Here’s the page we think you wanted. See search results instead:

 

Hable con un experto

Wireless Connectivity

Insight. It comes upon you in a flash. And you know at once you have something special. At Keysight Technologies, the foundation is our unique mix of hardware, software and people. You can count on test equipment and design software that is built on more than 75 years of leadership in measurement science. The continuing innovation across new and existing wireless technologies presents challenges in designing and testing of components, modules and devices that make our connected world possible. As the world’s leading electronic measurement company, Keysight continues to be at the forefront offering a full portfolio of test and design solutions that span the entire lifecycle – from simulation to R&D, design verification and pre-conformance, conformance, manufacturing, through network deployment and service assurance.

We know what it takes for your designs to meet the latest standards. As an active member of the wireless standards bodies that define the technologies, we have been at the forefront of providing standard-compliant wireless test and design tools across all the technologies from Bluetooth to 60 GHz 802.11ad. We design our instruments to be future-proof, making it easier for you to evolve with changing technologies and stay on the leading edge. You can carry your investment forward with consistent measurement science that spans research and development today and extends to manufacturing and deployment in the future. Our engineers, experts in design and test, are available to advise, assist and augment your teams all around the world. Our expertise is also readily available through white papers, application notes and webcasts for IoT, 5G, Cellular, MIMO and WLAN Test.

Explore YouTube Videos 

What's New

Refine the List

remove all refinements

By Type of Content

By Product Category

1-25 of 1156

Sort:
3070 Boundary Scan 
Learn concepts of Boundary-Scan technology. TAP (test access port), the functionality of registers (BYPASS, boundary, IDCODE), and the structure of the "boundary-cell" are described.

Classroom Training

 
3070 Family Multiplexed User Fundamentals Class I 
Learn the basics needed to develop a Board Test program with the i3070 Multiplexed Board Test system. Design, develop, turn-on and debug tests. Typically, Class I and II are taken consecutively.

Classroom Training

 
Analizadores de Potencia y Fuentes de Alimentación Inteligentes  
Analizadores de Potencia y Fuentes de Alimentación Inteligentes, la Nueva Revolución en Electrónica de Potencia

Seminar

 
Aplicaciones Digitales y Soluciones de Medida con Osciloscopios  
Participe en este evento gratuito de Keysight Technologies

Seminar

 
Electronic Measurement Course Calendar for Europe 
Calendar of Electronic Measurement courses scheduled in Europe. Course details, dates, and locations.

Classroom Training

 
European Microwave Week 2007 
European Microwave Week 2007 is an annual pan-European event combining four conferences and a tradeshow during the course of the week with the addition of short courses and workshops to complement the main sessions.

Tradeshow

 
i3070 Family Multiplexed User Fundamentals Class II  
Enhanced training to take the programmer beyond the basics into custom test generation. Get more performance and coverage from your i3070. Typically, Class I and II are taken consecutively.

Classroom Training

 
Keysight eventos en España 
Bienvenido a la página de eventos organizados por Keysight en España.

Seminar

 
Keysight TS-5400 Series II Developers Training 
This class is an introduction to TestExec SL and the TS5400 series library’s. Topics covered include hardware and software architecture, built in diagnostic routines and hands on use of the TS5400 series platform.

Classroom Training

 
Nuevas Técnicas de Medida con Osciloscopios de Tiempo Real 
Nuevas Técnicas de Medida con Osciloscopios de Tiempo Real - Análisis en Sistemas de Comunicación y Buses Serie de Última Generación

Seminar

 
Seminario Nuevas Técnicas de Diseño y Medida en Buses Digitales de Alta Velocidad 
Participe en este evento gratuito de Agilent Technologies

Seminar Materials - Archived

 
Seminario: "Caracterización Dieléctrica de Materiales y Soluciones en Medida de Impedancia" 
Seminario: "Caracterización Dieléctrica de Materiales y Soluciones en Medida de Impedancia"

Seminar

 
Seminario: Caracterización Dieléctrica de Materiales y Soluciones en Medida de Impedancia 
Seminario: Caracterización Dieléctrica de Materiales y Soluciones en Medida de Impedancia

Seminar

 
Seminario: Soluciones de Tiempo Real en Pruebas de RF 
Seminario: Soluciones de Tiempo Real en Pruebas de RF

Seminar

 
Seminario: “Integridad de Señal - Innovadoras Técnicas TDR basadas en VNAs” 
Seminario: “Integridad de Señal - Innovadoras Técnicas TDR basadas en VNAs”

Seminar

 
Simposio de Aeroespacio y Defensa 2014 
Simposio de Aeroespacio y Defensa 2014

Seminar

 
Soluciones para integrar Diseño, Simulación, Algoritmos y Test: Digital-HSD, RF/MW, EMI/EMC y Medida 
Participe en este evento gratuito de Keysight Technologies

Seminar

 
Tecnologías avanzadas en Medidas de Materiales 
Participe en este evento gratuito de Keysight Technologies

Seminar

 
LTE and the Evolution to LTE-Advanced Fundamentals - Part 1 Webcast Slides 
Slides from the March 26, 2013 webcast

Seminar Materials 2013-03-26

PDF PDF 1.98 MB
Vector Modulation and Frequency Conversion Fundamentals Webcast Q&A 
Q&A from the July 18, 2013 webcast

Seminar Materials 2013-07-18

PDF PDF 245 KB
10-Steps to Determine 3G/4G IP Data Throughput 
10-Steps to Determine 3G/4G IP Data Throughput

Webcast - recorded

 
10-Steps to Determine 3G/4G IP Data Throughput  
Original broadcast September 27, 2012

Webcast - recorded

 
10-Steps to determine 3G/4G IP Data Throughput Webcast Slides 
Slides for the September 27, 2012 Webcast

Seminar Materials 2012-09-27

PDF PDF 1.33 MB
10G USB 3.1 – Keeping Up with the Physical Layer Test Challenges Webcast 
Original broadcast March 25, 2015

Webcast - recorded

 
12 Tips on How to Select Your Next Oscilloscope - WEBCAST 
In this webcast we will cover 12 topics for you to consider before selecting your next general purpose oscilloscope: from bandwidth, triggering and update rate to serial buses and probing. Providing trade-offs you can make to fit your budget.

Webcast - recorded

 

1 2 3 4 5 6 7 8 9 10 ... Next