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Insight. It comes upon you in a flash. And you know at once you have something special. At Keysight Technologies, the foundation is our unique mix of hardware, software and people. You can count on test equipment and design software that is built on more than 75 years of leadership in measurement science.

The continuing innovation across new and existing cellular technologies present challenges in designing and testing of mobile networks and devices. As the world’s leading electronic measurement company, Keysight technologies continues to be at the forefront offering full portfolio of cellular test and design solutions that span the entire lifecycle – from simulation to R&D, design verification and pre-conformance, conformance, manufacturing, through network deployment and service assurance.

We know what it takes for your designs to meet the latest cellular standards. As an active member of 3GPP and other most influential wireless standards bodies and leading 5G forums and consortia, we have been at the forefront of providing standard-compliant cellular test and design tools from the legacy 1G through latest 4G technologies, and maintain our leadership position by providing the largest array of design and test solutions for 5G research covering simulation and test.

We design our instruments to be future-proof, making it easier for you to evolve with changing technologies and stay on the leading edge. You can carry your investment forward with consistent measurement science that spans research and development today and extends to manufacturing and deployment in the future.

Our engineers, experts in design and test, are available to advise, assist and augment your teams all around the world. Our expertise is also readily available through white papers, application notes and webcasts for 5G, Cellular, MIMO and WLAN Test.

Keysight RF and Digital Learning Center - A commitment to learning with industry experts


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Increase Power Amplifier Test Throughput with the Keysight PXIe Vector Signal Analyzer and Generator  
This application note overview provides an overview of the challenges and recommended solutions to increase the speed of power amplifier test.

Application Note 2015-09-27

Testing Voice Over LTE (VoLTE) Phones - Application Note 
This application note explains a solution for testing voice over LTE (VoLTE) phones that is well-suited for LTE mobile phone developers, test engineers, and test lab personnel.

Application Note 2015-09-14

Correlating Microwave Measurements between Handheld and Benchtop Analyzers - Application Note 
This application note discusses the powerful capabilities of modern-day handheld analyzers and includes measurement comparisons between FieldFox handheld analyzers and several benchtop instruments.

Application Note 2015-08-27

Techniques for Precise Measurement Calibrations in the Field - Application Note 
This application note discusses recent advances in VNA calibration and compares measurements made on a FieldFox analyzer using different calibration types for a variety of RF and microwave devices.

Application Note 2015-05-22

Techniques for Precise Cable and Antenna Measurements in the Field - Application Note 
This app note introduces measurement and calibration techniques for cable and antenna testing using FieldFox handheld analyzers.

Application Note 2015-05-15

Techniques for Precise Interference Measurements in the Field - Application Note 
This app note discusses the different types of interference in current and new systems and methods to measure a variety of interference types using spectrum analyzers such the FieldFox Series.

Application Note 2015-03-30

Speed Time to Market with Consistent Measurements from R&D Through Manufacturing - Application Note 
This white paper describes the benefits of having a choice of bench top or modular instruments that are supported by common software applications.

Application Note 2014-11-17

Solutions for LTE-Advanced Manufacturing Test - Application Note 
This “Solutions for LTE-Advanced Manufacturing Test” application note gives insight into how to better understand the requirements for LTE-Advanced Carrier Aggregation manufacturing test.

Application Note 2014-08-04

Solutions and Measurement Tools for Use in Average Power and Envelope Tracking Design - Application  
This app note provides an outline of the techniques involved and the solutions Agilent provides for RF, baseband and system developers.

Application Note 2014-08-02

Measuring the Burst Time-Gated Power Signal of Wireless Technologies Using Keysight Power Sensors 
Measuring pulse, burst, or modulated signals for wireless technologies such as TDMA, GSM, WLAN, WiMAX, and LTE is very important because it is part of functionality testing and power amplifier module verification during the manufacturing process.

Application Note 2013-07-08

EXT Wireless Communications Test Set Non-signaling Test Overview 
This application note explains how non-signaling test methods make it possible for manufacturers to reduce both test times and test equipment costs across a range of wireless technologies

Application Note 2012-08-01

Interference Testing with Handheld Spectrum Analyzers - Application Note 
This application note describes the techniques and procedures for interference testing in a wireless environment using the Keysight family of N934xC/N9340B handheld spectrum analyzers.

Application Note 2011-10-11

Testing Handovers Between LTE and 3G cdma2000/1xEV-DO Cellular Networks - Application Note 
This application note explains test handovers between LTE and third generation cdma2000/1xEV-DO cellular networks as well as network evolution.

Application Note 2011-06-15

PXT Wireless Communications Test Set (E6621A) - Application Note 
This application note provides you with the basic steps to making data throughput measurements with your E6621A PXT.

Application Note 2011-02-04

LTE-Advanced Signal Generation and Measurement Using SystemVue - Application Note 
This application note introduces changes in Release 10 of the 3GPP specification for LTE-Advanced, a new generation of the LTE standard that promises dramatic improvements in throughput.

Application Note 2010-12-23

Solutions for MIMO RF Test and Debug 
Ensuring Quick and Accurate Four-Channel, Phase-Coherent MIMO Measurements

Application Note 2010-07-14

E-UTRA Base Station Transmit ON/OFF Power Measurement  
This application note describes the LTE TDD E-UTRA base station transmit ON/OFF power measurement-also known as the power-versus-time measurement- as provided in the N9082A LTE TDD measurement app.

Application Note 2010-06-22

Solutions for Testing LTE FDD and TDD Performance  
Ensuring Simpler, More Cost-Effective Conformance Testing of LTE Base Stations

Application Note 2010-05-17

Solutions for Memory Effects in Microwave Components 
This "Solutions for Memory Effects in Microwave Components" app note explains how to use X-Parameters to characterize and model long-term memory effects of wideband modulated signals.

Application Note 2010-05-13

Stimulus-Response Testing for LTE Components - Application Note 
This note focuses on the 3GPP LTE specifications that present some new challenges for manufacturers of components and equipment for LTE systems.

Application Note 2010-05-03

Solutions for Characterizing Complex and Multi-Stage Circuits 
This app note combines X-parameters with load-pull measurements to characterize load-dependent device behavior included in a large signal model for analysis of complex PA circuits.

Application Note 2010-04-07

Solutions for Characterizing High-Power Devices—Using X-parameters to Make Nonlinear Measurements of 
This “Solutions for…” app note discusses X-parameters used to properly characterize and understand the behavior of high power amplifiers, as engineers push them to their limit, into nonlinear operation.

Application Note 2010-03-04

MIMO Channel Modeling and Emulation Test Challenges Application Note 

Application Note 2010-01-22

Measuring ACLR Performance in LTE Transmitters - Application Note 
This note focuses on the adjacent channel leakage-power ratio (ACLR) test, a vital one for LTE.

Application Note 2010-01-07

Understanding X-parameter Nonlinear Measurements 
This “Solutions for Securing Successful First-Pass Component Design“ application brief discusses the basics of X-Parameters and non-linear measurements using the PNA-X and ADS software.

Application Note 2010-01-06

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