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Cellular

Insight. It comes upon you in a flash. And you know at once you have something special. At Keysight Technologies, the foundation is our unique mix of hardware, software and people. You can count on test equipment and design software that is built on more than 75 years of leadership in measurement science.

The continuing innovation across new and existing cellular technologies present challenges in designing and testing of mobile networks and devices. As the world’s leading electronic measurement company, Keysight technologies continues to be at the forefront offering full portfolio of cellular test and design solutions that span the entire lifecycle – from simulation to R&D, design verification and pre-conformance, conformance, manufacturing, through network deployment and service assurance.

We know what it takes for your designs to meet the latest cellular standards. As an active member of 3GPP and other most influential wireless standards bodies and leading 5G forums and consortia, we have been at the forefront of providing standard-compliant cellular test and design tools from the legacy 1G through latest 4G technologies, and maintain our leadership position by providing the largest array of design and test solutions for 5G research covering simulation and test.

We design our instruments to be future-proof, making it easier for you to evolve with changing technologies and stay on the leading edge. You can carry your investment forward with consistent measurement science that spans research and development today and extends to manufacturing and deployment in the future.

Our engineers, experts in design and test, are available to advise, assist and augment your teams all around the world. Our expertise is also readily available through white papers, application notes and webcasts for 5G, Cellular, MIMO and WLAN Test.


 

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Create a Curve Tracer with BenchVue Webcast 
Live broadcast August 18, 2016; 10am PT / 1pm ET

Webcast

 
Temperature-Dependent Characterization for Device R&D Webcast 
Recorded broadcast April 22, 2016

Webcast - recorded

 
Keysight's live webcasts 
Stay up to date by bookmarking this page to see the latest information on Keysight's webcasts.

Webcast

 
Fundamentals of Materials Measurement and Characterization Webcast 
Original broadcast January 20, 2016

Webcast - recorded

 
Visualize, Analyze, Optimize: Battery Charge and Run Time Testing Webcast 
Original broadcast October 13, 2015

Webcast - recorded

 
Fundamentals of Wavelength Dependent Optical Component Testing Webcast 
Original broadcast September 29, 2015

Webcast - recorded

 
Optimize Wireless Device Battery Run-time: Two Part Webcast Series 
Original roadcasts Aug 22 & Sept 19, 2012

Webcast - recorded

 
European Conference on Synthetic Aperture Radar 2012 
Visit Agilent Technologies at the European Conference on Synthetic Aperture Radar: the world's leading international conference dedicated to SAR techniques, technology, and applications.

Tradeshow

 
Innovations in EDA Webcast: Measurement-based FET modeling using Artificial Neural Networks (ANNs) 
Original broadcast Feb 2, 2012

Webcast - recorded

 
Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro 
Originally broadcast Jan 27, 2011

Webcast - recorded

 
Setting Up IC-CAP WaferPro For On-Wafer Measurements 
Original broadcast June 22, 2011

Webcast - recorded

 
Optimize UE Design for Greater Battery Run-Time 
Original broadcast April 26, 2012

Webcast - recorded

 
DC Power supply fundamentals to get the most out of your applications 
With modern performance and safety features in power supplies, the flexibility exists to create test setups that are simpler and more effective. This web seminar covers 10 fundamentals about your power supply to take advantage of these features.

Webcast - recorded

 
Semiconductor Parametric Test: Back to Basics Part 2 
The "Back to Basics Part 2" seminar provides practical tips and techniques on making fast pulse IV measurements and practical capacitance measurement considerations.

Webcast - recorded

 
Optimise UE design for greater battery run-time 
This web seminar will discuss the challenges of verifying battery consumption during different UE operating modes and the tools available to measure the effects in power consumption.

Webcast - recorded

 
Modern Remote and Wireless Test Setup and Considerations 
This seminar describes remote/wireless test setups and configurations with LXI compliant instruments with low cost, off the shelf network products. We review local and long distance wireless test, security hurdles and using smart devices and clouds.

Webcast - recorded

 
Small signal, low level, DC Parametric measurements: Back to Basics Part 1 
The "Back to Basics Part 1" seminar provides practical tips and techniques on making low level DC Parametric measurements.

Webcast - recorded

 
Simulating Power Transients and Noise 
Original broadcast Jun 21, 2012

Webcast - recorded

 
Fundamentals of Fast Pulsed IV Measurement Webcast 
Original broadcast January 9, 2014

Webcast - recorded

 
Wide Bandgap (GaN & SiC) Power Semiconductor Device Measurements 
Learn how to make real time IV measurements on Power Devices at upto 1.5kA and upto 10kV. The Webcast also includes GaN current collapse measurements which are essential for device development and manufacturing process optimisation.

Webcast

 
Measuring Complex Materials and their Components Seminar 2013 
Keysight will provide a FREE all day seminar including impedance measurements fundamentals, characterizing complex materials, measuring material properties in nano-scale resolutionand discuss emerging novel materials research-challenges and solutions.

Seminar

 
1500A & 10kV Device Measurement Solutions for Advanced Semiconductor Power Devices. 
New Power Device Measurement Solutions (1500 A / 10 kV) for advanced Semiconductor Power Devices.

Webcast - recorded

 
1500A & 10kV Device Measurement Solutions for Advanced Semiconductor Power Devices 
New Power Device Measurement Solutions (1500 A / 10 kV) for advanced Semiconductor Power Devices.

Webcast