Insight. It comes upon you in a flash. And you know at once you have something special. At Keysight Technologies, the foundation is our unique mix of hardware, software and people. You can count on test equipment and design software that is built on more than 75 years of leadership in measurement science. The continuing innovation across new and existing wireless technologies presents challenges in designing and testing of components, modules and devices that make our connected world possible. As the world’s leading electronic measurement company, Keysight continues to be at the forefront offering a full portfolio of test and design solutions that span the entire lifecycle – from simulation to R&D, design verification and pre-conformance, conformance, manufacturing, through network deployment and service assurance.
We know what it takes for your designs to meet the latest standards. As an active member of the wireless standards bodies that define the technologies, we have been at the forefront of providing standard-compliant wireless test and design tools across all the technologies from Bluetooth to 60 GHz 802.11ad. We design our instruments to be future-proof, making it easier for you to evolve with changing technologies and stay on the leading edge. You can carry your investment forward with consistent measurement science that spans research and development today and extends to manufacturing and deployment in the future. Our engineers, experts in design and test, are available to advise, assist and augment your teams all around the world. Our expertise is also readily available through white papers, application notes and webcasts for IoT, 5G, Cellular, MIMO and WLAN Test.
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Wireless Power Transfer Efficiency Test with ENA Series Network Analyzers
Option 006 wireless power transfer analysis software in ENA Series network analyzers enable wireless power transfer efficiency measurements in real-time. Advanced 2D/3D simulation feature visualizes the dependency of load impedance.
Designing RFID Tags Using Direct Antenna Matching
This Article by Cory Edelman and Murthy Upmaka describes the design challenges involved in RFID design and also focuses on the use of integrated EDA tools to optimally address the challenges.
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