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ATE Applications

Your test system architecture should give you choices. Its range of possibilities should fit your requirements, preferences and existing test assets —instrumentation, software and I/O — now and in the future. With approaches to match your test needs, Keysight ATE is designed to maximize your system's longevity and productivity.

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Common DFT guidelines for implementing boundary scan on limited access boards webcast 
Original broadcast September 11, 2014

Webcast - recorded

 
Embedded testing of Intel Haswell and Broadwell chipsets on limited access client boards webcast 
Original broadcast November 13, 2014

Webcast - recorded

 
Extending boundary scan tests to improve test coverage of limited access boards webcast 
Original broadcast September 25, 2014

Webcast - recorded

 
Introduction to the Keysight x1149 Boundary Scan Analyzer Webcast 
Original broadcast August 26, 2014; 9am PT / 12pm ET

Webcast - recorded

 
Maximizing test coverage of multiple limited access boards by linking multiple boundary scan chains 
Original broadcast October 9, 2014

Webcast - recorded

 
Testing DDR on limited access boards using boundary scan silicon nails 
Original broadcast October 30, 2014

Webcast - recorded