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In digital standards, every generational change puts new risks in your path. We see it firsthand when creating our products and working with engineers like you. Keysight’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of. Keysight - achieve your best design.

Navigate the entire design cycle

Explore this web site for solutions within all four stages of the design cycle as well as the crucial—and integral—field of signal integrity analysis.

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Keysight to Exhibit Latest PCI Express® Design, Test Solutions at PCI-SIG® Developers Conference 
Keysight Technologies announces it will exhibit its PCI Express® (PCIe®) solutions at the PCI-SIG Developers Conference 2015, Booth 7, Santa Clara Convention Center, June 23-24.

Dossier de presse 2016-06-16

 
Asygn & Kalray use Keysight Simulation Tool Suite to Validate PCI Express® Gen3 Serial Links 
Keysight Technologies announces it will exhibit its PCI Express® (PCIe®) solutions at the PCI-SIG Developers Conference 2015, Booth 7, Santa Clara Convention Center, June 23-24.

Dossier de presse 2015-06-19

 
How to Design for Power Integrity: Finding Power Delivery Noise Problems 
This video provides an understanding of how the voltage regulator module (VRM) interacts with the printed circuit board planes and decoupling capacitors within a power distribution network (PDN). A well designed PDN provides optimum system performance while a poorly matched designed PDN can result in poor system performance. In the extreme case, rogue waves can occur within the PDN generating much higher voltage noise levels than expected, potentially interfering with system performance or resulting in permanent damage. Recommendations for keeping the impedance flat are also provided.

Vidéos pratiques 2015-06-05

 
Keysight EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

Bulletin d'information 2015-06-01

 
Forward Clocking - Receiver (RX) Jitter Tolerance Test with J-BERT N4903B High-P - Application Note 
This document describes the requirements for forward clocking topology RX Jitter tolerance testing.

Notes d’application 2015-04-24

PDF PDF 2.22 MB
Keysight's ADS PCIe, USB Compliance Test Benches Solve Simulation-Measurement Correlation Challenge 
Keysight introduces the ADS PCIe and USB Compliance Test Benches, which enable a complete workflow for SerDes engineers, from simulation of a candidate design, through measurement of the finished prototype.

Dossier de presse 2015-04-06

 
Improving IBIS-AMI Model Accuracy: Model-to-Model and Model-to-Lab Correlation Case Studies - Articl 
This DesignCon 2014 paper presents case studies for model-to-model & model-to-lab correlation methods & compares favorable/unfavorable factors for both methods. 10G, 11.5G and 23G SerDes data are used as examples.

Article 2015-04-02

PDF PDF 3.34 MB
Analysis of Test Coupon Structures for the Extraction of High Frequency PCB Material Properties - Wh 
Exploration of the addition of Beatty series resonant impedance structures to improve the accuracy of extracting PCB material properties for the purpose of constructing 3D-EM simulations.

Notes d’application 2015-03-11

PDF PDF 1.73 MB
How to Do Fixture De-embedding to Match Signal Integrity Simulations to Measurements 
This video provides a quick overview of how fixture de-embedding from measurements, or embedding into simulations is a critical step for matching simulations to measurements for physical layer Tx to Rx channels.

Vidéos pratiques 2015-03-10

 
Keysight Technologies to Demonstrate Latest EMC Design, Test Tools at EMCSI Symposium 
Keysight announces it will demonstrate and discuss the latest tools and techniques on 1) EMC design and testing, and 2) signal and power integrity at the EMCSI 2015 Symposium, Santa Clara Convention Center, Booth 618, March 17-19.

Dossier de presse 2015-03-09

 
Digital Design & Interconnect Standards - Brochure 
Brochure shows Agilent’s high-speed digital solution set , a range of essential tools, measurement and simulation—that will help cut through the challenges of gigabit digital designs.

Brochure 2015-03-09

PDF PDF 7.71 MB
N4916B De-emphasis Signal Converter - Data Sheet 
The N4916B de-emphasis signal converter enables R&D and test engineers to accurately characterize gigabit serial ports and channels. The clock doubler option is needed to analyze half-rate clock devices.

Fiche signalétique 2015-03-05

PDF PDF 2.96 MB
PCI Express® Design and Test from Electrical to Protocol - Brochure 
Thoroughly characterize and validate PCI Express designs with Keysight's PCI Express design and test solutions from electrical to protocol.

Brochure 2015-02-03

PDF PDF 3.75 MB
In-Circuit Test Suite - Brochure 
Latest board and functional test solutions to help electronics manufacturers achieve better product quality withmore comprehensive test coverage.

Brochure 2015-02-01

PDF PDF 10.42 MB
Time Domain Reflectometry Theory - Application Note 
When compared to other measurement techniques, time domain reflectometry provides a more intuitive and direct look at the DUT's characteristics.

Notes d’application 2015-01-30

HDMI and DisplayPort Design and Test – A Better Way - Brochure 
Brochure covering Keysight’s HDMI and Displayport test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these.

Brochure 2015-01-23

PDF PDF 11.70 MB
Keysight Technologies Exhibits High-Speed Digital Design and Test Solutions at DesignCon 
Keysight announces that it will exhibit its high-speed digital solutions at DesignCon 2015, Booth 725, Santa Clara Convention Center, Jan. 28-29.

Dossier de presse 2015-01-12

 
ADS W2302EP/ET, W2500EP/ET, and W2312EP/ET Transient Convolution Products 
Advanced Design System W2302EP/ET Transient Convolution Element, W2500EP/ETTransient Convolution GT Option, and W2312EP/ET Transient Convolution Distributed Computing 8-pack

Brochure 2014-12-30

PDF PDF 1.16 MB
Keysight Donates $120 Mil. Gift of Software, Support and Training to Georgia Institute of Technology 
Keysight announces the largest in-kind software donation in its longstanding relationship with the Georgia Institute of Technology.

Dossier de presse 2014-12-10

 
Keysight Receives Global Frost & Sullivan Award for Market Leadership in Instrumentation Software 
Keysight Technologies announces that Frost & Sullivan has recognized Keysight with the 2014 Global Frost & Sullivan Award for Market Leadership in Instrumentation Software for excellence in capturing the highest market revenue within its industry. The award is based on Frost & Sullivan's recent analysis of the instrumentation software market.

Dossier de presse 2014-12-08

 
Discovering ADS 
A collection of Keysight EEsof EDA ADS video demonstrations and tutorials

Démonstration de base 2014-10-28

 
Keysight to Demonstrate Hardware and Electronic Design Automation Software Solutions at EPEPS 2014 
Keysight Technologies announces it will demonstrate its latest hardware and electronic design automation software solution releases at EPEPS 2014, Embassy Suites Portland, Portland, Oregon, Oct. 26-29. Keysight is a silver-level sponsor of the event.

Dossier de presse 2014-10-23

 
Design Challenges in DDR4 - The Keysight DDR Bus Simulator 
This video is about design challenges in DDR4 and in particular the DDR Bus Simulator, which is a new Keysight EEsof EDA simulation tool for DDR4 and beyond.

Démonstration de base 2014-10-16

 
Keysight Technologies Demonstrates Simulation, Debug, Validation and Test Solutions at MemCon 
Keysight announces it will demonstrate solutions that provide simulation, debug, validation and test for the fastest speed memory designs at MemCon, Santa Clara Convention Center, Booth102, Santa Clara, Calif., Oct. 15.

Dossier de presse 2014-10-13

 
DDR Compliance Integration with Advanced Design System 
The W2351EP DDR4 Compliance Test Bench helps solve the problem of simulation-measurement correlation.

Démonstration de base 2014-10-03

 

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