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是德系統元件讓您輕鬆整合您的系統,不論您是要重頭開始,還是要更新您現有的系統。本系統元件具備現成可用的儀器、開放式軟體,以及 PC 標準 I/O (LXI/USB/VXI/PXI),讓您取得最佳工具,完成您卓越的設計。請按一下下面任何連結,檢視如何充分利用是德資源和測試設備。

1-25 / 58

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Finding Fault - Article Reprint 
testing mission-critical functions in automotive electronics.

專文 2016-02-05

PDF PDF 452 KB
Testing New Grounds in Automotive Electronics - Article Reprint 
Manufacturers are increasingly designing products for ease of test.

專文 2016-02-02

PDF PDF 279 KB
TS-8989 PXI Functional Test System - Brochure 
The TS-8989 PXI functional tester helps you achieve a lower cost of test for automotive electronic control units and industrial electronics.

型錄 2016-01-28

PDF PDF 671 KB
TS-8989 Automotive Body and Safety Test Reference Solution – Configuration Guide 
This configuration guide contains information to help you configure your body and safety test reference solution with the TS-8989 functional tester, and tailor the system to meet your requirements.

配置設定指南 2016-01-20

PDF PDF 2.55 MB
TS-8989 System Integration Guide - Application Note 
In today’s manufacturing environment, floor space is an increasingly invaluable variable in the cost of test equation.

應用手冊 2015-11-11

PDF PDF 2.87 MB
The World’s Highest Pin Count In-Circuit Test Solutions - Brochure 
Keysight's new i3070 and 3070 in-circuit test (ICT) high node count test solution is the world’s highest pin count ICT system, bringing an unprecedented level of performance and portability to users.

型錄 2015-02-12

PDF PDF 212 KB
i3070 High Node Count Test Solution - Technical Overview 
Keysight's high node count test solution allows any Keysight 3070/i3070 Series 3 or Series 5 four-module test system to be easily upgraded into an ultra-high pin count test system

技術總覽 2015-02-12

PDF PDF 645 KB
Transmit/Receive Module Test Platform (TRM-X) - Technical Overview 
The TRM-X Test Platform, measurement science expertise and systems when and where needed, provide the capability you need to deliver AESA radar; datalink; and satcom transmit/receive modules.

技術總覽 2015-01-10

PDF PDF 1.83 MB
Detecting Tailgating Boards on the i3070 Inline In-Circuit Tester - Application Note 
Tailgating sensor improvements on the Keysight i3070 Series 5i inline in-circuit tester help to further minimize damages due to operator and upstream loading errors.

應用手冊 2015-01-05

PDF PDF 437 KB
i3070 ICT Fixture Electronic Clock Measurement Modules - Technical Overview 
The Keysight clock measurement modules (CMM)for the i3070 in-circuit test application comes with three types of clock signal measurement to meet your different circuit topologies.

技術總覽 2014-11-11

PDF PDF 213 KB
6 Hints for Enhancing Measurement Integrity in RF/Microwave Test Systems - Application Note 

應用手冊 2012-04-30

Using .NET Methods to Add Functionality to IVI-COM Drivers  
This application note discusses the use of .NET methods to add functionality to IVI-COM drivers to access a deeper set of instrument functionality with minimal programming.

應用手冊 2012-03-01

Self-diagnosing Switch Matrix Video (3min) 

基本展示 2010-11-14

 
Getting Test Programs Up and Running Quickly with Driver Tracing and I/O Monitor 
This note helps you create an example program and then shows you how to use driver tracing and IO Monitor to examine, verify and troubleshoot I/O activity in IVI-COM drivers.

應用手冊 2009-05-05

Tips in Using Keysight GPIB Solutions in National Instrument’s LabVIEW Environment- Application Note 
Tips for using Keysight GPIB solutions in National Instrument’s LabVIEW environment.

應用手冊 2009-03-04

Application Note: Tips & Tricks for Using USB, GPIB, & LAN (AN 1465-20) 
Application Note: Tips & Tricks for Connectivity

應用手冊 2009-01-22

Using IVI For Your Instrument Driver - Application Note 
This application note describes the use of IVI drivers in your test system to determine when IVI is the right choice

應用手冊 2008-11-14

Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not 
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance

應用手冊 2008-10-15

Keysight LXI Compliant E5818A Trigger Box - Understanding Its Capability and Use Cases 
Learn more about the LXI Compliant E5818A trigger box and its capabilities through this white paper. You will also discover how to create a precise time synchronization system over LAN or enhance trigger operations applications.

應用手冊 2008-07-25

PDF PDF 424 KB
Building Hybrid Test Systems Part 1: Laying the groundwork for a successful transition 

應用手冊 2008-03-19

PDF PDF 270 KB
Tips for Optimizing Test System Performance in Linux Soft Real-Time Applications (AN 1465-31) 
This application note offers several tips for optimizing the soft real-time performance of off-the-shelf Linux systems.

應用手冊 2008-02-19

Using Linux to Control USB Instruments (AN 1465-30) - Application Note 
Keysight’s USB instruments are compatible with USBTMC, a vendor-independent device class for test and measurement resources. This application note explains how USBTMC works and how you can use the generic services to control your USB instruments.

應用手冊 2007-11-07

LXI Test System Provides Flexibility for Testing Automobile Antenna Amplifiers 

應用手冊 2007-10-30

PDF PDF 213 KB
Using Linux to Control LXI Instruments Through VXI-11 (AN 1465-28) 
VXI-11 is one of two alternative protocols used by most LAN-based instruments. It is based on RPC (Remote Procedure Calls). This application note explains how VXI-11 works and discusses a number of programming examples.

應用手冊 2007-07-08

Using Linux To Control LXI Instruments Through TCP (AN 1465-29) 
TCP is one of two alternative protocols used by most LAN-based instruments. It is the more elegant from a programming standpoint. This application note explains how instrument control works through TCP.

應用手冊 2007-06-13

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