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Long Term Evolution - LTE Test

LTE is still growing, adding subscribers around the world. The technology is evolving to LTE-Advanced and to LTE-Advanced Pro, adding measurement challenges at every step. Keysight is there to provide insight into your designs that optimize and integrate these technologies and to meet the latest standards. Our solutions reduced design uncertainty, provide faster and easier development of high-performing LTE products and help you find root causes faster. As an active member of 3GPP and other influential wireless standards bodies and leading 5G forums and consortia, we have been at the forefront of providing standard-compliant LTE test and design tools across the entire lifecycle– from simulation to R&D, design verification and pre-conformance, conformance, manufacturing, through network deployment and service assurance.

Our engineers, experts in design and test, are available to advise, assist and augment your teams all around the world. Our expertise is also readily available through white papers, application notes and webcasts for LTE, LTE-Advanced, MIMO, WLAN Test, and 5G.

To find the product that fits your stage of Long Term Evolution (LTE) development see links to the left.

Learn about LTE and its measurements in the LTE book written by 42 LTE experts

Hardware - Software - People - LTE Insights


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Agilent’s UXM Wireless Test Set Enables New Insights into LTE-Advanced Category 6 Chipsets, Devices 
Introducing the E7515A UXM wireless test set, the most highly integrated signaling test set created for functional and RF design validation in the 4G era and beyond.

Dossier de presse 2014-02-13

Agilent Technologies and CATR (TMC) to Collaborate on TD-LTE MIMO  
Agilent Technologies Inc. (NYSE: A) announced a memorandum of understanding has been signed with the China Academy of Telecommunication Research (Telecommunication Metrology Center), or CATR (TMC). The two organizations have agreed to work together on TD-LTE MIMO over-the-air (OTA) test research.

Dossier de presse 2012-09-13

Agilent | Agilent Technologies and Innofidei Announce Joint Development of RF Tests for TD-LTE Chips 
The test development is based on the 3GPP LTE specifications, Innofidei’s TD-LTE test requirements, included Agilent’s N5182A signal generator and N9020A signal analyzer and followed the 3GPP LTE standard chapter 6 and 7 TX / RX characteristics.

Dossier de presse 2010-09-15

Agilent Technologies to Show Latest LTE Test Solutions at LTE Americas 2009 

Dossier de presse 2009-11-02

Agilent Technologies’ Test Solutions Support March 2009 LTE Standard 

Dossier de presse 2009-08-04

Agilent Technologies, ASTRI, PicoChip Demonstrate Design and Test of TD-LTE Femtocell at 2009 Mobile 

Dossier de presse 2009-02-16

Agilent Technologies Delivers Wide Range of Commercial Test Products for TD-LTE 

Dossier de presse 2009-02-16