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Digital Design & Interconnect Standards

In digital standards, every generational change puts new risks in your path. We see it first hand when creating our products and working with engineers like you. Keysight’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of.

Keysight - Insights for your best design

Learn more about Digital Design & Interconnect solutions from Keysight. 
 

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Simulating High-Speed Serial Channels with IBIS-AMI Models 
This paper reviews some of the benefits and limitations of using IBIS models and introduces the new AMI extensions to the latest IBIS version 5.0 specification.

Application Note 2014-08-01

An Overview of the Electrical Validation of 10BASE-T, 100BASE-TX, and 1000BASE-T - Application Note 
The technology used in these ports, commonly known as “LAN” or “NIC” ports, is usually one of the 10BASE-T, 100BASE-TX, and 1000BASE-T standards or a combination of them.

Application Note 2014-08-01

USB Design and Test - A Better Way - Application Note 
Brochure covering Keysight's USB 2.0 and 3.0 test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these.

Application Note 2014-07-31

Properly Powering On & Off Multiple Power Inputs in Embedded Designs - Application Note 
This is the first in a series of application notes that addresses power optimization, characterization and simulation challenges in embedded designs.

Application Note 2014-07-31

High Speed Digital Design with Advanced Design System - Brochure 
This brochure describes 3 ADS suites of applicable simulators, libraries, and capabilities for signal integrity engineers.

Brochure 2014-07-31

PDF PDF 1.33 MB
Digital Communication Analyzer (DCA), Measure Relative Intensity Noise (RIN) - Application Note 
Digital Communication Analyzer (DCA), Measure Relative Intensity Noise (RIN).

Application Note 2014-07-31

Separating Read/Write Signals for DDR DRAM and Controller Validation - Application Note 
To analyze the signal integrity of DDR signals, you need to differentiate the complex traffic on the data bus to independently analyze the signal performance for both DDR chip and memory controller.

Application Note 2014-07-31

PDF PDF 805 KB
Practical Analysis of Backplane Vias - White Paper 
This paper describes the methodology of using measurements on a test vehicle to build a high bandwidth, scalable model of long vias which includes the through and stub effects which can be used for system simulation.

Case Study 2014-07-31

PDF PDF 4.57 MB
Strategies for Debugging Serial Bus Systems with Infiniium Oscilloscopes – Application Note 
This application note discusses the challenges associated with and new solutions for debugging serial bus designs including PCI-Express Generation 1, Inter Integrated Circuit (I2C), Serial Peripheral Interface (SPI), or Universal Serial Bus (USB)

Application Note 2014-07-31

New ADS DDR4 Compliance Test Bench for Solving the Simulation-Measurement Correlation Challenge 
Agilent introduces Advanced Design System DDR4 Compliance Test Bench, which enables a complete workflow for DDR4 engineers from simulation of a candidate design through measurement of the finished prototype. The solution is ideal for semiconductor companies developing DDR controller IP; those developing DRAM chips and DIMMs; and OEMs integrating the controller and DIMM into a system using PCB technology.

Press Materials 2014-06-30

 
Jitter Analysis: The Dual-Dirac Model, RJ/DJ, and Q-Scale - Application Note 
This paper provides a complete description of the dual-Dirac model, how it is used in technology standards and a summary of how it is applied on different types of test equipment.

Article 2014-06-14

PDF PDF 515 KB
Network Analyzer Time Domain Reflectometry (TDR) Measurements – Granite River Labs 
Network Analyzer Time Domain Reflectometry (TDR) Measurements from Granite River Labs and Keysight

Solution Brief 2014-04-29

 
Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Tx/Rx Return Loss Tests 
Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Tx/Rx Return Loss Tests Using Keysight E5071C ENA Option TDR

Application Note 2014-04-21

PDF PDF 1.03 MB
Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Interconnect Tests 
Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Interconnect Tests Using Keysight E5071C ENA Option TDR

Application Note 2014-04-21

PDF PDF 1.71 MB
10GBASE-KR/40GBASE-KR4 Interconnect & Tx/Rx Tests - Test Solution Overview Using the ENA Option TDR 
This describes how to make measurements of 10GBASE-KR/40GBASE-KR4 Ethernet Interconnect & Transmitter/Receiver (Tx/Rx) Tests by using the Keysight E5071C ENA Option TDR.

Technical Overview 2014-04-21

PDF PDF 3.54 MB
Certification of HDMI 2.0 Test Solution 
Certification of HDMI 2.0 Test Solution for HDMI 2.0 Compliance Test, With Widest Coverage of Test Items

Press Materials 2014-04-17

 
Oscilloscope Probe Switching - BitifEye 
Oscilloscope Probe Switching Solution from BitifEye and Keysight.

Solution Brief 2014-04-09

 
USB 3.0 Cable Testing - BitifEye 
USB 3.0 Cable Testing Solution from BitifEye and Keysight.

Solution Brief 2014-04-09

 
HDMI Cable Testing - BitifEye 
HDMI Cable Testing Solution from BitifEye and Keysight.

Solution Brief 2014-04-09

 
Method of Implementation(MOI) for MIPI M-PHY Interface S-Parameter and Impedance Conformance Tests 
Keysight Method of Implementation (MOI) for MIPI M-PHY Interface S-Parameter and Impedance Conformance Tests Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2014-03-20

PDF PDF 978 KB
ADS 2014 Dramatically Improves Design Productivity and Efficiency 
Agilent announces a powerful new version of Advanced Design System software, ADS 2014. Designed to dramatically improve design productivity and efficiency with new technologies and capabilities, ADS 2014 is the software's most significant ADS release to date.

Press Materials 2014-02-20

 
Tips and Advanced Techniques for Characterizing a 28 Gb/s Transceiver 
This paper shows the right combination of measurement and simulation techniques, and how the previously existing barriers for using de-embedding have been eliminated.

Article 2014-02-18

PDF PDF 3.82 MB
Sanjay Gangal of EDACafé interviews Colin Warwick on New SI and EM Products at Designcon 2014 
Sanjay Gangal, V.P. Sales & Marketing at EDACafé interviews Colin Warwick, Product Manager at Keysight Technologies, at Designcon 2014, .

Demo 2014-02-04

 
ADS Controlled Impedance Line Designer Solves Key Challenges in Designing Chip-to-Chip Links 
Agilent introduces Agilent EEsof EDA’s Controlled Impedance Line Designer. The software product quickly and accurately optimizes stack up and line geometry for multigigabit-per-second chip-to-chip links, using the most relevant metric.

Press Materials 2014-01-27

 
High Precision Time Domain Reflectometry - Application Note 
Time domain reflectometry (TDR) is a well-established technique for verifying the impedance and quality of signal pats in components, interconnects, and transmission lines.

Application Note 2014-01-23

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