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Cellular

Keysight Technologies, the world’s premier measurement company, offers a full range of design, test, and management solutions that span the range of cellular technologies—from legacy 1G systems through 3G systems such as HSPA to 3GPP Long Term Evolution (LTE) and 1xEV-DO. Keysight products cover the lifecycle from early design and development, through volume manufacturing, to network deployment and service assurance. See the Quick Guide to Keysight’s Solutions for High-Speed Cellular for an overview of all technologies and supporting product families. To learn more about related technologies consult MIMO Test and Wireless Connectivity. Accelerate Wireless Design and Test with Flexible, High-Performance Platforms

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Evénements Keysight en France 
Bienvenue sur la page des événements auxquels participe Keysight en France

Seminar

 
1500A & 10kV Device Measurement Solutions for Advanced Semiconductor Power Devices 
New Power Device Measurement Solutions (1500 A / 10 kV) for advanced Semiconductor Power Devices.

Webcast

 
1500A & 10kV Device Measurement Solutions for Advanced Semiconductor Power Devices. 
New Power Device Measurement Solutions (1500 A / 10 kV) for advanced Semiconductor Power Devices.

Webcast - recorded

 
Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro 
Originally broadcast Jan 27, 2011

Webcast - recorded

 
Conquering the High Power Source-Sink Test Challenge Webcast 
Original broadcast June 18, 2014

Webcast - recorded

 
DC Power supply fundamentals to get the most out of your applications 
With modern performance and safety features in power supplies, the flexibility exists to create test setups that are simpler and more effective. This web seminar covers 10 fundamentals about your power supply to take advantage of these features.

Webcast - recorded

 
Electronic Measurement Events in Europe, Middle East & Africa 
Electronic Measurement events in Europe, the Middle East, and Africa - seminars, trade shows, user group meetings, webcasts, tutorials and conferences.

Seminar

 
European Conference on Synthetic Aperture Radar 2012 
Visit Agilent Technologies at the European Conference on Synthetic Aperture Radar: the world's leading international conference dedicated to SAR techniques, technology, and applications.

Tradeshow

 
Fundamentals of Fast Pulsed IV Measurement Webcast 
Original broadcast January 9, 2014

Webcast - recorded

 
Innovations in EDA Webcast: Measurement-based FET modeling using Artificial Neural Networks (ANNs) 
Original broadcast Feb 2, 2012

Webcast - recorded

 
Keysight's live webcasts 
Stay up to date by bookmarking this page to see the latest information on Keysight's webcasts.

Webcast

 
Measuring Complex Materials and their Components Seminar 2013 
Keysight will provide a FREE all day seminar including impedance measurements fundamentals, characterizing complex materials, measuring material properties in nano-scale resolutionand discuss emerging novel materials research-challenges and solutions.

Seminar

 
Modern Remote and Wireless Test Setup and Considerations 
This seminar describes remote/wireless test setups and configurations with LXI compliant instruments with low cost, off the shelf network products. We review local and long distance wireless test, security hurdles and using smart devices and clouds.

Webcast - recorded

 
New Techniques and Methods to Evaluate Power Device Switching Loss Webcast 
Live broadcast Ocotber 14, 2014; 10am PT / 1pm ET

Webcast

 
Optimise UE design for greater battery run-time 
This web seminar will discuss the challenges of verifying battery consumption during different UE operating modes and the tools available to measure the effects in power consumption.

Webcast - recorded

 
Optimize UE Design for Greater Battery Run-Time 
Original broadcast April 26, 2012

Webcast - recorded

 
Optimize Wireless Device Battery Run-time: Two Part Webcast Series 
Original roadcasts Aug 22 & Sept 19, 2012

Webcast - recorded

 
Semiconductor Parametric Test: Back to Basics Part 2 
The "Back to Basics Part 2" seminar provides practical tips and techniques on making fast pulse IV measurements and practical capacitance measurement considerations.

Webcast - recorded

 
Setting Up IC-CAP WaferPro For On-Wafer Measurements 
Original broadcast June 22, 2011

Webcast - recorded

 
Simulating Power Transients and Noise 
Original broadcast Jun 21, 2012

Webcast - recorded

 
Small signal, low level, DC Parametric measurements: Back to Basics Part 1 
The "Back to Basics Part 1" seminar provides practical tips and techniques on making low level DC Parametric measurements.

Webcast - recorded

 
Wide Bandgap (GaN & SiC) Power Semiconductor Device Measurements 
Learn how to make real time IV measurements on Power Devices at upto 1.5kA and upto 10kV. The Webcast also includes GaN current collapse measurements which are essential for device development and manufacturing process optimisation.

Webcast