF PDF 440 KB
Real-Time Measurement of Antenna Characteristics - EMSCAN 
Real-Time Measurement of Antenna Characteristics from EMSCAN and Keysight

Brève de solutions 2017-04-20

 
Real-Time Near-Field Cell Phone and Tablet Antenna Measurements – EMSCAN 
Real-Time Near-Field Cell Phone and Tablet Antenna Measurements from Keysight Technologies and EMSCAN

Brève de solutions 2017-04-20

 
Real-Time Near-Field Cell Phone and Tablet Antenna Measurements 
Co-branded Solutions Partner brochure with EMSCAN on Real-Time Near-Field Cell Phone Antenna Measurements.

Brochure 2017-04-20

PDF PDF 575 KB
TestExec SL 8.1 - Data Sheet 
TestExec SL is a test executive software designed for high-volume, high throughput functional test applications across multiple industries.

Data Sheet 2017-04-12

PDF PDF 1023 KB
Making Conducted and Radiated Emissions Measurements - Application Note 
This application note provides an overview of radiated and conducted emissions measurements as well as a methodology for EMI precompliance testing.

Application Note 2017-04-10

Expanding IEEE Std 1149.1 Boundary-Scan Architecture Beyond Manufacturing Test of PCBA 
This paper will discuss the expanded use of boundary-scan testing beyond the typical manufacturing test to capture structural defects on a components/devices in a Printed Circuit Board Assembly (PCBA)

Article 2017-04-01

PDF PDF 860 KB
Limited Parts Agreement 
Keysight understands these difficult challenges that manufacturers face, and has designed the Limited Parts Agreement – a new affordably-priced supportprogram targeting our customers’ special needs.

Brochure 2017-03-28

PDF PDF 589 KB
i3070 In-Circuit Test System Onsite Agreement - Data Sheet 
Keysight's system onsite agreement provides short term rental of the i3070 system, preconfigured according to the customer’s needs, together with the latest hardware and software.

Data Sheet 2017-03-22

PDF PDF 728 KB
Electronic Components Tolerance and Test Limits for In-Circuit Test - Technical Overview 
In order for all assembled components to function correctly, components are measured and analyzed electrically using the In-circuit tester to ensure its value and performance are optimal.

Technical Overview 2017-03-10

PDF PDF 634 KB
Precise Current Profile Measurements of Bluetooth® Low Energy Devices using the CX3300  
The CX3300 enables you to precisely visualize wide-band and low-level current waveforms and make quantitative evaluations of current waveforms, while reducing the power consumption of BLE devices.

Application Note 2017-03-03

Accurate Current Waveform Measurements of Non Volatile Memory Devices using the CX3300 
This application describes CX3300 enabling you to easily and accurately visualize never before seen true transient current waveform of NVM materials and devices.

Application Note 2017-03-03

Precise Current Measurements of MCU Power-Saving Mode Transition using the CX3300 
The CX3300 enables you to easily and accurately visualize wide-band and low-level current waveforms of the MCU power-saving mode transition.

Application Note 2017-03-03

x1149 Boundary Scan Solution for Blade Server Board - Application Note 
This application note describes in detail what the Keysight x1149 Boundary Scan Analyzer performs during the Integrity test.

Application Note 2017-03-02

PDF PDF 6.17 MB
IoT – With Great Power Comes Great Challenges - Application Note 
This app note addresses the rising challenges for IoT device designers and developers at component, circuit and system levels. What are the tools and solutions available, and test considerations.

Application Note 2017-03-01

Understanding x1149 Integrity Test - Application Note 
This application note describes in detail what the Keysight x1149 Boundary Scan Analyzer performs during the Integrity test.

Application Note 2017-02-16

PDF PDF 2.48 MB
Signal Analysis Measurement Fundamentals, Optimize Noise Floor, Resolution Bandwidth, and More 
Learn measurement fundamentals to optimize your signal analysis for greater insights

Application Note 2017-02-13

N5393F/G PCI Express® 4.0 (Gen4) Software for Infiniium Oscilloscopes - Data Sheet 
The N5393F/G PCI Express electrical performance validation and compliance software provides accurate and automated transmitter testing devices for single and multi lane test setup reducing test time.

Data Sheet 2017-01-25

PDF PDF 1008 KB
FPGA Implementation of a Digital-PLL Using FPGAflow - Application Note 
This application note demonstrates the capabilities of Keysight M3300A AWG and digitizer PXIe combo module to implement closed-loop controls

Application Note 2017-01-05

Power Consumption Solutions for Battery-Operated Medical Devices - Application Brief 
This application brief is to describe different type of Keysight's solutions in measuring power consumption for battery operated medical devices.

Application Note 2016-11-03

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