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Aerospace & Defense

Focus where it counts

Missions evolve but one thing stays the same: the need to protect those who go in harm's way. Success depends on a changing mix of people and technology. As technology becomes more complex, assuring readiness gets tougher.

Keysight is a source of assurance that your mission will succeed. Through our expertise in measurement science and test processes, we give you more time for the bigger issues: fulfilling today's mission and managing the transition to what comes next. By helping you build greater assurance in system readiness, Keysight frees you to focus where it counts most.

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Real-Time Spectrum Analyzer, X-Series Signal Analyzers - Technical Overview 
Real-time spectrum analyzer capabilities are an upgrade option to the PXA/MXA signal analyzers. Adding real-time lets you see, capture and understand the most elusive signals.

Technical Overview 2017-03-27

M9068A Phase Noise X-Series Measurement Application for PXI Vector Signal Analyzers 
This document provides technical and other information related to the Phase Noise X-Series measurement application for modular instruments.

Technical Overview 2015-02-10

PDF PDF 2.39 MB
Transmit/Receive Module Test Platform (TRM-X) - Technical Overview 
The TRM-X Test Platform, measurement science expertise and systems when and where needed, provide the capability you need to deliver AESA radar; datalink; and satcom transmit/receive modules.

Technical Overview 2015-01-10

89601B/BN-105 Link to EEsof ADS/SystemVue, 89600 VSA - Technical Overview 
This technical overview integrates the 89600 VSA software with Keysight's EEsof Advanced Design System (ADS) electronic design automation software or SystemVue ESL software with Option 105.

Technical Overview 2012-12-19

PDF PDF 782 KB
N6820E-MR1 Modulation Recognition Capability for E3238S/N6820E Signal Survey Systems 

Technical Overview 2009-10-06

PDF PDF 379 KB
E3238 Signals Development System - Product Overview 

Technical Overview 2009-04-20

E3238S/N6820E Signal Survey System - Technical Overview 

Technical Overview 2009-04-20