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Wireless Connectivity

Insight. It comes upon you in a flash. And you know at once you have something special. At Keysight Technologies, the foundation is our unique mix of hardware, software and people. You can count on test equipment and design software that is built on more than 75 years of leadership in measurement science. The continuing innovation across new and existing wireless technologies presents challenges in designing and testing of components, modules and devices that make our connected world possible. As the world’s leading electronic measurement company, Keysight continues to be at the forefront offering a full portfolio of test and design solutions that span the entire lifecycle – from simulation to R&D, design verification and pre-conformance, conformance, manufacturing, through network deployment and service assurance.

We know what it takes for your designs to meet the latest standards. As an active member of the wireless standards bodies that define the technologies, we have been at the forefront of providing standard-compliant wireless test and design tools across all the technologies from Bluetooth to 60 GHz 802.11ad. We design our instruments to be future-proof, making it easier for you to evolve with changing technologies and stay on the leading edge. You can carry your investment forward with consistent measurement science that spans research and development today and extends to manufacturing and deployment in the future. Our engineers, experts in design and test, are available to advise, assist and augment your teams all around the world. Our expertise is also readily available through white papers, application notes and webcasts for IoT, 5G, Cellular, MIMO and WLAN Test.

Keysight RF and Digital Learning Center - A commitment to learning with industry experts

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Characterization and Modeling Challenges for Advanced Semiconductor Technologies - Seminar Materials 
Seminar materials from the "Characterization and Modeling Challenges for Advanced Semiconductor Technologies" seminar.

Seminar Materials 2017-08-14

 
Electronic Measurement Events in Europe, Middle East, Africa & India 
Electronic Measurement events in Europe, the Middle East, Africa & India - seminars, trade shows, user group meetings, webcasts, tutorials and conferences.

Seminar

 
Join Keysight Technologies at MWC Americas 2017 
MWC Americas September 12-14, 2017; San Francisco, CA

Tradeshow

 
RADAR 2017 
23-26 October 2017, Belfast Waterfront Conference Centre

Tradeshow

 
What's New in Keysight Technologies' Device Modeling Portfolio 2017 
Highlights of new capabilities in Keysight's end-to-end device modeling portfolio, Power Electronics modeling solution preview, Wafer-level 1/f noise & Random Telegraph Noise (RTN) measurement solutions, Model Builder Program (MBP), and Model Quality Assurance (MQA).

Seminar Materials 2017-08-10

PDF PDF 3.19 MB
Python-driven Table Generation in Automated Device Model Validation 
MQA is a well-known, automated SPICE model validation software that enables engineers to check and analyze SPICE model libraries, compare different models, and generate quality assurance (QA) reports in a complete and efficient way. MQA 2017 extends these capabilities by introducing the Python Report Formatting System (PyRFS) module, which allows engineers to customize tables—either generate new tables or update existing tables—in .csv and .xlsx file formats.

Seminar Materials 2017-08-10

PDF PDF 2.41 MB
Automatable RTN Measurement Using the B1500A Semiconductor Parameter Analyzer 
As device lithographies have continued to shrink, understanding the impact of random telegraph noise (RTN) on integrated circuits has become increasingly important. Due to its innate random nature and dependence on applied voltage, characterizing RTN on a process requires many measurements to be made across a wafer at multiple gate-to-source biases. This section will cover the basics of RTN measurement and outline a cost-effective Keysight solution using WaferPro Express and the B1500A Semiconductor Device Analyzer.

Seminar Materials 2017-08-10

PDF PDF 2.41 MB
RF & Microwave Fundamentals Seminar 
28th September, Glasgow, RF & Microwave Seminar

Seminar

 
Static Random Access Memory (SRAM) Cell Modeling in MBP 2017 
The latest release Model Builder Program (MBP) 2017 now features a SRAM cell model generation package that’s designed to address the challenges of modern complex SRAM cell modeling, by enabling engineers to extract transistor-level and memory-cell models in one MBP session.

Seminar Materials 2017-08-10

PDF PDF 1.44 MB
How to Extract BSIM4 DC Model 
Model Builder Program(MBP) 2017 improves the model extraction process through the use of special utilities and scripting. This new, improved modeling process will be demonstrated on a BSIM4 transistor.

Seminar Materials 2017-08-10

PDF PDF 955 KB
The New Re-centering Solution in MBP 2017 Update 1 
A preview of the up-coming new re-centering function for re-centering an existing model to a new specification, with fully customizable device targets definition and scaling graph visualization.

Seminar Materials 2017-08-10

PDF PDF 1.39 MB
Be Prepared for Next Generation MIPI Physical Layer Design and Evaluation Webcast 
Live broadcast August 24, 2017; 10am PT / 1pm ET

Webcast

 
Keysight EEsof EDA Customer Education and Services 
Brief overview of Keysight EDA Customer Education and Services.

Training Materials 2017-08-08

 
RF and Microwave Measurement Insights 
Hotspots RF English

Seminar

 
Genesys Learning days in Germany 
Genesys Learning Week , Böblingen December 2016, learning days

Classroom Training

 
Keysight EEsof EDA Training Course Calendar EUROPE 
Scheduled Keysight EEsof courses for EMEAI

Classroom Training

 
HF/Mikro­wellen­-Messungen 
Hotspots RF German main event

Seminar

 
Join Keysight at EuMW 2017 
EuMW 2017 is coming soon

Seminar

 
Design and Simulation of 5G 28-GHz Phased Array Transceiver Webcast 
August 3, 2017

Webcast - recorded

 
Keysight eventos en España 
Bienvenido a la página de eventos organizados por Keysight en España.

Seminar

 
Les mesures de dispositifs pour l’Internet des objets (IoT) 
Hotspots IoT FRENCH Main Event

Seminar

 
Messungen an IoT-Produkten (Internet of Things) 
Hotspots IoT German Main Event

Seminar

 
Join Keysight at ECOC 2017 
Join Keysight at ECOC 2017

Seminar

 
IoT Devices Measurement Insights 
Hotspots IoT ENGLISH Main event

Seminar

 
Design and Simulation of 5G 28-GHz Phased Array Transceiver Slides 
Slides from the August 3, 2017 webcast

Seminar Materials 2017-08-03

PDF PDF 8.17 MB

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