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ATE 어플리케이션

Your test system architecture should give you choices. Its range of possibilities should fit your requirements, preferences and existing test assets ― instrumentation, software and I/O ― now and in the future. That´s the power of Keysight Open, a combination of proven standards and time-saving tools for test automation. From LAN and Web to LXI-based synthetic instruments, our approach to ATE is designed to maximize system longevity and productivity.

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RF and Microwave Back to Basics Education Series 
Webcast Series

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Understanding New Pulse Analysis Techniques Webcast 
Live broadcast July 22, 2015; 10am PT / 1pm ET

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Multiport and Multi-site Test Optimization Techniques Webcast 
Live broadcast June 3, 2015; 10am PT / 1pm ET

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RF/uW Switching Solutions Webcast 
Live broadcast July 8, 2015; 10am PT / 1pm ET

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Addressing Multi-Channel Synchronization for MIMO and Beamforming Test Webcast 
Original broadcast April 28, 2015

웹캐스트 - recorded

 
Aerospace/Defense - Webcast Library 
Live and On-Demand Webcasts

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Closed Loop Adaptive EW Simulation Webcast 
Live broadcast June 23, 2015; 10am PT / 1pm ET

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Bridging the Gap from Benchtop to PXI: A Common Software Strategy Webcast 
Original broadcast March 26, 2015

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One Size Does Not Fit All - Choose the Right Instrument Form Factor Webcast 
Original broadcast March 11, 2015

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Understanding Available Measurement Techniques for Spurious or Unknown Signals Webcast 
Original broadcast February 25, 2015

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Quickly Identify and Characterize Temperature Measurement Points Webcast 
Original broadcast February 3, 2015

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Best practices in implementing boundary scan on limited access boards 
Original broadcast December 18, 2014

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Boundary Scan Webcast Series 
Live and on-demand webcasts

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Developing Measurement and Analysis Systems Using MATLAB Webcast 
Original broadcast December 9, 2014

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Optimize Wireless Device Battery Run-time: Two Part Webcast Series 
Original roadcasts Aug 22 & Sept 19, 2012

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Testing limited access SSD boards with boundary scan and external instruments webcast 
Original broadcast December 4, 2014

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Embedded testing of Intel Haswell and Broadwell chipsets on limited access client boards webcast 
Original broadcast November 13, 2014

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Testing DDR on limited access boards using boundary scan silicon nails 
Original broadcast October 30, 2014

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Maximizing test coverage of multiple limited access boards by linking multiple boundary scan chains 
Original broadcast October 9, 2014

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Extending boundary scan tests to improve test coverage of limited access boards webcast 
Original broadcast September 25, 2014

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Introduction to the Keysight x1149 Boundary Scan Analyzer Webcast 
Original broadcast August 26, 2014; 9am PT / 12pm ET

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Common DFT guidelines for implementing boundary scan on limited access boards webcast 
Original broadcast September 11, 2014

웹캐스트 - recorded

 
Protect Your Device Against Power-Related Damage During Test Webcast 
Original broadcast August 20, 2014

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Create Complex and 2-Channel Signals with Trueform Generators Webcast 
Original broadcast August 7, 2014

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Developing Modular PXI and AXIe Tests for Measurement and Analysis Webcast 
Original broadcast June 12, 2014

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