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長期演進技術(LTE) - LTE 測試

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Agilent's UXM Wireless Test Set Accelerates Marvell's LTE-Advanced Category 7 Chipset Development 
Agilent and Marvell worked in concert to achieve sustained bidirectional 300 Mbps downlink/100 Mbps uplink data throughput using 3GPP release 10 downlink and uplink carrier aggregation.

新聞資料 2014-05-06

 
E6640A EXM Wireless Test Set Ready for Volume Production of LTE-A, 802.11ac WLAN Devices 
Agilent Technologies today announced the E6640A EXM wireless test set, which offers breakthrough manufacturing-test scalability in technology coverage, performance and capacity to test up to 32 cellular and wireless-connectivity devices in parallel.

新聞資料 2014-02-13

 
Agilent Technologies Announces Wireless Communications Test Set with Innovative Multiport Adapter 
Agilent Technologies introduced the E6607B EXT wireless communications test set and companion E6617A multiport adapter. Optimized for non-signaling testing, the EXT/MPA combination increases test throughput and reduces the cost of test in the manufacturing of current- and next-generation smartphones and tablets that contain multiformat and multiband technologies.

新聞資料 2012-08-01

 
Agilent Technologies Announces Test Software for Equipment Based on Altair TDD/FDD LTE Chipset 

新聞資料 2012-02-28