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Manufacturing & Production Test

As the world rapidly transforms with new technologies constantly emerging in the market, engineers in the consumer electronics, industrial and medical industries rush to design products which incorporate the latest trends. The rate of change is increasing, and the pace of product innovation is expanding.

However, a few things remain unchanged, such as the need to reduce your product and design costs to improve margins, and to reduce your time-to-market in order to meet consumers’ increasing expectation for superior and modern products which evolve with the times.

Keysight can help. With our market-leading hardware and software, and over 75 years of test and measurement experience, let us help you solve your most difficult test challenges to keep you ahead of the curve.

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Innovations in EDA Webcast Library 
EEsof EDA series of webcasts, upcoming and recorded

Webcast

 
Tutorials in Signal Integrity - Webcast Library  
Upcoming, live webcasts and past, on-demand webcasts.

Webcast

 
DesignCon 2017 
February 1-2, 2017; Santa Clara Convention Center, CA

Tradeshow

 
Streamline EMC Compliance Testing with Prescan Analysis Tools 
Original broadcasts April 26, 2016

Webcast - recorded

 
International Microwave Symposium (IMS) 2016 
May 22-27, 2016; San Francisco, CA

Tradeshow

 
DOCSIS 3.1 Signal Generation and Analysis Solution Webcast 
Original broadcast June 25, 2014

Webcast - recorded

 
Innovations in EDA: IC, Laminate, Package Multi-Technology PA Module Design Methodology 
Original broadcast August 2, 2012

Webcast - recorded

 
Beyond CMOS vs. GaAs – Finding the Best Technology Mix for a Handset PA Webcast 
Original broadcast June 13, 2013

Webcast - recorded

 
Innovations in EDA Webcast: Measurement-based FET modeling using Artificial Neural Networks (ANNs) 
Original broadcast Feb 2, 2012

Webcast - recorded

 
The Effect of Digital Noise on RF Receiver Sensitivity in Smart-Phones Applications 
Original broadcast Oct 6, 2011

Webcast - recorded

 
Innovations in EDA: Accurate Modeling of GaAs & GaN HEMT’s for Nonlinear Applications Webcast 
Original broadcast May 7, 2013

Webcast - recorded

 
Setting Up IC-CAP WaferPro For On-Wafer Measurements 
Original broadcast June 22, 2011

Webcast - recorded