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High-Speed Digital

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In digital standards, every generational change puts new risks in your path. We see it firsthand when creating our products and working with engineers like you. Keysight’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of. Keysight - achieve your best design.

Navigate the entire design cycle

Explore this web site for solutions within all four stages of the design cycle as well as the crucial—and integral—field of signal integrity analysis.

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Keysight to Exhibit Latest PCI Express® Design, Test Solutions at PCI-SIG® Developers Conference 
Keysight Technologies announces it will exhibit its PCI Express® (PCIe®) solutions at the PCI-SIG Developers Conference 2015, Booth 7, Santa Clara Convention Center, June 23-24.

Press Materials 2016-06-16

Keysight Technologies Introduces PAM-4 Capability for its Advanced Design System Channel Simulator 
Keysight announces a four-level PAM-4 capability for the ADS Channel Simulator. The introduction of this capability further advances Keysight's leadership position in IBIS-AMI SerDes channel simulation.

Press Materials 2015-11-17

Keysight EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

Newsletter 2015-11-03

Configuring Lattice BSCAN2 Scan Path Linker on Keysight x1149 Boundary Scan Analyzer - App Note 
A boundary scan linker mux device links multiple boundary scan chains into one single chain or multiple chain configurations. Find out how to configure Lattice BSCAN2 scan path linkers in this paper.

Application Note 2015-10-30

Signal Integrity Analysis Series Part 1: Single-Port TDR, TDR/TDT, and 2-Port TDR - Application Note 
This Application Note focuses on part 1: those which use a single-port TDR, those which use TDR/TDT, and those which use 2-port TDR.

Application Note 2015-10-29

Keysight Technologies to Demonstrate Advances in Hardware, EDA Software Solutions at EPEPS 2015 
Keysight announces it will demonstrate its latest hardware and electronic design automation (EDA) software solution releases at EPEPS 2015, DoubleTree by Hilton Hotel, Booth 3, San Jose, Calif., Oct. 25-28.

Press Materials 2015-10-22

Keysight Technologies to Demonstrate Latest Simulation Software Solutions at CSICS 
Keysight announces it will demonstrate its latest RF circuit, system and 3-D electromagnetic design and electro-thermal simulation software solutions at the Compound Semiconductor IC Symposium (CSICS 2015), Sheraton New Orleans, Booth 601, New Orleans, Oct. 11-14.

Press Materials 2015-10-08

Heidi Barnes Interview at PCB West 2015 
Heidi Barnes talks with Sierra Circuits on signal integrity challenges when designing high-speed digital circuits on printed circuit boards (PCBs).

Demo 2015-10-08

PAM-4 Simulation and Design of Next Generation High-Speed Digital Links 
Brief overview of simulation solutions for PAM-4 electrical signaling.

Technical Overview 2015-09-17

Keysight EEsof EDA makes it easy to get back to school—at least virtually 
Rick Nelson, executive editor of Evaluation Engineering, visited Keysight Technologies and had this to say about Keysight EEsof EDA.

Article 2015-09-11

Keysight Technologies' University Educational Support Programs Now in More Than 200 Universities 
Keysight announces that more than 200 universities in North America are now participating in the Keysight EEsof EDA University Educational Support Programs, which provide several thousand students with EDA software licenses.

Press Materials 2015-08-20

Keysight EEsof EDA Premier Communications Design Software 
Keysight EEsof EDA premier communications design software product overview brochure.

Brochure 2015-08-19

PCI Express® Design and Test from Electrical to Protocol - Brochure 
This brochure provides insight into how to thoroughly simulate, characterize and validate PCI Express Designs.

Brochure 2015-08-17

Challenges extend from simulation to compliance 
Tami Pippert, Keysight Technologies’ high-speed digital marketing program manager, elaborates on how Keysight is enhancing its model generation, simulation, and data analysis technologies.

Article 2015-07-08

Asygn & Kalray use Keysight Simulation Tool Suite to Validate PCI Express® Gen3 Serial Links 
Keysight Technologies announces it will exhibit its PCI Express® (PCIe®) solutions at the PCI-SIG Developers Conference 2015, Booth 7, Santa Clara Convention Center, June 23-24.

Press Materials 2015-06-19

How to Design for Power Integrity: Finding Power Delivery Noise Problems 
This video provides an understanding of how the voltage regulator module (VRM) interacts with the printed circuit board planes and decoupling capacitors within a power distribution network (PDN). A well designed PDN provides optimum system performance while a poorly matched designed PDN can result in poor system performance. In the extreme case, rogue waves can occur within the PDN generating much higher voltage noise levels than expected, potentially interfering with system performance or resulting in permanent damage. Recommendations for keeping the impedance flat are also provided.

How-To Video 2015-06-05

Forward Clocking - Receiver (RX) Jitter Tolerance Test with J-BERT N4903B High-P - Application Note 
This document describes the requirements for forward clocking topology RX Jitter tolerance testing.

Application Note 2015-04-24

Keysight's ADS PCIe, USB Compliance Test Benches Solve Simulation-Measurement Correlation Challenge 
Keysight introduces the ADS PCIe and USB Compliance Test Benches, which enable a complete workflow for SerDes engineers, from simulation of a candidate design, through measurement of the finished prototype.

Press Materials 2015-04-06

Improving IBIS-AMI Model Accuracy: Model-to-Model and Model-to-Lab Correlation Case Studies - Articl 
This DesignCon 2014 paper presents case studies for model-to-model & model-to-lab correlation methods & compares favorable/unfavorable factors for both methods. 10G, 11.5G and 23G SerDes data are used as examples.

Article 2015-04-02

Analysis of Test Coupon Structures for the Extraction of High Frequency PCB Material Properties - Wh 
Exploration of the addition of Beatty series resonant impedance structures to improve the accuracy of extracting PCB material properties for the purpose of constructing 3D-EM simulations.

Application Note 2015-03-11

How to Do Fixture De-embedding to Match Signal Integrity Simulations to Measurements 
This video provides a quick overview of how fixture de-embedding from measurements, or embedding into simulations is a critical step for matching simulations to measurements for physical layer Tx to Rx channels.

How-To Video 2015-03-10

Digital Design & Interconnect Standards - Brochure 
Brochure shows Agilent’s high-speed digital solution set , a range of essential tools, measurement and simulation—that will help cut through the challenges of gigabit digital designs.

Brochure 2015-03-09

Keysight Technologies to Demonstrate Latest EMC Design, Test Tools at EMCSI Symposium 
Keysight announces it will demonstrate and discuss the latest tools and techniques on 1) EMC design and testing, and 2) signal and power integrity at the EMCSI 2015 Symposium, Santa Clara Convention Center, Booth 618, March 17-19.

Press Materials 2015-03-09

N4916B De-emphasis Signal Converter - Data Sheet 
The N4916B de-emphasis signal converter enables R&D and test engineers to accurately characterize gigabit serial ports and channels. The clock doubler option is needed to analyze half-rate clock devices.

Data Sheet 2015-03-05

In-Circuit Test Suite - Brochure 
Latest board and functional test solutions to help electronics manufacturers achieve better product quality withmore comprehensive test coverage.

Brochure 2015-02-01

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