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Long Term Evolution - LTE Test

LTE is still growing, adding subscribers around the world. The technology is evolving to LTE-Advanced and to LTE-Advanced Pro, adding measurement challenges at every step. Keysight is there to provide insight into your designs that optimize and integrate these technologies and to meet the latest standards. Our solutions reduced design uncertainty, provide faster and easier development of high-performing LTE products and help you find root causes faster. As an active member of 3GPP and other influential wireless standards bodies and leading 5G forums and consortia, we have been at the forefront of providing standard-compliant LTE test and design tools across the entire lifecycle– from simulation to R&D, design verification and pre-conformance, conformance, manufacturing, through network deployment and service assurance.

Our engineers, experts in design and test, are available to advise, assist and augment your teams all around the world. Our expertise is also readily available through white papers, application notes and webcasts for LTE, LTE-Advanced, MIMO, WLAN Test, and 5G.

To find the product that fits your stage of Long Term Evolution (LTE) development see links to the left.

Learn about LTE and its measurements in the LTE book written by 42 LTE experts

Hardware - Software - People - LTE Insights
 

  

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Testing Voice Over LTE (VoLTE) Phones - Application Note 
This application note explains a solution for testing voice over LTE (VoLTE) phones that is well-suited for LTE mobile phone developers, test engineers, and test lab personnel.

Application Note 2015-09-14

PDF PDF 4.46 MB
Speed Time to Market with Consistent Measurements from R&D Through Manufacturing - Application Note 
This white paper describes the benefits of having a choice of bench top or modular instruments that are supported by common software applications.

Application Note 2014-11-17

EXT Wireless Communications Test Set Non-signaling Test Overview 
This application note explains how non-signaling test methods make it possible for manufacturers to reduce both test times and test equipment costs across a range of wireless technologies

Application Note 2012-08-01

PDF PDF 290 KB
Testing Handovers Between LTE and 3G cdma2000/1xEV-DO Cellular Networks - Application Note 
This application note explains test handovers between LTE and third generation cdma2000/1xEV-DO cellular networks as well as network evolution.

Application Note 2011-06-15

LTE-Advanced Signal Generation and Measurement Using SystemVue - Application Note 
This application note introduces changes in Release 10 of the 3GPP specification for LTE-Advanced, a new generation of the LTE standard that promises dramatic improvements in throughput.

Application Note 2010-12-23

E-UTRA Base Station Transmit ON/OFF Power Measurement  
This application note describes the LTE TDD E-UTRA base station transmit ON/OFF power measurement-also known as the power-versus-time measurement- as provided in the N9082A LTE TDD measurement app.

Application Note 2010-06-22

Solutions for Memory Effects in Microwave Components 
This "Solutions for Memory Effects in Microwave Components" app note explains how to use X-Parameters to characterize and model long-term memory effects of wideband modulated signals.

Application Note 2010-05-13

Stimulus-Response Testing for LTE Components - Application Note 
This note focuses on the 3GPP LTE specifications that present some new challenges for manufacturers of components and equipment for LTE systems.

Application Note 2010-05-03

Solutions for Characterizing Complex and Multi-Stage Circuits 
This app note combines X-parameters with load-pull measurements to characterize load-dependent device behavior included in a large signal model for analysis of complex PA circuits.

Application Note 2010-04-07

Solutions for Characterizing High-Power Devices—Using X-parameters to Make Nonlinear Measurements of 
This “Solutions for…” app note discusses X-parameters used to properly characterize and understand the behavior of high power amplifiers, as engineers push them to their limit, into nonlinear operation.

Application Note 2010-03-04

PDF PDF 2.68 MB
Measuring ACLR Performance in LTE Transmitters - Application Note 
This note focuses on the adjacent channel leakage-power ratio (ACLR) test, a vital one for LTE.

Application Note 2010-01-07

Understanding X-parameter Nonlinear Measurements 
This “Solutions for Securing Successful First-Pass Component Design“ application brief discusses the basics of X-Parameters and non-linear measurements using the PNA-X and ADS software.

Application Note 2010-01-06

MIMO Performance and Condition Number in LTE Test - Application Note 
Topics include basic concepts of MIMO, how antenna and channel correlation affects system performance, recommendations for the best measurement tools to use when developing LTE products and systems.

Application Note 2009-10-06

MIMO in LTE Operation and Measurement-Excerpts on LTE Test - Application Note 
Focuses on MIMO radio operation and implementation as it applies to Long Term Evolution (LTE). MIMO (spatial multiplexing) is one of several multiple antenna techniques being implemented in LTE.

Application Note 2009-10-06

3GPP Long Term Evolution: System Overview, Product Development and Test Challenges -Application Note 
This application note focuses on LTE and includes content on system overview, product development and test challenges of this new wireless communications technology.

Application Note 2009-09-08