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Long Term Evolution - LTE Test

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Accelerate Wireless Design and Test with Flexible, High-Performance Platforms

Keysight gives you “greater insight” into your Long Term Evolution (LTE) designs and LTE Test. We provide reduced design uncertainty, faster and easier development of high-performing LTE products and help you find root causes faster. Now with first-to-market test solutions for LTE-Advanced.

To learn more about LTE technology : LTE Technology Overview

To learn more about the LTE implementation of MIMO: MIMO Test

Receive App Notes, CD's and other resources : Long Term Evolution - LTE Resources

To find the product that fits your stage of Long Term Evolution (LTE) development see links to the left.

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RF Power Amplifier Test Reference - Solution Brochure 
This brochure describes the hardware, software and services components of the RF PA/FEM characterization & test, Reference Solution

Catálogo 2014-09-15

PDF PDF 2.48 MB
RF PA/FEM Characterization & Test, Reference Solution - Configuration Guide 
This configuration guide provides the hardware, software and services options for the RF PA/FEM characterization & test, Reference Solution.

Guía de configuración 2014-09-09

PDF PDF 7.51 MB
N9080A/W9080A LTE FDD & N9082A/W9082A LTE TDD X-Series Application - Technical Overview 
An overview of the LTE FDD/TDD (N/W9080A & N/W9082A) X-Series measurement applications.

Descripción técnica 2014-08-29

UXM Wireless Test Set Accelerates Marvell's LTE-Advanced Category 7 Chipset Development 
UXM Wireless Test Set Accelerates Marvell's LTE-Advanced Category 7 Chipset Development

Documentación de prensa 2014-08-04

 
EXM Wireless Test Set - Flyer  
The EXM wireless test set is scalable to meet your production needs. It delivers the speed, accuracy and port density you need to ramp up rapidly and optimize full-volume manufacturing.

Catálogo 2014-08-03

PDF PDF 1.15 MB
E7515A UXM Wireless Test Set - Flyer 
The UXM is a highly integrated signaling test set created for functional & RF design validation in the 4G era & beyond. It delivers LTE-A cat 6 now & will handle increasingly complex cases later.

Catálogo 2014-07-31

PDF PDF 856 KB
E6640A EXM Wireless Test Set - Configuration Guide  
This configuration guide explains how to order or upgrade the E6640A EXM wireless test set, enabling you to scale the test solution to ramp up rapidly and optimize full-volume manufacturing.

Guía de configuración 2014-06-25

89600 WLA Software - Technical Overview 
The 89600 WLA software provides wireless link analysis that decodes higher layer control messages and correlates them with the PHY-layer signals they manage.

Descripción técnica 2014-05-15

LTE & LTE-Advanced FDD & TDD Modulation Analysis 89600 VSA Software - Technical Overview 
The 89600 VSA software has the capability to analyze LTE-Advanced as well as LTE signals in both FDD and TDD formats.

Descripción técnica 2014-05-14

Increase Power Amplifier Test Throughput with the Keysight PXIe Vector Signal Analyzer and Generator  
This application note overview provides an overview of the challenges and recommended solutions to increase the speed of power amplifier test.

Nota de aplicación 2014-04-30

LTE-Advanced Carrier Aggregation for High-Speed IP Data Throughput  
LTE-A Carrier Aggregation is rapidly emerging as the technology that will bring about a significant improvement in the user experience by delivering a much higher level of data throughput performance.

Demostración básica 2014-04-10

 
M9381A & M9391A PXIe Vector Signal Generator - Configuration Guide 
This document provides information for configuring solutions for RF test based on the M9391A PXIe VSA and M9381A PXIe VSG.

Guía de configuración 2014-04-03

PDF PDF 1.25 MB
M9380A PXIe CW Source - Configuration Guide 
This configuration guide provides instructions to help you configure the M9380A PXIe CW Source and expand the system to meet your requirements. Product upgrades, related products and physical connection schematics are also featured.

Guía de configuración 2014-03-20

PDF PDF 3.23 MB
Accelerate PXI VSA Measurements with X-Series Measurement Applications for Modular Instrument 
This brochure describes the modular X-Series measurement applications which increase the efficiency and capability of the PXI VSA for specific communications standards

Catálogo 2014-03-06

PDF PDF 1.31 MB
Agilent’s UXM Wireless Test Set Enables New Insights into LTE-Advanced Category 6 Chipsets, Devices 
Agilent’s UXM Wireless Test Set Enables New Insights into LTE-Advanced Category 6 Chipsets, Devices

Documentación de prensa 2014-02-13

 
Agilent’s EXM Wireless Test Set Ready for Volume Production of LTE-A, 802.11ac WLAN Devices 
Agilent Technologies today announced the E6640A EXM wireless test set, which offers breakthrough manufacturing-test scalability in technology coverage, performance and capacity to test up to 32 cellular and wireless-connectivity devices in parallel.

Documentación de prensa 2014-02-13

 
Greater Insight into LTE Design and Test 
This brochure discusses Keysight's leadership in LTE and presents our set of design and test solutions for LTE - from design simulation to signal generation and analysis through manufacturing and deployment.

Catálogo 2013-12-31

PDF PDF 2.11 MB
Solutions for LTE-Advanced Manufacturing Test - Application Note 
This “Solutions for LTE-Advanced Manufacturing Test” application note gives insight into how to better understand the requirements for LTE-Advanced Carrier Aggregation manufacturing test.

Nota de aplicación 2013-12-18

Modular for Wireless 
View these videos to learn more about for evolving Wireless test challenges; Keysight is ready to help by sharing its expertise in measurements, PXI modular instrumentation and test automation.

Demostración básica 2013-11-22

 
Correlating Microwave Measurements between Handheld and Benchtop Analyzers - Application Note 
This application note discusses the powerful capabilities of modern-day handheld analyzers and includes measurement comparisons between FieldFox handheld analyzers and several benchtop instruments.

Nota de aplicación 2013-11-17

 
T4010S LTE RF Conformance and DV Test System - Technical Overview 
The T4010S LTE RF test systems are automated solutions for conformance test and design verification of LTE UE. This document covers key benefits, features, technical specifications and ordering info.

Descripción técnica 2013-10-15

Solutions and Measurement Tools for Use in Average Power and Envelope Tracking Design - Application  
This app note provides an outline of the techniques involved and the solutions Keysight provides for RF, baseband and system developers.

Nota de aplicación 2013-08-05

Measuring the Burst Time-Gated Power Signal of Wireless Technologies Using Keysight Power Sensors 
Measuring pulse, burst, or modulated signals for wireless technologies such as TDMA, GSM, WLAN, WiMAX, and LTE is very important because it is part of functionality testing and power amplifier module verification during the manufacturing process.

Nota de aplicación 2013-07-08

Agilent Technologies announces industry-first capabilities for envelope tracking  
Agilent Technologies announced two software releases that support the design and verification of envelope tracking, a technique that improves the efficiency and linearity of power amplifiers used in mobile handsets

Documentación de prensa 2013-06-04

 
Agilent Technologies announces 160-MHz bandwidth and real-time capability for MXA signal analyzer 
Agilent Technologies announced significant enhancements to its midrange N9020A MXA X-Series signal analyzer. New options for 160-MHz analysis bandwidth and real-time spectrum analyzer (RTSA) capability address the challenges of measuring interference in the next generation of heterogeneous wireless networks.

Documentación de prensa 2013-06-04

 

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