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Using LAN in Test Systems - The Basics (AN 1465-9) - Application Note 
The basic purpose of any test system is to characterize and validate the performance of electronic components, assemblies or products. The complexity of this task depends on variables such as the physical nature of the device under test (DUT), the number of tests to be performed, the number of signals to be measured and the desired time per test.

어플리케이션 노트 2004-07-29

PDF PDF 270 KB
테스트 시스템 개발 가이드: 테스트 시스템 소프트웨어 아키텍쳐 선택하기 

어플리케이션 노트 2004-05-07

PNA - Pulsed Measurement Accuracy (1408-11) 

어플리케이션 노트 2004-02-17

키사이트 N67xxA 모듈식 전원 시스템을 사용하여 키사이트 662xA를 대체하는 방법 
662xA - N67xxA MPS 변환 안내

어플리케이션 노트 2004-02-10

Mixer Conversion-Loss and Group-Delay Meas. Techniques and Comparisons (1408-02) – Application Note 
This paper compares techniques and instruments for measuring conversion loss and group delay on a single stage converter with an embedded low pass filter. Conversion loss using a: spectrum, scalar, and vector network analyzer.

어플리케이션 노트 2004-01-28

Jitter Fundamentals: Jitter Tolerance Testing with Keysight ParBERT 81250 - Application Note 
This applicaiton note describes gain fast and efficient insight into the operation and performance of CDR, clock system and jitter tolerance.

어플리케이션 노트 2003-12-02

PDF PDF 3.18 MB
Solder Paste Inspection - Organize the Pieces 
Published in Global SMT & Packaging, November 2003

어플리케이션 노트 2003-11-01

PDF PDF 818 KB
Realizing the Benefits of 3D Inline Solder Paste Inspection 
Published in SMT Magazine/Germany, August 2003

어플리케이션 노트 2003-08-01

PDF PDF 67 KB
Test Coverage: What Does It Mean when a Board Test Passes? 
Originally presented at the 2002 International Test Conference -- Characterizing board test coverage as a percentage of devices or nodes having tests does not accurately portray coverage, especially in a limited access testing environment.

어플리케이션 노트 2003-07-28

PDF PDF 266 KB
3D Inline Solder Paste Inspection - Benefit Realized 
100% solder paste inspection helps to reduce the contribution from the print process to solder joint defects.

어플리케이션 노트 2003-06-01

PDF PDF 59 KB
Network Analysis Solutions Advanced Filter Tuning Using Time Domain Transforms (AN 1287-10) 
Tuning multi-stage, coupled-resonator band-pass filters is difficult due to interactions between resonator and coupling tuning. To achieve the proper pass-band response and to get low return loss you must precisely tune the frequency of each resonator and precisely set each coupling between the...

어플리케이션 노트 2003-05-25

Mixer Transmission Measurements Using The Frequency Converter Application (1408-01)–Application Note 
Microwave PNA Series Network Analyzer Application Note, mixer transmission measurements using the frequency converter application note 1408-1

어플리케이션 노트 2003-05-16

Solder Paste Inspection for the SMT line: 3D In-line Systems Come of Age 
Published in Electronic Production & Test, May 2003.

어플리케이션 노트 2003-05-01

PDF PDF 115 KB
Fundamentals of RF and Microwave Power Measurements (Part 1) (AN 1449-1) 
Introduction to Power, History, Definitions, International Standards, and Traceability AN 1449-1, literature number 5988-9213EN

어플리케이션 노트 2003-04-17

PDF PDF 550 KB
Logic Analyzer Probing Techniques for High-Speed Digital Systems - Application Notes 
Discusses the impact of adding logic analysis testability to PCB's. Examples of today's logic analyzer probing solutions are presented and the advantages and disadvantages of each solution are discussed.

어플리케이션 노트 2003-03-24

Using a Network Analyzer to Characterize High-Power Components (1287-6) – Application Note 
This Application Note describes linear and nonlinear measurements of high-power components and how to use a network analyzer for making them.

어플리케이션 노트 2003-03-12

PLR and 5DX Customized Defect Names Implementation 
You can use customized defect names on both the 5DX and on the PLR. This is particularly valuable when you want to display defect names in a local language.

어플리케이션 노트 2003-03-01

 
Using Boundary Scan to Link Design and Manufacturing Test 
By leveraging boundary-scan tests generated in Design and re-using them at Manufacturing Test, manufacturers can produce long-term benefits in terms of lower costs, greater efficiencies and higher quality products.

어플리케이션 노트 2003-03-01

PDF PDF 502 KB
Boundary Scan Helps EMS Companies Cut Test Costs and Increase Revenues 
Electronics Manufacturing Services (EMS) providers can utilize boundary-scan to reduce test cost expenses and also generate additional revenue opportunities.

어플리케이션 노트 2003-03-01

PDF PDF 242 KB
What to Consider When Selecting the Optimal Test Strategy 
This paper addresses several issues for selecting the optimal inspection strategy, presenting data from many studies that Keysight has performed in the quest to find the optimal test / inspection strategy.

어플리케이션 노트 2003-03-01

PDF PDF 175 KB
Jitter Analysis Techniques for High Data Rates (AN 1432) - Application Note 
This new application note describes the basic jitter measurements and the specific measurement techniques used in SONet/SDH/OTN and Gigabit Ethernet applications.

어플리케이션 노트 2003-02-03

Ground Bounce Basics and Best Practices 
This article offers a description of the physical properties that result in ground bounce during board test.

어플리케이션 노트 2003-01-28

PDF PDF 138 KB
A New Process for Measuring and Displaying Board Test Coverage 
Written by Kenneth P. Parker, Keysight Technologies. First presented at Apex 2003, Anaheim, California.

어플리케이션 노트 2003-01-01

PDF PDF 116 KB
When to Use AOI, When to Use AXI, and When to Use Both 
by Stig Oresjo, senior test strategy consultant at Keysight Technologies.

어플리케이션 노트 2002-12-01

PDF PDF 70 KB
An Introduction to Multiport and Balanced Device Measurements (AN 1373-1) 
The increase in integration in the wireless communications and electronics industries and the need to decrease size, cost, weight, and power consumption is driving design engineers to replace discrete components with more complex modules.

어플리케이션 노트 2002-11-11

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