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Insight. It comes upon you in a flash. And you know at once you have something special. At Keysight Technologies, the foundation is our unique mix of hardware, software and people. You can count on test equipment and design software that is built on more than 75 years of leadership in measurement science.

The continuing innovation across new and existing cellular technologies present challenges in designing and testing of mobile networks and devices. As the world’s leading electronic measurement company, Keysight technologies continues to be at the forefront offering full portfolio of cellular test and design solutions that span the entire lifecycle – from simulation to R&D, design verification and pre-conformance, conformance, manufacturing, through network deployment and service assurance.

We know what it takes for your designs to meet the latest cellular standards. As an active member of 3GPP and other most influential wireless standards bodies and leading 5G forums and consortia, we have been at the forefront of providing standard-compliant cellular test and design tools from the legacy 1G through latest 4G technologies, and maintain our leadership position by providing the largest array of design and test solutions for 5G research covering simulation and test.

We design our instruments to be future-proof, making it easier for you to evolve with changing technologies and stay on the leading edge. You can carry your investment forward with consistent measurement science that spans research and development today and extends to manufacturing and deployment in the future.

Our engineers, experts in design and test, are available to advise, assist and augment your teams all around the world. Our expertise is also readily available through white papers, application notes and webcasts for 5G, Cellular, MIMO and WLAN Test.


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Transient Optical Power Measurements with the N774x-Series Multiport Power Meter - Application Note 
This note describes the details for making time-dependent measurements of optical power levels, for applications like testing transients and determining switching times.

Application Note 2016-08-31

Wavelength and Polarization Dependence of 100G-LR4 Components - Application Note 
This application note describes our solution based on the new 81606A or 81608A tunable lasers, for measuring the wavelength and polarization dependence of components for 100G optical links that multiplex multiple wavelengths. Both passive fiber optic components and receiver optical subassemblies are addressed.

Application Note 2016-05-24

How to Test USB Type-C Alt Mode and the Standards Running Across It - Application Note 
This application note discusses how Alt mode works with power delivery circuitry to transmit/receive unique data signals/more power, so Type-C can be used for many USB & non-USB, device connections/control.

Application Note 2016-04-29

Signal Integrity Analysis Series Part 1: Single-Port TDR, TDR/TDT, and 2-Port TDR - Application Note 
This Application Note focuses on part 1: those which use a single-port TDR, those which use TDR/TDT, and those which use 2-port TDR.

Application Note 2015-10-29

Download application notes on optical communication test 
Get application notes on the latest developments in coherent test signal generation and analysis.

Application Note 2015-10-27

Programming Keysight Technologies Continuous-Sweep Tunable Lasers - Application Note 
This is a new Application Note for Programming Keysight Continuous-Sweep Tunable Lasers

Application Note 2015-10-19

Switching Solutions for Multi-Lane BERT Testing - Application Note 
This application note addresses the use of switching solutions, degradations that might be encountered, and the methods to overcome them.

Application Note 2015-10-07

Understanding the Right Metrics to use when Evaluating Oscilloscope Quality - Application Note 
For scopes with bandwidth in the GHz range, a quality metric involves characterizing the analog-to-digital converter (ADC) using effective number of bits (ENOB). How important is ENOB?

Application Note 2015-08-26

Forward Clocking - Receiver (RX) Jitter Tolerance Test with J-BERT N4903B High-P - Application Note 
This document describes the requirements for forward clocking topology RX Jitter tolerance testing.

Application Note 2015-04-24

De-Emphasis Application Note 
The N4916A de-emphasis signal converter, an industry-first, enables engineers to accurately characterize multi-gigabit serial receivers and channels that operate with de-emphasized signals.

Application Note 2015-04-08

Time Domain Reflectometry Theory - Application Note 
When compared to other measurement techniques, time domain reflectometry provides a more intuitive and direct look at the DUT's characteristics.

Application Note 2015-01-30

Evaluating Oscilloscope Bandwidths for Your Application - Application Note 
How much bandwidth does your oscilloscope really need? Learn how to choose the correct bandwidth oscilloscope for your application.

Application Note 2014-12-19

Evaluating Oscilloscope Fundamentals - Application Note 
We will discuss oscilloscope applications and give you an overview of basic measurements and performance characteristics.

Application Note 2014-12-17

Evaluating Oscilloscope Sample Rates vs. Sampling Fidelity - Application Note 
Make the most accurate digital measurements by learning how to evaluate oscilloscope sample rates vs. signal fidelity.

Application Note 2014-12-16

Download latest M8195A AWG application notes 
Get app notes for digital multilevel signalizing techniques and high-speed coherent optical

Application Note 2014-09-22

High Speed Lightwave Component Analysis - Application Note 
The principles and methods are described for measuring the frequency dependence of fiberoptic transponders that convert electrical signals to optical signals and optical to electrical.

Application Note 2014-08-04

Using Microwave Switches When Testing High Speed Serial Digital Interfaces 
Many high speed digital interfaces use multiple lanes to achieve their system's throughput requirements. Most issues associated with this can be resolved with a switching network.

Application Note 2014-08-03

USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note 
This Application Note discusses the solution for the USB 2.0 test suite. The Keysight solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.

Application Note 2014-08-03

Bandwidth and Rise Time Requirements for Making Accurate Oscilloscope Measurements 
How much oscilloscope bandwidth do you need and how fast does the rise time need to be to measure your signals accurately?

Application Note 2014-08-02

SATA II Drive TX/RX Testing & Cable SI Testing Using the 86100C DCA-J - Technical Overview 
SATA II Drive Tx/Rx Testing & Cable SI Test using 86100C DCA-J. Product Note 86100-8

Application Note 2014-08-02

All-states measurement method for PDL and PER with a synchronous polarization scrambler 
This synchronized all-states PDL method using the Keysight N7785B synchronous scrambler shortens total measurement time and removal of the polarization dependence of the setup from PDL and PER results.

Application Note 2014-08-02

An Overview of the Electrical Validation of 10BASE-T, 100BASE-TX, and 1000BASE-T - Application Note 
The technology used in these ports, commonly known as “LAN” or “NIC” ports, is usually one of the 10BASE-T, 100BASE-TX, and 1000BASE-T standards or a combination of them.

Application Note 2014-08-01

Measuring Polarization Dependent Loss of Passive Optical Components - Application Note 
A new document on the methods of characterizing passive optical components.

Application Note 2014-07-31

Digital Modulation in Communications Systems - Application Note 
This application note introduces the concepts of digital modulation used in many communications systems today.

Application Note 2014-07-31

Measuring the Dependence of Optical Amplifiers on Input Power Using an Attenuator 
This application note describes the important optical amplifier properties of gain and noise figures and their dependence on the powers and wavelengths of the input signals.

Application Note 2014-07-31


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