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高速數位

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每一代數位標準的變化,都會帶來新的產品設計風險。藉由與業界專家以及像您這樣的工程師共同合作,我們得以取得第一手資訊並順利開發產品。 是德高速數位測試解決方案建構於我們不斷與業界專家進行溝通交流的量測技術與專業知識之上。 藉由與您分享我們最先進的量測專業知識,是德可協助您順利克服挑戰,並且加速推出傲視業界的產品。是德是協助您實現最佳設計的推手。

瀏覽整個設計周期

請瀏覽產品網頁,以便觀看並尋找在設計週期的四個階段以及執行重要的信號完整度分析所需的解決方案。

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Keysight to Exhibit Latest PCI Express® Design, Test Solutions at PCI-SIG® Developers Conference 
Keysight Technologies announces it will exhibit its PCI Express® (PCIe®) solutions at the PCI-SIG Developers Conference 2015, Booth 7, Santa Clara Convention Center, June 23-24.

新聞資料 2016-06-16

 
Challenges extend from simulation to compliance 
Tami Pippert, Keysight Technologies’ high-speed digital marketing program manager, elaborates on how Keysight is enhancing its model generation, simulation, and data analysis technologies.

專文 2015-07-08

 
Keysight EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

新聞簡訊 2015-07-08

 
Asygn & Kalray use Keysight Simulation Tool Suite to Validate PCI Express® Gen3 Serial Links 
Keysight Technologies announces it will exhibit its PCI Express® (PCIe®) solutions at the PCI-SIG Developers Conference 2015, Booth 7, Santa Clara Convention Center, June 23-24.

新聞資料 2015-06-19

 
How to Design for Power Integrity: Finding Power Delivery Noise Problems 
This video provides an understanding of how the voltage regulator module (VRM) interacts with the printed circuit board planes and decoupling capacitors within a power distribution network (PDN). A well designed PDN provides optimum system performance while a poorly matched designed PDN can result in poor system performance. In the extreme case, rogue waves can occur within the PDN generating much higher voltage noise levels than expected, potentially interfering with system performance or resulting in permanent damage. Recommendations for keeping the impedance flat are also provided.

使用說明影片 2015-06-05

 
Forward Clocking - Receiver (RX) Jitter Tolerance Test with J-BERT N4903B High-P - Application Note 
This document describes the requirements for forward clocking topology RX Jitter tolerance testing.

應用手冊 2015-04-24

PDF PDF 2.22 MB
Keysight's ADS PCIe, USB Compliance Test Benches Solve Simulation-Measurement Correlation Challenge 
Keysight introduces the ADS PCIe and USB Compliance Test Benches, which enable a complete workflow for SerDes engineers, from simulation of a candidate design, through measurement of the finished prototype.

新聞資料 2015-04-06

 
Improving IBIS-AMI Model Accuracy: Model-to-Model and Model-to-Lab Correlation Case Studies - Articl 
This DesignCon 2014 paper presents case studies for model-to-model & model-to-lab correlation methods & compares favorable/unfavorable factors for both methods. 10G, 11.5G and 23G SerDes data are used as examples.

專文 2015-04-02

PDF PDF 3.34 MB
Analysis of Test Coupon Structures for the Extraction of High Frequency PCB Material Properties - Wh 
Exploration of the addition of Beatty series resonant impedance structures to improve the accuracy of extracting PCB material properties for the purpose of constructing 3D-EM simulations.

應用手冊 2015-03-11

PDF PDF 1.73 MB
How to Do Fixture De-embedding to Match Signal Integrity Simulations to Measurements 
This video provides a quick overview of how fixture de-embedding from measurements, or embedding into simulations is a critical step for matching simulations to measurements for physical layer Tx to Rx channels.

使用說明影片 2015-03-10

 
Digital Design & Interconnect Standards - Brochure 
Brochure shows Agilent’s high-speed digital solution set , a range of essential tools, measurement and simulation—that will help cut through the challenges of gigabit digital designs.

