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ATE 어플리케이션

Your test system architecture should give you choices. Its range of possibilities should fit your requirements, preferences and existing test assets ― instrumentation, software and I/O ― now and in the future. That´s the power of Keysight Open, a combination of proven standards and time-saving tools for test automation. From LAN and Web to LXI-based synthetic instruments, our approach to ATE is designed to maximize system longevity and productivity.

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FieldFox 핸드형 분석기 교육 시리즈 
Series of live and on-demand webcasts

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Aerospace/Defense - Webcast Library 
Live and On-Demand Webcasts

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Best practices in implementing boundary scan on limited access boards 
Live broadcast December 18, 2014; 9am PT / 12pm ET

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Boundary Scan Webcast Series 
Live and on-demand webcasts

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Embedded testing of Intel Haswell and Broadwell chipsets on limited access client boards webcast 
Live broadcast November 13, 2014; 9am PT / 12pm ET

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Extending boundary scan tests to improve test coverage of limited access boards webcast 
Live broadcast September 25, 2014; 9am PT / 12pm ET

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Maximizing test coverage of multiple limited access boards by linking multiple boundary scan chains 
Live broadcast October 9, 2014; 9am PT / 12pm ET

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New Capabilities of Calibration Refresh Modules Webcast 
Original broadcast July 19, 2013

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RF and Microwave Education Series 
Webcast Series

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Testing DDR on limited access boards using boundary scan silicon nails 
Live broadcast October 30, 2014; 9am PT / 12pm ET

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Testing limited access SSD boards with boundary scan and external instruments webcast 
Live broadcast December 4, 2014; 9am PT / 12pm ET

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Tips, Techniques, and Examples on Using your System Power Supply to Improve Test Throughput Webcast 
Live broadcast April 30, 2014; 10am PT / 1pm ET

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