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고객맞춤형 테스트 시스템 구축

Keysight - Build Your Own

처음부터 다시 시작하든, 기존 시스템을 갱신하든, 키사이트 시스템 구성요소는 시스템을 간편하게 통합할 수 있게 해줍니다. System-Ready 계측기, 개방형 소프트웨어 및 PC-표준 I/O(LXI/USB/VXI/PXI)가 지원되므로 우수한 설계를 위한 최상의 툴을 확보하게 됩니다. 아래 링크를 클릭하면 키사이트의 리소스와 테스트 장비를 최대한 활용할 수 있는 방법을 볼 수 있습니다.

1-25 / 61

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Testing Automotive DC-DC converter with Keysight TS-8989 - Application Note 
This paper discusses emulation of input signals, load simulations and measurements for testing high-power automotive DC-DC converter electronic control units and the TS-8989 functional tester.

어플리케이션 노트 2016-05-15

PDF PDF 880 KB
x1149 Boundary Scan Analyzer - Data Sheet 
The Keysight x1149 boundary scan analyzer brings you better coverage, better diagnostics and best-in-class usability to your work bench to meet your boundary scan test needs.

데이터시트 2016-04-07

Right Load Switching and Simulation Design Choices for High Current and Mechatronic Functional Tests 
Key considerations for designing a cost-effective high-power switching and load management automotive functional test solution.

어플리케이션 노트 2016-02-22

PDF PDF 967 KB
Finding Fault - Article Reprint 
testing mission-critical functions in automotive electronics.

기사 2016-02-05

PDF PDF 452 KB
Testing New Grounds in Automotive Electronics - Article Reprint 
Manufacturers are increasingly designing products for ease of test.

기사 2016-02-02

PDF PDF 279 KB
TS-8989 PXI Functional Test System - Brochure 
The TS-8989 PXI functional tester helps you achieve a lower cost of test for automotive electronic control units and industrial electronics.

브로셔 2016-01-28

PDF PDF 671 KB
TS-8989 Automotive Body and Safety Test Reference Solution – Configuration Guide 
This configuration guide contains information to help you configure your body and safety test reference solution with the TS-8989 functional tester, and tailor the system to meet your requirements.

구성 가이드 2016-01-20

PDF PDF 2.55 MB
TS-8989 System Integration Guide - Application Note 
In today’s manufacturing environment, floor space is an increasingly invaluable variable in the cost of test equation.

어플리케이션 노트 2015-11-11

PDF PDF 2.87 MB
i3070 High Node Count Test Solution - Technical Overview 
Keysight's high node count test solution allows any Keysight 3070/i3070 Series 3 or Series 5 four-module test system to be easily upgraded into an ultra-high pin count test system

기술 개요 2015-02-12

PDF PDF 645 KB
The World’s Highest Pin Count In-Circuit Test Solutions - Brochure 
Keysight's new i3070 and 3070 in-circuit test (ICT) high node count test solution is the world’s highest pin count ICT system, bringing an unprecedented level of performance and portability to users.

브로셔 2015-02-12

PDF PDF 212 KB
Transmit/Receive Module Test Platform (TRM-X) - Technical Overview 
The TRM-X Test Platform, measurement science expertise and systems when and where needed, provide the capability you need to deliver AESA radar; datalink; and satcom transmit/receive modules.

기술 개요 2015-01-10

PDF PDF 1.83 MB
Detecting Tailgating Boards on the i3070 Inline In-Circuit Tester - Application Note 
Tailgating sensor improvements on the Keysight i3070 Series 5i inline in-circuit tester help to further minimize damages due to operator and upstream loading errors.

어플리케이션 노트 2015-01-05

PDF PDF 437 KB
i3070 ICT Fixture Electronic Clock Measurement Modules - Technical Overview 
The Keysight clock measurement modules (CMM)for the i3070 in-circuit test application comes with three types of clock signal measurement to meet your different circuit topologies.

기술 개요 2014-11-11

PDF PDF 213 KB
6 Hints for Enhancing Measurement Integrity in RF/Microwave Test Systems - Application Note 

어플리케이션 노트 2012-04-30

Using .NET Methods to Add Functionality to IVI-COM Drivers  
This application note discusses the use of .NET methods to add functionality to IVI-COM drivers to access a deeper set of instrument functionality with minimal programming.

어플리케이션 노트 2012-03-01

Self-diagnosing Switch Matrix Video (3min) 

기본 데모 2010-11-14

 
Getting Test Programs Up and Running Quickly with Driver Tracing and I/O Monitor 
This note helps you create an example program and then shows you how to use driver tracing and IO Monitor to examine, verify and troubleshoot I/O activity in IVI-COM drivers.

어플리케이션 노트 2009-05-05

Tips in Using Keysight GPIB Solutions in National Instrument’s LabVIEW Environment- Application Note 
Tips for using Keysight GPIB solutions in National Instrument’s LabVIEW environment.

어플리케이션 노트 2009-03-04

어플리케이션 노트: USB, GPIB 및 LAN 사용을 위한 유용한 팁 
어플리케이션 노트: 연결 팁과 요령

어플리케이션 노트 2009-01-03

Using IVI For Your Instrument Driver - Application Note 
This application note describes the use of IVI drivers in your test system to determine when IVI is the right choice

어플리케이션 노트 2008-11-14

Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not 
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance

어플리케이션 노트 2008-10-15

Keysight LXI Compliant E5818A Trigger Box - Understanding Its Capability and Use Cases 
Learn more about the LXI Compliant E5818A trigger box and its capabilities through this white paper. You will also discover how to create a precise time synchronization system over LAN or enhance trigger operations applications.

어플리케이션 노트 2008-07-25

PDF PDF 424 KB
Building Hybrid Test Systems Part 1: Laying the groundwork for a successful transition 

어플리케이션 노트 2008-03-19

PDF PDF 270 KB
Tips for Optimizing Test System Performance in Linux Soft Real-Time Applications (AN 1465-31) 
This application note offers several tips for optimizing the soft real-time performance of off-the-shelf Linux systems.

어플리케이션 노트 2008-02-19

USB 계측기 제어에 Linux 사용 (AN 1465-30) 

어플리케이션 노트 2007-11-07

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