型錄 2015-03-09

PDF PDF 7.71 MB
Keysight Technologies to Demonstrate Latest EMC Design, Test Tools at EMCSI Symposium 
Keysight announces it will demonstrate and discuss the latest tools and techniques on 1) EMC design and testing, and 2) signal and power integrity at the EMCSI 2015 Symposium, Santa Clara Convention Center, Booth 618, March 17-19.

新聞資料 2015-03-09

 
N4916B De-emphasis Signal Converter - Data Sheet 
The N4916B de-emphasis signal converter enables R&D and test engineers to accurately characterize gigabit serial ports and channels. The clock doubler option is needed to analyze half-rate clock devices.

產品型錄 2015-03-05

PDF PDF 2.96 MB
PCI Express® Design and Test from Electrical to Protocol - Brochure 
Thoroughly characterize and validate PCI Express designs with Keysight's PCI Express design and test solutions from electrical to protocol.

型錄 2015-02-03

PDF PDF 3.75 MB
In-Circuit Test Suite - Brochure 
Latest board and functional test solutions to help electronics manufacturers achieve better product quality withmore comprehensive test coverage.

型錄 2015-02-01

PDF PDF 10.42 MB
Time Domain Reflectometry Theory - Application Note 
When compared to other measurement techniques, time domain reflectometry provides a more intuitive and direct look at the DUT's characteristics.

應用手冊 2015-01-30

HDMI and DisplayPort Design and Test – A Better Way - Brochure 
Brochure covering Keysight’s HDMI and Displayport test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these.

型錄 2015-01-23

PDF PDF 11.70 MB
Keysight Technologies Exhibits High-Speed Digital Design and Test Solutions at DesignCon 
Keysight announces that it will exhibit its high-speed digital solutions at DesignCon 2015, Booth 725, Santa Clara Convention Center, Jan. 28-29.

新聞資料 2015-01-12

 
ADS W2302EP/ET, W2500EP/ET, and W2312EP/ET Transient Convolution Products 
Advanced Design System W2302EP/ET Transient Convolution Element, W2500EP/ETTransient Convolution GT Option, and W2312EP/ET Transient Convolution Distributed Computing 8-pack

型錄 2014-12-30

PDF PDF 1.16 MB
Keysight Donates $120 Mil. Gift of Software, Support and Training to Georgia Institute of Technology 
Keysight announces the largest in-kind software donation in its longstanding relationship with the Georgia Institute of Technology.

新聞資料 2014-12-10

 
Keysight Receives Global Frost & Sullivan Award for Market Leadership in Instrumentation Software 
Keysight Technologies announces that Frost & Sullivan has recognized Keysight with the 2014 Global Frost & Sullivan Award for Market Leadership in Instrumentation Software for excellence in capturing the highest market revenue within its industry. The award is based on Frost & Sullivan's recent analysis of the instrumentation software market.

新聞資料 2014-12-08

 
Discovering ADS 
A collection of Keysight EEsof EDA ADS video demonstrations and tutorials

基本展示 2014-10-28

 
Keysight to Demonstrate Hardware and Electronic Design Automation Software Solutions at EPEPS 2014 
Keysight Technologies announces it will demonstrate its latest hardware and electronic design automation software solution releases at EPEPS 2014, Embassy Suites Portland, Portland, Oregon, Oct. 26-29. Keysight is a silver-level sponsor of the event.

新聞資料 2014-10-23

 
Design Challenges in DDR4 - The Keysight DDR Bus Simulator 
This video is about design challenges in DDR4 and in particular the DDR Bus Simulator, which is a new Keysight EEsof EDA simulation tool for DDR4 and beyond.

基本展示 2014-10-16

 
Keysight Technologies Demonstrates Simulation, Debug, Validation and Test Solutions at MemCon 
Keysight announces it will demonstrate solutions that provide simulation, debug, validation and test for the fastest speed memory designs at MemCon, Santa Clara Convention Center, Booth102, Santa Clara, Calif., Oct. 15.

新聞資料 2014-10-13

 

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