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Cellular

Insight. It comes upon you in a flash. And you know at once you have something special. At Keysight Technologies, the foundation is our unique mix of hardware, software and people. You can count on test equipment and design software that is built on more than 75 years of leadership in measurement science.

The continuing innovation across new and existing cellular technologies present challenges in designing and testing of mobile networks and devices. As the world’s leading electronic measurement company, Keysight technologies continues to be at the forefront offering full portfolio of cellular test and design solutions that span the entire lifecycle – from simulation to R&D, design verification and pre-conformance, conformance, manufacturing, through network deployment and service assurance.

We know what it takes for your designs to meet the latest cellular standards. As an active member of 3GPP and other most influential wireless standards bodies and leading 5G forums and consortia, we have been at the forefront of providing standard-compliant cellular test and design tools from the legacy 1G through latest 4G technologies, and maintain our leadership position by providing the largest array of design and test solutions for 5G research covering simulation and test.

We design our instruments to be future-proof, making it easier for you to evolve with changing technologies and stay on the leading edge. You can carry your investment forward with consistent measurement science that spans research and development today and extends to manufacturing and deployment in the future.

Our engineers, experts in design and test, are available to advise, assist and augment your teams all around the world. Our expertise is also readily available through white papers, application notes and webcasts for 5G, Cellular, MIMO and WLAN Test.

Keysight RF and Digital Learning Center - A commitment to learning with industry experts


 

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Genesys Learning days in Germany 
Genesys Learning Week , Böblingen

Classroom Training

 
SystemVue Training 
SystemVue training in France (Les Ulis)

Classroom Training

 
ADS SIPro – PIPro class  
SI PI Pro class in Paris

Classroom Training

 
FieldFox Handheld Analyzers Education Series 
Series of live and on-demand webcasts

Webcast

 
Smart Testing to Limit Your Risk Exposure in Wireless Medical Devices 
Live broadcast August 23, 2017; 10am PET / 1pm ET

Webcast

 
Join Keysight Technologies at MWC Americas 2017 
MWC Americas September 12-14, 2017; San Francisco, CA

Tradeshow

 
Understanding RF and Microwave Analysis Basics Webcast 
Live broadcast September 13, 2017; 10am PT / 1pm ET

Webcast - recorded

 
How will you Handle the Interference of Things Caused by Medical/IoT Devices? 
Original broadcast June 20, 2017

Webcast - recorded

 
Medical Wireless Technology Applications Offer Opportunities and Challenges 
Original broadcast July 18, 2017

Webcast

 
International Microwave Symposium (IMS) 2017 
June 4 - 9, 2017; Honolulu, Hawaii

Tradeshow

 
Automating Everyday Test and Measurement Tasks in Minutes 
Live broadcast July 19, 2017; 10am PT / 1pm ET

Webcast

 
RF & Microwave Measurement Fundamentals 
This 4-day class studies the principles of microwaves on transmission lines and power measurements, signal sources, mixers and modulation techniques, and the use of signal types in test applications.

Classroom Training

 
Mastering Signal Integrity & Power Integrity Design Seminar 
Mastering Signal Integrity & Power Integrity Design Seminar

Seminar Materials 2017-08-18

 
Tutorials in Signal Integrity - Webcast Library  
Upcoming, live webcasts and past, on-demand webcasts.

Webcast

 
Join Keysight at EuMW 2017 
EuMW 2017 is coming soon

Seminar

 
USB Type-C Physical Layer Design Webcast 
Live broadcast November 9, 2017; 10am PT / 1pm ET

Webcast - recorded

 
Electronic Measurement Events in Europe, Middle East, Africa & India 
Electronic Measurement events in Europe, the Middle East, Africa & India - seminars, trade shows, user group meetings, webcasts, tutorials and conferences.

Seminar

 
Characterization and Modeling Challenges for Advanced Semiconductor Technologies - Seminar Materials 
Seminar materials from the "Characterization and Modeling Challenges for Advanced Semiconductor Technologies" seminar.

Seminar Materials 2017-08-14

 
RADAR 2017 
23-26 October 2017, Belfast Waterfront Conference Centre

Tradeshow

 
What's New in Keysight Technologies' Device Modeling Portfolio 2017 
Highlights of new capabilities in Keysight's end-to-end device modeling portfolio, Power Electronics modeling solution preview, Wafer-level 1/f noise & Random Telegraph Noise (RTN) measurement solutions, Model Builder Program (MBP), and Model Quality Assurance (MQA).

Seminar Materials 2017-08-10

PDF PDF 3.19 MB
Python-driven Table Generation in Automated Device Model Validation 
MQA is a well-known, automated SPICE model validation software that enables engineers to check and analyze SPICE model libraries, compare different models, and generate quality assurance (QA) reports in a complete and efficient way. MQA 2017 extends these capabilities by introducing the Python Report Formatting System (PyRFS) module, which allows engineers to customize tables—either generate new tables or update existing tables—in .csv and .xlsx file formats.

Seminar Materials 2017-08-10

PDF PDF 2.41 MB
Automatable RTN Measurement Using the B1500A Semiconductor Parameter Analyzer 
As device lithographies have continued to shrink, understanding the impact of random telegraph noise (RTN) on integrated circuits has become increasingly important. Due to its innate random nature and dependence on applied voltage, characterizing RTN on a process requires many measurements to be made across a wafer at multiple gate-to-source biases. This section will cover the basics of RTN measurement and outline a cost-effective Keysight solution using WaferPro Express and the B1500A Semiconductor Device Analyzer.

Seminar Materials 2017-08-10

PDF PDF 2.41 MB
Static Random Access Memory (SRAM) Cell Modeling in MBP 2017 
The latest release Model Builder Program (MBP) 2017 now features a SRAM cell model generation package that’s designed to address the challenges of modern complex SRAM cell modeling, by enabling engineers to extract transistor-level and memory-cell models in one MBP session.

Seminar Materials 2017-08-10

PDF PDF 1.44 MB
The New Re-centering Solution in MBP 2017 Update 1 
A preview of the up-coming new re-centering function for re-centering an existing model to a new specification, with fully customizable device targets definition and scaling graph visualization.

Seminar Materials 2017-08-10

PDF PDF 1.39 MB
Be Prepared for Next Generation MIPI Physical Layer Design and Evaluation Webcast 
Live broadcast August 24, 2017; 10am PT / 1pm ET

Webcast

 

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