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Cellular

Insight. It comes upon you in a flash. And you know at once you have something special. At Keysight Technologies, the foundation is our unique mix of hardware, software and people. You can count on test equipment and design software that is built on more than 75 years of leadership in measurement science.

The continuing innovation across new and existing cellular technologies present challenges in designing and testing of mobile networks and devices. As the world’s leading electronic measurement company, Keysight technologies continues to be at the forefront offering full portfolio of cellular test and design solutions that span the entire lifecycle – from simulation to R&D, design verification and pre-conformance, conformance, manufacturing, through network deployment and service assurance.

We know what it takes for your designs to meet the latest cellular standards. As an active member of 3GPP and other most influential wireless standards bodies and leading 5G forums and consortia, we have been at the forefront of providing standard-compliant cellular test and design tools from the legacy 1G through latest 4G technologies, and maintain our leadership position by providing the largest array of design and test solutions for 5G research covering simulation and test.

We design our instruments to be future-proof, making it easier for you to evolve with changing technologies and stay on the leading edge. You can carry your investment forward with consistent measurement science that spans research and development today and extends to manufacturing and deployment in the future.

Our engineers, experts in design and test, are available to advise, assist and augment your teams all around the world. Our expertise is also readily available through white papers, application notes and webcasts for 5G, Cellular, MIMO and WLAN Test.

Keysight RF and Digital Learning Center - A commitment to learning with industry experts


 

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Medalist i3070 Test Throughput Optimization - Application Note 
This application note explores some factors which cause test time to increase on the Medalist i3070 In-Circuit Test system, and methods which users can employ to reduce the test time and increase throughput on the Medalist i3070 ICT system.

Application Note 2017-06-16

AFM study of Structural Organization of Liquid Crystalline Oligomer - Application Note 
Studies of liquid crystalline oligomer at different temperatures and in vapors of organic solvents using Keysight 9500 AFM.

Application Note 2017-06-15

PDF PDF 3.96 MB
Calibration Techniques for Improved MIMO and Beamsteering Characterization - White Paper 
This white paper focuses on calibration methods required for a multi-channel test-receiver to effectively characterize and visualize the MIMO and beamforming performance of comms transmitter designs.

Application Note 2017-06-13

PDF PDF 1.73 MB
Atomic Force Microscopy Studies of Materials in Different Vapor Environments - Application Note 
Visualization of surface structures and examination of properties of polymers by Keysight 9500 AFM in various humidity and in vapors of different organic solvents.

Application Note 2017-06-12

PDF PDF 8.01 MB
Make Better AC RMS Measurements with Your Digital Multimeter - Application Note  
learn about the complexity of ac rms measurements and how to deal with them

Application Note 2017-06-12

Resistance Measurements Using the B2900A Series of SMUs - Application Note 
The Keysight B2900A Series Precision SMU enables you to accurately and easily measure the resistance with a variety of features to address the issues on resistance measurements.

Application Note 2017-06-05

Critical Test Parameters of NB-IoT, Test Challenges and Keysight Solution - Application Note 
This application note describes some of the most relevant features of NB-IoT, which make it a strong candidate among the different Low Power Wide Area Network (LPWAN) options through use of Internet of Things.

Application Note 2017-06-05

PDF PDF 1.98 MB
Narrowband IoT (NB-IoT): Cellular Technology for the Hyperconnected IoT - Application Note 
This paper explains the underlying reasons why this technology is shaped as it is today and explore the challenges in adopting this new application and explains the new ways of securely roll out NB-IoT application quickly to market.

