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High-Speed Digital

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In digital standards, every generational change puts new risks in your path. We see it firsthand when creating our products and working with engineers like you. Keysight’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of. Keysight - achieve your best design.

Navigate the entire design cycle

Explore this web site for solutions within all four stages of the design cycle as well as the crucial—and integral—field of signal integrity analysis.

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DesignCon 2015 
Download Keysight's papers from Technical Conference; Jan 27-29, 2015; Santa Clara Convention Center

Tradeshow

 
Fundamentals of Wavelength Dependent Optical Component Testing Webcast 
Live broadcast September 29, 2015; 10am PT / 1pm ET

Webcast

 
All 2015 US and Canada Events - Trade Shows, Seminars, Webcasts 
Calendar of upcoming events

Seminar

 
Transistor Measurement and Modeling Challenges Seminar 
Various dates and locations

Seminar

 
2015 Keysight EEsof EDA Training Course Calendar 
Scheduled Keysight EEsof courses for the United States and Canada

Classroom Training

 
Oscilloscope Measurements Webcast Series 
Live and on-demand broadcasts that will teach you how to make precise measurements with its Infiniium line of real-time and sampling oscilloscopes.

Webcast

 
Debugging Serial Buses In Embedded Designs using Oscilloscopes Webcast 
Original broadcast August 18, 2015

Webcast - recorded

 
How to Use a SERDES Channel Simulator for PAM-4 Simulations and Analysis Webcast 
Original broadcast July 23, 2015

Webcast - recorded

 
PCIe - Assuring Gen4 Tx/Rx Performance with Hot TDR Webcast 
Live broadcast September 9, 2015; 10am PT / 1pm ET

Webcast

 
Tutorials in Signal Integrity - Webcast Library  
Upcoming, live webcasts and past, on-demand webcasts.

Webcast

 
MIPI – Overcome Test Challenges to Ensure Interoperability for your PHY Webcast 
Original broadcast June 23, 2015

Webcast - recorded

 
New 2015 Keysight EEsof EDA Simulation Tools for Signal Integrity and Power Integrity 
In this seminar, leading Keysight EEsof EDA R&D Designers provide a first-hand look at the new HSD features for signal integrity and power integrity simulation.

Seminar Materials 2015-07-24

 
RF/uW Switching Solutions Webcast 
Original broadcast July 8, 2015

Webcast - recorded

 
Achieving Success at 16 Gigabit Operation with PCI Express® 4.0 Webcast 
Live broadcast September 10, 2015; 10am PT / 1pm ET

Webcast

 
Find Signal Integrity Problems Faster through TDR/TDT Measurements Webcast 
Live broadcast August 27, 2015; 10am PT / 1pm ET

Webcast

 
EMC Two Part Webcast Series 
Live broadcasts April 28 & 29, 2015

Webcast

 
Validate PCIe® Power Saving with L1 Substate Analysis Webcast 
Original broadcast June 17, 2015

Webcast - recorded

 
Jitter Measurements and Real-Time Eye Analysis Using an Oscilloscope Webcast 
Original broadcast May 28, 2015

Webcast - recorded

 
Extraction, Verification, and Usage of a Short Haul Opto VCSEL Model Webcast 
Original broadcast May 28, 2015

Webcast - recorded

 
PAM-4 Transmitter and Receiver Design Characterization Solutions Webcast 
Original broadcast May 21, 2015

Webcast - recorded

 
MIPI Physical Layer Standards and Receiver Test Solutions Webcast 
Original broadcast May 13, 2015

Webcast - recorded

 
DisplayPort 1.3 – PHY Layer Test Requirements Webcast 
Live broadcast May 27, 2015; 10am PT / 1pm ET

Webcast

 
Addressing Multi-Channel Synchronization for MIMO and Beamforming Test Webcast 
Original broadcast April 28, 2015

Webcast - recorded

 
DDR4/LPDDR4 – Overcome the Barriers of Testing and Probing High-Speed Memory Systems Webcast 
Original broadcast April 23, 2015

Webcast - recorded

 
Introducing the New Infiniium V-Series High-Performance Oscilloscope Webcast 
Original broadcast April 14, 2015

Webcast - recorded

 

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