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Build Your Own Test System

Keysight - Build Your Own

Keysight system components help you easily integrate your system –whether you´re starting from scratch, or refreshing an existing system.

With system-ready instruments, open software, and PC-standard I/O (LXI/USB/VXI/PXI), you´re getting the best tools for your greatest designs.

Explore the resources here to see how you can get maximum leverage from Keysight´s test equipment and software.

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Tri:
DesignCon 2017 
February 1-2, 2017; Santa Clara Convention Center, CA

Salon professionnel

 
Improve Your Data Acquisition IQ! 
Original broadcast October 19, 2016

Webcast - enregistré

 
Oscilloscope Test Automation Tools – Remote Programming and BenchVue Test Flow Webcast 
Original broadcast February 23, 2016

Webcast - enregistré

 
Introduction to Keysight VEE Pro 
Learn to develop test software with Keysight Technologies' Visual Engineering Environment (Keysight VEE Pro).

Formation en classe

 
RF/uW Switching Solutions Webcast 
Original broadcast July 8, 2015

Webcast - enregistré

 
Addressing Multi-Channel Synchronization for MIMO and Beamforming Test Webcast 
Original broadcast April 28, 2015

Webcast - enregistré

 
Bridging the Gap from Benchtop to PXI: A Common Software Strategy Webcast 
Original broadcast March 26, 2015

Webcast - enregistré

 
One Size Does Not Fit All - Choose the Right Instrument Form Factor Webcast 
Original broadcast March 11, 2015

Webcast - enregistré

 
Advanced Keysight VEE Pro 
This course will present detailed instruction, explanation and training for advanced programming of VEE Pro.

Formation en classe

 
Boundary Scan Webcast Series 
Live and on-demand webcasts

Webcast

 
Best practices in implementing boundary scan on limited access boards 
Original broadcast December 18, 2014

Webcast - enregistré

 
Testing limited access SSD boards with boundary scan and external instruments webcast 
Original broadcast December 4, 2014

Webcast - enregistré

 
Embedded testing of Intel Haswell and Broadwell chipsets on limited access client boards webcast 
Original broadcast November 13, 2014

Webcast - enregistré

 
Testing DDR on limited access boards using boundary scan silicon nails 
Original broadcast October 30, 2014

Webcast - enregistré

 
Maximizing test coverage of multiple limited access boards by linking multiple boundary scan chains 
Original broadcast October 9, 2014

Webcast - enregistré

 
Extending boundary scan tests to improve test coverage of limited access boards webcast 
Original broadcast September 25, 2014

Webcast - enregistré

 
Introduction to the Keysight x1149 Boundary Scan Analyzer Webcast 
Original broadcast August 26, 2014; 9am PT / 12pm ET

Webcast - enregistré

 
Common DFT guidelines for implementing boundary scan on limited access boards webcast 
Original broadcast September 11, 2014

Webcast - enregistré

 
Accelerate DDR4/LPDDR3 Memory Debug with Bus level Signal Integrity Insight Webcast 
Original broadcast March 4, 2014

Webcast - enregistré

 
Basics of RF Amplifier Test With the Vector Network Analyzer 
Original broadcast Mar 13, 2012

Webcast - enregistré