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Build Your Own Test System

Keysight - Build Your Own

Keysight system components help you easily integrate your system –whether you´re starting from scratch, or refreshing an existing system.

With system-ready instruments, open software, and PC-standard I/O (LXI/USB/VXI/PXI), you´re getting the best tools for your greatest designs.

Explore the resources here to see how you can get maximum leverage from Keysight´s test equipment and software.

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i3070 High Node Count Test Solution - Technical Overview 
Keysight's high node count test solution allows any Keysight 3070/i3070 Series 3 or Series 5 four-module test system to be easily upgraded into an ultra-high pin count test system

Technical Overview 2015-02-12

PDF PDF 645 KB
The World’s Highest Pin Count In-Circuit Test Solutions - Brochure 
Keysight's new i3070 and 3070 in-circuit test (ICT) high node count test solution is the world’s highest pin count ICT system, bringing an unprecedented level of performance and portability to users.

Brochure 2015-02-12

PDF PDF 212 KB
Transmit/Receive Module Test Platform (TRM-X) - Technical Overview 
The TRM-X Test Platform, measurement science expertise and systems when and where needed, provide the capability you need to deliver AESA radar; datalink; and satcom transmit/receive modules.

Technical Overview 2015-01-10

PDF PDF 1.83 MB
Detecting Tailgating Boards on the i3070 Inline In-Circuit Tester - Application Note 
Tailgating sensor improvements on the Keysight i3070 Series 5i inline in-circuit tester help to further minimize damages due to operator and upstream loading errors.

Application Note 2015-01-05

PDF PDF 437 KB
i3070 ICT Fixture Electronic Clock Measurement Modules - Technical Overview 
The Keysight clock measurement modules (CMM)for the i3070 in-circuit test application comes with three types of clock signal measurement to meet your different circuit topologies.

Technical Overview 2014-11-11

PDF PDF 213 KB
TS-8989 PXI Functional Test System - System Integration Guide - Application Note 
In today’s manufacturing environment, floor space is an increasingly invaluable variable in the cost of test equation.

Application Note 2014-11-06

PDF PDF 611 KB
Choosing the Test System Software Architecture - Application Note 
This application note is designed to help you quickly design a test system that produces reliable results and meets throughput requirements within budget. It explores the entire software development process, from gathering and documenting software requirements through design reuse considerations.

Application Note 2014-07-31

LXI Brochure  
The Keysight LXI Brochure shows you how to open the door to simpler system creation.

Brochure 2014-04-07

 
The LXI System You Didn’t Know You Were Using  
The Evaluation Engineering article talks about the strength and stealth of LXI and Ethernet connectivity.

Article 2014-04-07

 
6 Hints for Enhancing Measurement Integrity in RF/Microwave Test Systems - Application Note 

Application Note 2012-04-30

Using .NET Methods to Add Functionality to IVI-COM Drivers  
This application note discusses the use of .NET methods to add functionality to IVI-COM drivers to access a deeper set of instrument functionality with minimal programming.

Application Note 2012-03-01

Self-diagnosing Switch Matrix Video (3min) 

Demo 2010-11-14

 
Getting Test Programs Up and Running Quickly with Driver Tracing and I/O Monitor 
This note helps you create an example program and then shows you how to use driver tracing and IO Monitor to examine, verify and troubleshoot I/O activity in IVI-COM drivers.

Application Note 2009-05-05

Tips in Using Keysight GPIB Solutions in National Instrument’s LabVIEW Environment- Application Note 
Tips for using Keysight GPIB solutions in National Instrument’s LabVIEW environment.

Application Note 2009-03-04

Application Note: Tips & Tricks for Using USB, GPIB, & LAN (AN 1465-20) 
Application Note: Tips & Tricks for Connectivity

Application Note 2009-01-22

Using IVI For Your Instrument Driver - Application Note 
This application note describes the use of IVI drivers in your test system to determine when IVI is the right choice

Application Note 2008-11-14

Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not 
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance

Application Note 2008-10-15

Keysight LXI Compliant E5818A Trigger Box - Understanding Its Capability and Use Cases 
Learn more about the LXI Compliant E5818A trigger box and its capabilities through this white paper. You will also discover how to create a precise time synchronization system over LAN or enhance trigger operations applications.

Application Note 2008-07-25

PDF PDF 424 KB
Building Hybrid Test Systems Part 1: Laying the groundwork for a successful transition 

Application Note 2008-03-19

PDF PDF 270 KB
Tips for Optimizing Test System Performance in Linux Soft Real-Time Applications (AN 1465-31) 
This application note offers several tips for optimizing the soft real-time performance of off-the-shelf Linux systems.

Application Note 2008-02-19

Using Linux to Control USB Instruments (AN 1465-30) - Application Note 
Keysight’s USB instruments are compatible with USBTMC, a vendor-independent device class for test and measurement resources. This application note explains how USBTMC works and how you can use the generic services to control your USB instruments.

Application Note 2007-11-07

LXI Test System Provides Flexibility for Testing Automobile Antenna Amplifiers 

Application Note 2007-10-30

PDF PDF 213 KB
Using Linux to Control LXI Instruments Through VXI-11 (AN 1465-28) 
VXI-11 is one of two alternative protocols used by most LAN-based instruments. It is based on RPC (Remote Procedure Calls). This application note explains how VXI-11 works and discusses a number of programming examples.

Application Note 2007-07-08

Using Linux To Control LXI Instruments Through TCP (AN 1465-29) 
TCP is one of two alternative protocols used by most LAN-based instruments. It is the more elegant from a programming standpoint. This application note explains how instrument control works through TCP.

Application Note 2007-06-13

Modifying a GPIB System to Include LAN/LXI (AN 1465-26)  
This application note takes you through the process of replacing one instrument in a typical GPIB test system and shows how simple changes to the system software make it possible.

Application Note 2007-05-10

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