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Wireless Connectivity

Insight. It comes upon you in a flash. And you know at once you have something special. At Keysight Technologies, the foundation is our unique mix of hardware, software and people. You can count on test equipment and design software that is built on more than 75 years of leadership in measurement science. The continuing innovation across new and existing wireless technologies presents challenges in designing and testing of components, modules and devices that make our connected world possible. As the world’s leading electronic measurement company, Keysight continues to be at the forefront offering a full portfolio of test and design solutions that span the entire lifecycle – from simulation to R&D, design verification and pre-conformance, conformance, manufacturing, through network deployment and service assurance.

We know what it takes for your designs to meet the latest standards. As an active member of the wireless standards bodies that define the technologies, we have been at the forefront of providing standard-compliant wireless test and design tools across all the technologies from Bluetooth to 60 GHz 802.11ad. We design our instruments to be future-proof, making it easier for you to evolve with changing technologies and stay on the leading edge. You can carry your investment forward with consistent measurement science that spans research and development today and extends to manufacturing and deployment in the future. Our engineers, experts in design and test, are available to advise, assist and augment your teams all around the world. Our expertise is also readily available through white papers, application notes and webcasts for IoT, 5G, Cellular, MIMO and WLAN Test.

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History of 802.11 - White Paper 
The 802.11ax standard holds great promise, especially for dense deployments in both indoor and outdoor environments. Like any emerging standard; however it adopts present unique challenges.

Application Note 2016-05-19

Testing New-Generation WLAN 802.11ac - Application Note 
This application note introduces the new WLAN new-generation testing technology of 802.11ac and the many different Keysight solutions for testing WLAN 802.11ac.

Application Note 2015-04-01

Solutions for WLAN 802.11ac Manufacturing Test - Application Note 
This “Solutions for WLAN 802.11ac Manufacturing Test” app note gives insight into testing 802.11ac client and infrastructure devices using fast, flexible, cost-effective calibration and non-signaling.

Application Note 2015-02-04

Speed Time to Market with Consistent Measurements from R&D Through Manufacturing - Application Note 
This white paper describes the benefits of having a choice of bench top or modular instruments that are supported by common software applications.

Application Note 2014-11-17

Enhancing Measurement Performance for the Testing of Wideband MIMO Signals - White Paper  
This white paper describes a method for characterization and correction of channel frequency response for BBIQ measurements over large bandwidths when using the Keysight M9703A and 89600 VSA software.

Application Note 2014-08-03

Creating a Complete and Flexible Solution for WiGig Testing Application Note 
When developing new WiGig products, testing must address the transmitter and receiver portions of each device. In a tri-band device, signals have three key attributes: they operate at 2.4 GHz, 5.0 GHz

Application Note 2014-08-01

Creating and Optimizing 802.11ac Signals with the M8190A AWG - Application Note 
Designs for 802.11ac WLAN devices require test equipment that can provide the best reference test signals and measurements. N7617B enables this type of signals to be generated with the M8190A AWG.

Application Note 2013-08-13

Measuring the Burst Time-Gated Power Signal of Wireless Technologies Using Keysight Power Sensors 
Measuring pulse, burst, or modulated signals for wireless technologies such as TDMA, GSM, WLAN, WiMAX, and LTE is very important because it is part of functionality testing and power amplifier module verification during the manufacturing process.

Application Note 2013-07-08

Multichannel Measurements in MIMO 802.11ac Baseband IQ Simulation, Design & Test - Application Note 
This solution brief will show Keysight Technologies' complete, end-to-end solution for multichannel measurements of 802.11ac BBIQ simulation, design and test.

Application Note 2013-04-05

Make Custom OFDM Measurements with 89600 VSA Software Option BHF - Application Note  
Read about how to configure 89600 VSA software with Option BHF custom OFDM modulation analysis to analyze and troubleshoot new, custom, proprietary, generic, or non-standard OFDM signals.

Application Note 2012-11-21

802.11ac Power Measurement and Timing Analysis - Application Note 
This technical article illustrates how Keysight 8990B peak power analyzer able to help technicians and engineers perform some of the test requirements when developing 802.11ac power amplifier module

Application Note 2012-09-02

Creating and Optimizing 802.11ac Signals Application Note 
This application note details how to create and optimize 802.11ac signals using the N7617B Signal Studio for WLAN 802.11a/b/g/n/ac software with Keysight's RF signal generators to get the highest quality signals from the instruments.

Application Note 2012-07-19

Custom OFDM Signal Generation Using SystemVue - Application Note 
This application note describes a new comms standard based on OFDM which is provided by SystemVue 2011 to create both simulation and measurement, with links to the new 89600B VSA software for further demodulation and analysis.

Application Note 2010-12-09

How to migrate from the N4010A to N8300A for WLAN testing (Part 4) 

Application Note 2009-06-11

N8300A: Techniques for optimizing WLAN device testing (Part 3) 

Application Note 2009-05-12

N8300A: Implement a WLAN test plan using SCPI programming (Part 2) 

Application Note 2009-04-27

N8300A: Introduction to a WLAN manufacturing test plan and theory of implementation (Part 1) 

Application Note 2009-04-21

Simplify dc current drain measurements and analysis on WLAN Network cards 
Minimizing current drain is critical to the success of new WLAN Network cards. High or excessive current drain can reduce the host device battery operating time considerably.

Application Note 2008-06-04

MIMO Wireless LAN PHY Layer (RF) Operation & Measurement Application Note 1509 
This application note is intended to provide an understanding of MIMO radio operation as it applies to WLAN, and the test configurations for multi-channel radios.

Application Note 2008-04-30

MIMO Manufacturing Solution - Application Note 
Compares two of the most popular MIMO manufacturing test methodologies, including examples to illustrate the relative merits.

Application Note 2007-07-10

N4010A Programming Made Easy for WLAN Applications - Application Note 
This application note shows WLAN test developers and application engineers how to create effective integration test plans and manufacturing test sequences for the N4010A test set.

Application Note 2007-04-17

RF Testing of WLAN Products- Application Note 
This Application note discusses the modulation technology behind several wireless LAN standards and the measurement techniques that can be used to trouble shoot and quantify their RF performance.

Application Note 2007-01-10

Current Drain Analysis Enhances WLAN Network Card Design and Test - Application Note 
This application note explains how to simplify the complex task of accurately measuring and evaluating the current drain of a WLAN network card for its various operating modes.

Application Note 2006-12-14

N4010A Wireless Connectivity Test Set Performance Guide, Application Note 
This guide characterizes the performance of the N4010A wireless connectivity test set and the 89601A vector signal analysis (VSA) software combination

Application Note 2004-06-29

Next-Generation WLAN Manufacturing Test Solutions 
This application note begins with a brief introduction to IEEE 802.11 technologies, followed by a description of the golden radio-based test system and its main limitations for WLAN manufacturing.

Application Note 2004-05-28

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