Long Term Evolution - LTE Test
LTE is still growing, adding subscribers around the world. The technology is evolving to LTE-Advanced and to LTE-Advanced Pro, adding measurement challenges at every step. Keysight is there to provide insight into your designs that optimize and integrate these technologies and to meet the latest standards. Our solutions reduced design uncertainty, provide faster and easier development of high-performing LTE products and help you find root causes faster. As an active member of 3GPP and other influential wireless standards bodies and leading 5G forums and consortia, we have been at the forefront of providing standard-compliant LTE test and design tools across the entire lifecycle– from simulation to R&D, design verification and pre-conformance, conformance, manufacturing, through network deployment and service assurance.
Our engineers, experts in design and test, are available to advise, assist and augment your teams all around the world. Our expertise is also readily available through white papers, application notes and webcasts for LTE, LTE-Advanced, MIMO, WLAN Test, and 5G.
To find the product that fits your stage of Long Term Evolution (LTE) development see links to the left.
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Agilent's UXM Wireless Test Set Accelerates Marvell's LTE-Advanced Category 7 Chipset Development
Agilent and Marvell worked in concert to achieve sustained bidirectional 300 Mbps downlink/100 Mbps uplink data throughput using 3GPP release 10 downlink and uplink carrier aggregation.
Press Materials 2014-05-06
E6640A EXM Wireless Test Set Ready for Volume Production of LTE-A, 802.11ac WLAN Devices
Agilent Technologies today announced the E6640A EXM wireless test set, which offers breakthrough manufacturing-test scalability in technology coverage, performance and capacity to test up to 32 cellular and wireless-connectivity devices in parallel.
Press Materials 2014-02-13
Agilent Technologies Announces Wireless Communications Test Set with Innovative Multiport Adapter
Agilent Technologies introduced the E6607B EXT wireless communications test set and companion E6617A multiport adapter. Optimized for non-signaling testing, the EXT/MPA combination increases test throughput and reduces the cost of test in the manufacturing of current- and next-generation smartphones and tablets that contain multiformat and multiband technologies.
Press Materials 2012-08-01
Agilent Technologies Announces Test Software for Equipment Based on Altair TDD/FDD LTE Chipset
Press Materials 2012-02-28