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ATE Applications

Your test system architecture should give you choices. Its range of possibilities should fit your requirements, preferences and existing test assets ― instrumentation, software and I/O ― now and in the future. That´s the power of Keysight Open, a combination of proven standards and time-saving tools for test automation. From LAN and Web to LXI-based synthetic instruments, our approach to ATE is designed to maximize system longevity and productivity.

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Best practices in implementing boundary scan on limited access boards 
Live broadcast December 18, 2014; 9am PT / 12pm ET

Webcast

 
Boundary Scan Webcast Series 
Live and on-demand webcasts

Webcast

 
Common DFT guidelines for implementing boundary scan on limited access boards webcast 
Live broadcast September 11, 2014; 9am PT / 12pm ET

Webcast

 
Embedded testing of Intel Haswell and Broadwell chipsets on limited access client boards webcast 
Live broadcast November 13, 2014; 9am PT / 12pm ET

Webcast

 
Extending boundary scan tests to improve test coverage of limited access boards webcast 
Live broadcast September 25, 2014; 9am PT / 12pm ET

Webcast

 
Introduction to the Keysight x1149 Boundary Scan Analyzer Webcast 
Original broadcast August 26, 2014; 9am PT / 12pm ET

Webcast - recorded

 
Maximizing test coverage of multiple limited access boards by linking multiple boundary scan chains 
Live broadcast October 9, 2014; 9am PT / 12pm ET

Webcast

 
Testing DDR on limited access boards using boundary scan silicon nails 
Live broadcast October 30, 2014; 9am PT / 12pm ET

Webcast

 
Testing limited access SSD boards with boundary scan and external instruments webcast 
Live broadcast December 4, 2014; 9am PT / 12pm ET

Webcast