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Long Term Evolution - LTE Test

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Accelerate Wireless Design and Test with Flexible, High-Performance Platforms

Keysight gives you “greater insight” into your Long Term Evolution (LTE) designs and LTE Test. We provide reduced design uncertainty, faster and easier development of high-performing LTE products and help you find root causes faster. Now with first-to-market test solutions for LTE-Advanced.

To learn more about LTE technology : LTE Technology Overview

To learn more about the LTE implementation of MIMO: MIMO Test

Receive App Notes, CD's and other resources : Long Term Evolution - LTE Resources

To find the product that fits your stage of Long Term Evolution (LTE) development see links to the left.

Explore YouTube Videos 

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Addressing Design and Test Challenges for the New LTE-Advanced Standard Webcast 
Original broadcast July 15, 2014

Webcast - recorded

 
Developing Measurement and Analysis Systems with Agilent Instruments Webcast 
Original broadcast December 4, 2013

Webcast - recorded

 
Developing Modular PXI and AXIe Tests for Measurement and Analysis Webcast 
Original broadcast June 12, 2014

Webcast - recorded

 
IEEE AutoTest 2014 Conference 
Sept 16-18, 2014; St. Louis, MO

Tradeshow

 
Innovations in EDA: High Performance Digital Pre-Distortion (DPD) for Wideband Systems 
Original broadcast Sept 1, 2011

Webcast - recorded

 
Keysight/MATLAB RF and and Digital Measurements Seminar 2014 
Various cities in 2014

Seminar

 
Learn to Make Power Amplifier Tests Faster! 
Original broadcast March 6, 2014

Webcast - recorded

 
Primer: A Day in the Life of your Cell Phone 
Original broadcast July 24, 2014

Webcast - recorded

 
RF Back to Basics Seminar - 2014 
Various cities in the US

Seminar

 
Successful Modulation Analysis in 3 Steps Webcast 
Original broadcast January 22, 2014

Webcast - recorded