Application Note 2017-05-31

PDF PDF 1.34 MB
Accelerate Your PXI Test Development and Test System Speed - Application Note 
Accelerate Your PXI Test Development and Test System Speed - Application Note

Application Note 2017-05-25

U2000 and U8480 Series USB sensor measurement uncertainty calculator 
Measurement Uncertainty Calculator for the U2000 series USB sensors (U2000A, U2001A, U2002A, U2004A, U2000B, U2000H, U2001B, U2001H, U2002H) and U8480 series USB sensors (U8481A, U8485A, U8487A, U8488A)

Application Note 2017-05-25

XLS XLS 100 KB
Essential Components of Data Acquisition Systems (AN 1386) 
To help you choose a system that meets your needs, this article gives an overview of the components that make up the typical data acquisition system and examines some of the advantages and disadvantages of the different component types and configurations.

Application Note 2017-05-22

BenchVue Software as an Educational Tool - Application Note 
Discover how BenchVue software is a powerful tool for instructional laboratories, as well as for instructors.

Application Note 2017-05-19

Methods for Characterizing and Tuning DC Inrush Current - Application Brief 
This application brief describes how a modern high-performance power supply with features such as measurement digitizers, fast adjustment turn-on voltage rates and advanced triggers make an ideal tool.

Application Note 2017-05-19

Using BenchVue Software’s Test Flow Application to Characterize Transistors - Application Note 
This application note shows how to make a simple transistor curve tracer using a Keysight B2962A power source along with a Test Flow sequence running in Keysight’s BenchVue software.

Application Note 2017-05-16

Achieve Accurate Resistance Measurements with the Keysight 34980A Multifunction Switch Measure Unit 
This application note provides an overview of how to make an accurate 2-wire, 3-wire and 4-wire resistance measurements with the Keysight 34980A

Application Note 2017-05-16

Noise and Noise Figure: Improving and Simplifying Measurements - Application Brief 
Noise is present in every electronic circuit. Noise disturbances can limit the overall performance of a wireless system, making noise measurements fundamental for all transmitter/receiver components.

Application Note 2017-05-16

PDF PDF 1021 KB
Three Hints for Better Noise Figure Measurements - Application Brief 
This brief provides 3 hints that will help you improve measurement uncertainty, increase yield, and lower your costs when measuring noise figure performance on your device.

Application Note 2017-05-16

Achieving Metrology-grade Results in Vector Network Analysis at Millimeter-wave Frequencies  
Millimeter-wave expertise and new solution for design, simulation, test and analysis in millimeter wave frequencies.

Application Note 2017-05-12

How to Run LabVIEW Programs with Keysight PXI Instruments - Application Note 
This application note demonstrates how to easily use Keysight’s PXI instruments in a LabVIEW program environment.

Application Note 2017-05-05

PDF PDF 2.18 MB
How to Characterize a DC-DC Converter Using a DAQ and BenchVue Software - Application Note 
This application note provides an easy, step-by-step approach for measuring and plotting several characteristics of a DC-DC converter using Keysight’s 34970A/72A DAQs with BenchVue software.

Application Note 2017-05-04

Easily Test DC-DC Converters Using the Keysight DC Power Analyzer - Application Note 
This application note explains how to easily carry out DC-DC converter testing using the N6705C DC Power Analyzer and MSOX2/3/4000 Series Oscilloscope and BenchVue software.

Application Note 2017-05-02

PDF PDF 1.03 MB
Decoding NFC-F Communication Based on Manchester-encoded ASK Modulation - Application Note 
See step-by-step instructions on how to setup oscilloscopes to properly decode and trigger on NFC-F poller and listener communication for two specific cases.

Application Note 2017-04-28

PDF PDF 2.27 MB
Basic Oscilloscope Fundamentals - Application Note 
This application note provides an overview of basic oscilloscope fundamentals. You will learn what an oscilloscope is and how to use oscilloscopes.

Application Note 2017-04-25

Eliminate Risk with Proper Calibration - Application Note 

Application Note 2017-04-24

PDF PDF 429 KB
Piezoresponse Force Microscopy using Keysight 9500 AFM - Application Note 
PFM has become recognized as a key tool in advancing the research and development of applications based on piezoelectric materials in general. This note shows the capabilities of the 9500 AFM

Application Note 2017-04-18

PDF PDF 1.80 MB

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