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Cellular

Insight. It comes upon you in a flash. And you know at once you have something special. At Keysight Technologies, the foundation is our unique mix of hardware, software and people. You can count on test equipment and design software that is built on more than 75 years of leadership in measurement science.

The continuing innovation across new and existing cellular technologies present challenges in designing and testing of mobile networks and devices. As the world’s leading electronic measurement company, Keysight technologies continues to be at the forefront offering full portfolio of cellular test and design solutions that span the entire lifecycle – from simulation to R&D, design verification and pre-conformance, conformance, manufacturing, through network deployment and service assurance.

We know what it takes for your designs to meet the latest cellular standards. As an active member of 3GPP and other most influential wireless standards bodies and leading 5G forums and consortia, we have been at the forefront of providing standard-compliant cellular test and design tools from the legacy 1G through latest 4G technologies, and maintain our leadership position by providing the largest array of design and test solutions for 5G research covering simulation and test.

We design our instruments to be future-proof, making it easier for you to evolve with changing technologies and stay on the leading edge. You can carry your investment forward with consistent measurement science that spans research and development today and extends to manufacturing and deployment in the future.

Our engineers, experts in design and test, are available to advise, assist and augment your teams all around the world. Our expertise is also readily available through white papers, application notes and webcasts for 5G, Cellular, MIMO and WLAN Test.

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2009 ADS Users' Group Meeting 
Agilent ADS User Group Meeting

Seminar Materials 2010-01-14

 
3070 Boundary Scan 
Learn concepts of Boundary-Scan technology. TAP (test access port), the functionality of registers (BYPASS, boundary, IDCODE), and the structure of the "boundary-cell" are described.

Classroom Training

 
3070 Family Multiplexed User Fundamentals Class I 
Learn the basics needed to develop a Board Test program with the i3070 Multiplexed Board Test system. Design, develop, turn-on and debug tests. Typically, Class I and II are taken consecutively.

Classroom Training

 
AD SEMINAR 
Séminaire Aérospace & Defense

Seminar

 
Analyse et génération de signaux RF 
Une journée de séminaire pour réviser les bases de l’analyse de spectre, suivre l’évolution technologique des nouveaux analyseurs de signaux, revoir les bases de la génération RF et hyperfréquences et de la modulation numérique.

Seminar Materials - Archived

 
Analyse et génération de signaux RF - Jeudi 30 juin à Rennes 
Une journée de séminaire pour réviser les bases de l’analyse de spectre, suivre l’évolution technologique des nouveaux analyseurs de signaux, revoir les bases de la génération RF et hyperfréquences et de la modulation numérique.

Seminar Materials - Archived

 
Atelier de Mesures Oscilloscopes Keysight 
Atelier de Mesures Oscilloscopes Keysight

Seminar

 
Conférence caractérisation de matériaux - online registration 
Conférence caractérisation de matériaux - online registration

Seminar Materials 2010-08-17

 
Digital Signal Analysis 
Digital Signal Analysis

Seminar Materials 2011-01-31

PDF PDF 1.21 MB
Electronic Measurement Course Calendar for Europe 
Calendar of Electronic Measurement courses scheduled in Europe. Course details, dates, locations, and costs.

Classroom Training

 
ENOVA 
ENOVA PARIS (Carrefour de l’électronique, Mesurexpovision & Village Métrologie, Opto et RF&Hyper) se tiendra de nouveau à Paris expo Porte de Versailles du 8 au 10 octobre 2013.

Tradeshow

 
ESIEE INTRO.ppt 
ESIEE INTRO.ppt

Training Materials 2009-06-04

PPT PPT 3.17 MB
ESIEE MIMO.pptx 
ESIEE MIMO.pptx

Training Materials 2009-06-04

PPT PPT 4.46 MB
ESIEE RF PARA.pptx 
ESIEE RF PARA.pptx

Training Materials 2009-06-04

PPT PPT 5.63 MB
Evénements Keysight en France 
Bienvenue sur la page des événements auxquels participe Keysight en France

Seminar

 
Formation Keysight VEE 
Le contenu des modules de formation VEE est destiné aux ingénieurs et techniciens débutants avec le logiciel VEE ou les utilisateurs plus expérimentés voulant consolider leurs connaissances.

Classroom Training

 
HSD Symposium France  
HSD Symposium France

Seminar

 
i3070 Family Multiplexed User Fundamentals Class II  
Enhanced training to take the programmer beyond the basics into custom test generation. Get more performance and coverage from your i3070. Typically, Class I and II are taken consecutively.

Classroom Training

 
Inivation au séminaire "Mesures d’impédance et matériaux"  
Séminaire "Mesures d’impédance et matériaux"

Seminar

 
Introduction à Keysight VEE 
L’objectif de ce cours est d’apprendre à résoudre vos problèmes de tests en développant des programmes à l’aide du langage de programmation Keysight VEE (Visual Engineering Environment), comprendre les fondamentaux du logiciel VEE, ...

Classroom Training

 
Invitatation séminaire EEsof Nice - 24 Novembre 2009 - 
Invitatation séminaire EEsof Nice - 24 Novembre 2009 - Flyer

Seminar Materials 2009-11-10

PDF PDF 217 KB
Invitation au séminaire Analyse de signaux RF  
Séminaire Analyse de signaux RF

Seminar

 
Invitation au séminaire RF 
séminaire RF

Seminar

 
Invitation au séminaire RF 
séminaire RF

Seminar

 
Invitation to the Keysight EEsof week 
invitation to the Keysight EEsof week

Seminar

 

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